Abstract:
Pumping current into a regeneration latch of a comparator, including: a first transistor configured to receive a first constant current from a first constant current source; a first current mirror coupled to the first transistor and configured to provide a first bias current, wherein the first transistor substantially mirrors the first constant current into the first bias current in the first current mirror; a second transistor configured to receive a second constant current from a second constant current source; a second current mirror coupled to the second transistor and configured to provide a second bias current, wherein the second transistor substantially mirrors the second constant current into the second bias current in the second current mirror; and a third transistor configured to combine the first bias current and the second bias current, wherein the third transistor pumps the combined bias current into the regeneration latch.
Abstract:
Exemplary embodiments are directed to systems, devices, and methods for enhancing an amplifier. An amplifier may include a first cascode circuit including a first transistor and a second transistor. The amplifier may include a second cascode circuit coupled to a differential output and including a first pair of transistors including a first transistor and a second transistor and a second pair of transistors including a third transistor and a fourth transistor. Further, the amplifier may include a differential input including a first transistor coupled to each of the first transistor of the first cascode circuit and the first and second transistors of the second cascode circuit, the differential input further including a second transistor coupled to each of the second transistor of the first cascode circuit and the third and fourth transistors of the second cascode circuit.
Abstract:
Certain aspects of the present disclosure provide a voltage level shifting circuit employing a low latency, AC-coupled voltage boost circuit, as well as other circuits and apparatus incorporating such a level shifting circuit. Such level shifting circuits provide significantly lower latency compared to conventional level shifters (e.g., latency reduced by at least a factor of two). Offering consistent latency over the simulation corners, level shifting circuits described herein also provide significantly lower power consumption and reduced duty cycle distortion compared to conventional level shifters.
Abstract:
Certain aspects of the present disclosure provide apparatus and techniques for analog-to-digital conversion using a time-to-digital converter (TDC). For example, certain aspects provide a quantizer using a TDC. The quantizer may include at least one first capacitive element and a set of switches configured to selectively couple a first terminal and a second terminal of the at least one first capacitive element to at least one input voltage source. The TDC may also include a reference voltage source, at least one switch coupled between the second terminal of the at least one first capacitive element and an output of the reference voltage source, a current source selectively coupled to the first terminal of the at least one first capacitive element, and a voltage sense circuit coupled to the first terminal of the at least one first capacitive element.
Abstract:
An analog-to-digital converter includes: a first input terminal to receive a first input signal; a second input terminal to receive a second input signal; a noise shaping module configured to compare the first input signal to the second input signal received, and to output a digital output signal and a residue signal in a first phase of a noise shaping operation; and a storage module configured to store the residue signal during the first phase of the noise shaping operation, the storage module configured to receive an analog input signal and remove the residue signal from the analog input signal in a second phase of the noise shaping operation to output a new first input signal to the noise shaping module.
Abstract:
Certain aspects of the present disclosure provide a voltage level shifting circuit employing a low latency, AC-coupled voltage boost circuit, as well as other circuits and apparatus incorporating such a level shifting circuit. Such level shifting circuits provide significantly lower latency compared to conventional level shifters (e.g., latency reduced by at least a factor of two). Offering consistent latency over the simulation corners, level shifting circuits described herein also provide significantly lower power consumption and reduced duty cycle distortion compared to conventional level shifters.
Abstract:
A continuous-time analog-to-digital converter (ADC) includes a plurality of integrators selectively coupled in series. The ADC may further include a quantizer with excess loop delay (ELD) compensation. The quantizer may be coupled in series to a least one integrator. The ELD compensation may be programmable based on a transfer function of the ADC. The ADC may further include parallel digital-to-analog converters (DACs). Each DAC may have an input coupled to an output of the quantizer, and an output coupled to an input of a corresponding integrator. The ADC may further include a bypass path coupled to an input or output of one of the integrators. The bypass path may be configured to selectively bypass one or more of the integrators to change the transfer function of the ADC.
Abstract:
Certain aspects of the present disclosure provide a segmented successive approximation register (SAR) analog-to-digital converter (ADC). One example ADC generally includes a plurality of SAR ADC circuits each associated with a different voltage range segment of a voltage range for the ADC. Each SAR ADC circuit is configured to receive an analog signal input to the ADC and to output a digital signal based on the analog signal, the digital signal being representative of a voltage level of the analog signal when the voltage level of the analog signal is within the segment associated with the SAR ADC circuit. In certain aspects, the SAR ADC may include logic configured to control a digital output of the ADC based on one or more of the digital signals representative of the voltage level of the analog signal output by one or more of the plurality of SAR ADC circuits.
Abstract:
The present disclosure includes circuits and methods for latching signals. In one embodiment, two inverters are configured back to back to latch a signal. Each inverter includes a capacitor configured between control terminals of inverter transistors. In one embodiment, the circuit is part of a comparator. First and second voltages are received on control terminals of differential transistors, and a differential output signal is coupled to two back to back inverters. In one embodiment, a circuit is disabled and a voltage on a control terminal of a transistor in an inverter is set below a reference, such as a power supply, to increase the speed of the circuit.
Abstract:
Exemplary embodiments are directed to systems, devices, and methods for enhancing a telescopic amplifier. An amplifier may include a differential pair of input transistors including at least one transistor configured to receive a first input and at least one other transistor configured to receive a second input. The amplifier may further include a cascode circuit including a first pair of transistors coupled to the at least one transistor of the differential pair to form a first plurality of current paths configured to generate a first output. The cascode circuit may also include a second pair of transistors coupled to the at least one other transistor of the differential pair to form a second plurality of currents paths configured to generate a second output.