摘要:
A circuit includes a fuse and a sensing and control circuit. The fuse is coupled between a MOS transistor and a current source node. The sensing and control circuit is configured to receive a programming pulse and output a modified programming signal to the gate of the MOS transistor for programming the fuse. The modified programming signal has a pulse width based on a magnitude of a current through the first fuse.
摘要:
A method includes reading data from a subset of a plurality of memory bit cells of a non-volatile memory. The data identifies an address of at least one individual failed bit cell. The method further includes loading the data directly into a register, receiving an address of data to be accessed, determining if the received address is the address of any individual failed bit cell; and accessing the data of the register if the received address is the address of any individual failed bit cell.
摘要:
A circuit having a first circuit configured to receive an input voltage and generate a first voltage that generates a first current flowing through a resistive device and a second voltage that generates a second current; a node electrically coupled to the resistive device and having a third voltage that generates a third current; and a second circuit configured to generate a fourth voltage having a logic state indicating a logic state of the resistive device.
摘要:
A method includes reading data from a subset of a plurality of memory bit cells of a non-volatile memory. The data identifies an address of at least one individual failed bit cell. The method further includes loading the data directly into a register, receiving an address of data to be accessed, determining if the received address is the address of any individual failed bit cell; and accessing the data of the register if the received address is the address of any individual failed bit cell.
摘要:
An integrated circuit includes a sensing circuit, a fuse box, and a fuse bus decoder. The sensing circuit includes an output node, and the fuse box includes a plurality of switches coupled in series with a plurality of resistive elements. The fuse box is coupled to the output node of the sensing circuit from which the fuse box is configured to receive a current. The fuse bus decoder is coupled to the fuse box and includes at least one demultiplexer configured to receive a signal and in response output a plurality of control signals for selectively opening and closing the switches of the fuse box to adjust a resistance across the fuse box. A voltage of the output node of the sense amplifier is based on a resistance the fuse box and the current.
摘要:
A static CAM includes a plurality of entries E each including a number of CAM cells B and a summary S. Each CAM cell B is associated with a memory cell M and a comparator C. Generally, the CAM receives as input i number of lookup data lines. When data is received, memory cells M provide compared data for corresponding comparators C in CAM cells B to compare the compared data to the received data. If all compared data match all received data lines for an entry, then there is a hit for that entry. But if any compared data does not match the corresponding data line, then there is a miss for that line and therefore a miss for that entry. Depending on applications, the CAM returns an address if there is a hit for one or a plurality of entries.
摘要:
A voltage regulator circuit with high accuracy and Power Supply Rejection Ratio (PSRR) is provided. In one embodiment, an op-amp with a voltage reference input to an inverting input has the first output connected to a PMOS transistor's gate. The PMOS transistor's source and drain are each connected to the power supply and the voltage regulator output. The voltage regulator output is connected to an NMOS transistor biased in saturation mode and a series of two resistors. The non-inverting input of the op-amp is connected in between the two resistors for the first feedback loop. The op-amp's second output is connected to the gate of the NMOS transistor through an AC-coupling capacitor for the second feedback loop. The op-amp's first output can be connected to the power supply voltage through a capacitor to further improve high frequency PSRR. In another embodiment, the role of PMOS and NMOS transistors is reversed.
摘要:
An interleaved memory circuit includes a first memory bank having a first memory cell. A first local control circuit is coupled with the first memory bank. A second memory bank includes a second memory cell. A second local control circuit is coupled with the second memory bank. An IO block is coupled with the first memory bank and the second memory bank. A global control circuit is coupled with the first and second local control circuits. An interleaving access includes a clock signal having a first cycle and a second cycle for accessing the first memory cell and the second memory cell, respectively, wherein the second cycle is capable of enabling the first local control circuit to trigger a first transition of a first read column select signal RSSL for accessing the first memory cell.
摘要:
A method of designing a content-addressable memory (CAM) includes associating CAM cells with a summary circuit. The summary circuit includes a first level of logic gates and a second level of logic gates. The first level of logic gates have inputs each configured to receive an output of a corresponding one of the plurality of CAM cell. The second level of logic gates have inputs each configured to receive an output of a corresponding one of the first level of logic gates. Logic gates in at least one of the first level of logic gates or the second level of logic gates are selected to have an odd number of input pins so that an input pin and an output pin share a layout sub-slot.
摘要:
A system and method for effectively implementing a high-speed DRAM device may include memory cells that each have a bitline for transferring storage data, a wordline for enabling an accelerated-write operation in the memory cell, and a data storage node with a corresponding cell voltage. An accelerated-write circuit may then directly provide the storage data to an appropriate bitline in a pre-toggled state in response to one or more accelerated-write enable signals. The corresponding cell voltage may therefore begin a state-change transition towards the pre-toggled state immediately after the wordline is activated to successfully reach a full-state level before the wordline is deactivated during a high-speed memory cycle.