IMP technology with heavy gas sputtering
    1.
    发明授权
    IMP technology with heavy gas sputtering 失效
    IMP技术与重气体溅射

    公开(公告)号:US06200433B1

    公开(公告)日:2001-03-13

    申请号:US09430998

    申请日:1999-11-01

    IPC分类号: C23C1442

    CPC分类号: C23C14/046 C23C14/358

    摘要: The present invention generally provides a copper metallization method for depositing a conformal barrier layer and seed layer in a plasma chamber. The barrier layer and seed layer are preferably deposited in a plasma chamber having an inductive coil and a target comprising the material to be sputtered. One or more plasma gases having high molar masses relative to the target material are then introduced into the chamber to form a plasma. Preferably, the plasma gases are selected from xenon, krypton or a combination thereof.

    摘要翻译: 本发明通常提供了一种用于在等离子体室中沉积保形阻挡层和种子层的铜金属化方法。 阻挡层和种子层优选沉积在具有感应线圈的等离子体室中,并且靶包括要溅射的材料。 然后将相对于靶材料具有高摩尔质量的一种或多种等离子气体引入室中以形成等离子体。 优选地,等离子体气体选自氙,氪或其组合。

    Sputtering of thermally resistive materials including metal chalcogenides
    2.
    发明授权
    Sputtering of thermally resistive materials including metal chalcogenides 有权
    包括金属硫族化物在内的耐热材料的溅射

    公开(公告)号:US08500963B2

    公开(公告)日:2013-08-06

    申请号:US11778648

    申请日:2007-07-17

    IPC分类号: C23C14/35

    摘要: A plasma sputtering method for metal chalcogenides, such as germanium antimony telluride (GST), useful in forming phase-change memories. The substrate is held at a selected temperature at which the material deposits in either an amorphous or crystalline form. GST has a low-temperature amorphous range and a high-temperature crystalline range separated by a transition band of 105-120° C. Bipolar pulsed sputtering with less than 50% positive pulses of less than 10:s pulse width cleans the target while maintain the sputtering plasma. The temperature of chamber shields is maintained at a temperature favoring crystalline deposition or they may be coated with arc-spray aluminum or with crystallographically aligned copper or aluminum.

    摘要翻译: 用于形成相变存储器的金属硫族化物的等离子体溅射方法,例如锗锑碲化物(GST)。 将基材保持在选定的温度,在该温度下,材料以无定形或结晶形式沉积。 GST具有低温无定形范围和105-120°C的过渡带隔离的高温结晶范围。具有小于10s脉冲宽度的小于50%正脉冲的双极脉冲溅射清洁目标,同时保持 溅射等离子体。 室屏蔽的温度保持在有利于结晶沉积的温度下,或者它们可以用电弧喷涂铝或用结晶取向的铜或铝涂覆。

    Magnet array in conjunction with rotating magnetron for plasma sputtering
    4.
    发明授权
    Magnet array in conjunction with rotating magnetron for plasma sputtering 有权
    磁体阵列结合用于等离子体溅射的旋转磁控管

    公开(公告)号:US06610184B2

    公开(公告)日:2003-08-26

    申请号:US09993543

    申请日:2001-11-14

    IPC分类号: C23C1435

    摘要: An array of auxiliary magnets is disclosed that is positioned along sidewalls of a magnetron sputter reactor on a side towards the wafer from the target. The magnetron preferably is a small, strong one having a stronger outer pole of a first magnetic polarity surrounding a weaker outer pole of a second magnetic polarity and rotates about the central axis of the chamber. The auxiliary magnets preferably have the first magnetic polarity to draw the unbalanced magnetic field component toward the wafer. The auxiliary magnets may be either permanent magnets or electromagnets.

    摘要翻译: 公开了一种辅助磁体阵列,该阵列沿着磁控溅射反应器的侧壁朝着晶片从靶标侧面定位。 磁控管优选地是小而强的,具有围绕第二磁极性较弱的外极的第一磁极的更强的外极并围绕腔的中心轴旋转。 辅助磁体优选地具有第一磁极以将不平衡的磁场分量拉向晶片。 辅助磁体可以是永磁体或电磁体。

    CHALCOGENIDE TARGET AND METHOD
    6.
    发明申请
    CHALCOGENIDE TARGET AND METHOD 审中-公开
    CHALCOGENIDE目标和方法

    公开(公告)号:US20090107834A1

    公开(公告)日:2009-04-30

    申请号:US11927605

    申请日:2007-10-29

    IPC分类号: C23C14/06 C23C14/34 C23C14/35

    摘要: A sputtering target for a sputtering chamber comprises a sputtering plate composed of a chalcogenide material comprising an average yield strength of from about 40 MPa to about 120 MPa and a thermal conductivity of at least about 2.8 W/(m·K). In one version the sputtering plate is composed of a chalcogenide material with a stoichiometric ratio that varies by less than about 5% throughout the body of the sputtering plate. In another version, the sputtering plate is composed of a chalcogenide material having an average grain size of at least 20 microns, and an oxygen content of less than 600 weight ppm. The sputtering target is sputtered by applying a pulsed DC voltage to the sputtering target.

    摘要翻译: 溅射室的溅射靶包括由硫族化物材料构成的溅射板,该溅射板包括约40MPa至约120MPa的平均屈服强度和至少约2.8W /(m.K)的热导率。 在一个版本中,溅射板由化学计量比在溅射板的整个体内变化小于约5%的硫族化物材料组成。 在另一个版本中,溅射板由平均粒度为至少20微米,氧含量小于600重量ppm的硫族化物材料组成。 通过向溅射靶施加脉冲的DC电压来溅射溅射靶。

    SPUTTERING OF THERMALLY RESISTIVE MATERIALS INCLUDING METAL CHALCOGENIDES
    8.
    发明申请
    SPUTTERING OF THERMALLY RESISTIVE MATERIALS INCLUDING METAL CHALCOGENIDES 有权
    包括金属螯合剂在内的热电材料的溅射

    公开(公告)号:US20080099326A1

    公开(公告)日:2008-05-01

    申请号:US11778648

    申请日:2007-07-17

    IPC分类号: C23C14/35

    摘要: A plasma sputtering method for metal chalcogenides, such as germanium antimony telluride (GST), useful in forming phase-change memories. The substrate is held at a selected temperature at which the material deposits in either an amorphous or crystalline form. GST has a low-temperature amorphous range and a high-temperature crystalline range separated by a transition band of 105-120° C. Bipolar pulsed sputtering with less than 50% positive pulses of less than 10:s pulse width cleans the target while maintain the sputtering plasma. The temperature of chamber shields is maintained at a temperature favoring crystalline deposition or they may be coated with arc-spray aluminum or with crystallographically aligned copper or aluminum.

    摘要翻译: 用于形成相变存储器的金属硫族化物的等离子体溅射方法,例如锗锑碲化物(GST)。 将基材保持在选定的温度,在该温度下,材料以无定形或结晶形式沉积。 GST具有低温无定形范围和105-120°C的过渡带隔离的高温结晶范围。具有小于10s脉冲宽度的小于50%正脉冲的双极脉冲溅射清洁目标,同时保持 溅射等离子体。 室屏蔽的温度保持在有利于结晶沉积的温度下,或者它们可以用电弧喷涂铝或用结晶取向的铜或铝涂覆。