Abstract:
Certain aspects provide a circuit for analog-to-digital conversion. The circuit generally includes a flash analog-to-digital converter (ADC) having a plurality of comparators, each comparator being configured to compare an input voltage to a reference voltage; and a calibration circuit coupled to the flash ADC and configured to tune the reference voltage prior to a conversion operation by the flash ADC.
Abstract:
Pumping current into a regeneration latch of a comparator, including: a first transistor configured to receive a first constant current from a first constant current source; a first current mirror coupled to the first transistor and configured to provide a first bias current, wherein the first transistor substantially mirrors the first constant current into the first bias current in the first current mirror; a second transistor configured to receive a second constant current from a second constant current source; a second current mirror coupled to the second transistor and configured to provide a second bias current, wherein the second transistor substantially mirrors the second constant current into the second bias current in the second current mirror; and a third transistor configured to combine the first bias current and the second bias current, wherein the third transistor pumps the combined bias current into the regeneration latch.
Abstract:
Certain aspects of the present disclosure provide a voltage level shifting circuit employing a low latency, AC-coupled voltage boost circuit, as well as other circuits and apparatus incorporating such a level shifting circuit. Such level shifting circuits provide significantly lower latency compared to conventional level shifters (e.g., latency reduced by at least a factor of two). Offering consistent latency over the simulation corners, level shifting circuits described herein also provide significantly lower power consumption and reduced duty cycle distortion compared to conventional level shifters.
Abstract:
An apparatus is disclosed for pipelined analog-to-digital conversion. In an example aspect, the apparatus includes a pipelined analog-to-digital converter (ADC). The pipelined ADC includes a first stage and a second stage. The first stage includes a sampler and a quantizer coupled to the sampler. The first stage also includes a current distribution circuit coupled to the sampler. The second stage includes a sampler coupled to the current distribution circuit and a quantizer coupled to the sampler of the second stage.
Abstract:
Certain aspects of the present disclosure provide various sampling networks for switched-capacitor integrators, which may be used in switched-capacitor analog-to-digital converters (ADCs). Rather than having both an input sampling capacitor and a reference sampling capacitor, certain aspects of the present disclosure use a shared sampling capacitor for the reference voltage and the input voltage, thereby reducing ADC input-referred noise, decreasing op amp area and power, and avoiding anti-aliasing filter insertion loss. Furthermore, by sampling the reference voltage during the sampling phase and sampling the input voltage during the integration phase using the shared sampling capacitor, a high-bandwidth reference buffer need not be used for the reference voltage.
Abstract:
Exemplary embodiments are related to voltage regulators. A device may include a first energy storage element coupled between a ground voltage and an output. The device may also include a second energy storage element coupled to the ground voltage and configured to selectively couple to the output. Further, the device may include a voltage regulator coupled between an input and the second energy storage element.
Abstract:
Certain aspects of the present disclosure provide a voltage level shifting circuit employing a low latency, AC-coupled voltage boost circuit, as well as other circuits and apparatus incorporating such a level shifting circuit. Such level shifting circuits provide significantly lower latency compared to conventional level shifters (e.g., latency reduced by at least a factor of two). Offering consistent latency over the simulation corners, level shifting circuits described herein also provide significantly lower power consumption and reduced duty cycle distortion compared to conventional level shifters.
Abstract:
Certain aspects of the present disclosure provide methods and apparatus for calibrating time-interleaved analog-to-digital converter (ADC) circuits and generating a suitable signal for such calibration. Certain aspects provide a signal generator for calibrating a time-interleaved ADC circuit having a plurality of channels. The signal generator generally includes a pattern generator configured to receive a periodic signal and to output a bitstream based on the periodic signal and a conversion circuit having an input coupled to an output of the pattern generator and configured to generate a waveform based on the bitstream. The bitstream has a bit pattern with a total number of bits that shares no common factor with a number of the channels and includes a relatively lower frequency component combined with a relatively higher frequency component.
Abstract:
An apparatus is disclosed for pipelined analog-to-digital conversion. In an example aspect, the apparatus includes a pipelined analog-to-digital converter (ADC). The pipelined ADC includes a first stage and a second stage. The first stage includes a sampler and a quantizer coupled to the sampler. The first stage also includes a current distribution circuit coupled to the sampler. The second stage includes a sampler coupled to the current distribution circuit and a quantizer coupled to the sampler of the second stage.
Abstract:
A receiver may include a time-interleaved charge sampler comprising a charge sampler switch in series with a charge sampler capacitor. The receiver may also include a current buffer configured to drive the time-interleaved charge sampler.