Inductor and manufacturing method thereof
    1.
    发明授权
    Inductor and manufacturing method thereof 有权
    电感及其制造方法

    公开(公告)号:US09437363B2

    公开(公告)日:2016-09-06

    申请号:US14321059

    申请日:2014-07-01

    IPC分类号: H01F5/00 H01F41/04 H01F17/00

    摘要: An inductor may include: a body, and a first and a second external electrode formed on end surfaces of the body. The body may include a coil support layer, a conductive coil formed on at least one surface of the coil support layer, a lamination part formed in a gap of the conductive coil and on an upper surface thereof, an insulating coating part formed to enclose an overall surface of the conductive coil on which the lamination part is formed, and upper and lower cover layers covering the overall surface of the conductive coil on which the insulating coating part is formed.

    摘要翻译: 电感器可以包括:主体,以及形成在主体的端表面上的第一和第二外部电极。 主体可以包括线圈支撑层,形成在线圈支撑层的至少一个表面上的导电线圈,形成在导电线圈的间隙中并在其上表面上的层叠部分,形成为封闭 形成有层叠部的导电线圈的整个表面,以及覆盖形成有绝缘涂层部的导电线圈的整个表面的上下覆盖层。

    Inductor and manufacturing method thereof

    公开(公告)号:US10332670B2

    公开(公告)日:2019-06-25

    申请号:US15728161

    申请日:2017-10-09

    摘要: An inductor may include: a body, and a first and a second external electrode formed on end surfaces of the body. The body may include a coil support layer, a conductive coil formed on at least one surface of the coil support layer, a lamination part formed in a gap of the conductive coil and on an upper surface thereof, an insulating coating part formed to enclose an overall surface of the conductive coil on which the lamination part is formed, and upper and lower cover layers covering the overall surface of the conductive coil on which the insulating coating part is formed.

    Hybrid interposer and semiconductor package including the same

    公开(公告)号:US10811358B2

    公开(公告)日:2020-10-20

    申请号:US16513171

    申请日:2019-07-16

    摘要: A semiconductor package includes an organic frame having first and second surfaces opposing each other, having a cavity, and having a wiring structure connecting the first and second surfaces, a connection structure disposed on the first surface of the organic frame and having a first redistribution layer connected to the wiring structure, at least one inorganic interposer having first and second surfaces, and having an interconnection wiring connecting the first and second surfaces of the at least one inorganic interposer to each other, an encapsulant encapsulating at least a portion of the at least one inorganic interposer, an insulating layer disposed on the second surface of the organic frame and the second surface of the at least one inorganic interposer, a second redistribution layer having portions provided as a plurality of pads, and at least one semiconductor chip having connection electrodes respectively connected to the plurality of pads.

    APPARATUS FOR MEASURING DRYING RATE AND METHOD FOR MEASURING DRYING RATE USING THE SAME
    10.
    发明申请
    APPARATUS FOR MEASURING DRYING RATE AND METHOD FOR MEASURING DRYING RATE USING THE SAME 审中-公开
    用于测量干燥速度的装置和使用其测量干燥速率的方法

    公开(公告)号:US20140041445A1

    公开(公告)日:2014-02-13

    申请号:US13937595

    申请日:2013-07-09

    IPC分类号: G01N33/32

    摘要: There are provided an apparatus for measuring a drying rate and a method for measuring a drying rate using the same in order to measure the drying rate of a substrate material for manufacturing an electronic apparatus, the apparatus for measuring a drying rate, including a support part having a substrate seated thereon, and a marking part disposed above the substrate while being vertically and horizontally movable, and forming a marking on the substrate while being in contact with the substrate.

    摘要翻译: 提供了一种用于测量干燥速度的装置以及用于测量用于制造电子设备的基板材料的干燥速率的方法,用于测量干燥速率的装置,包括支撑部分 具有安装在其上的基板,以及标记部,其设置在所述基板上方,同时能够垂直和水平移动,并且在与所述基板接触的同时在所述基板上形成标记。