Interface circuit for processing commands, memory device including the same, storage device, and method of operating the memory device

    公开(公告)号:US11199975B2

    公开(公告)日:2021-12-14

    申请号:US16861802

    申请日:2020-04-29

    Abstract: An interface circuit of a memory device including a plurality of memory dies including a plurality of registers corresponding to the plurality of memory dies, respectively, the plurality of registers each configured to store command information related to a data operation command, a demultiplexer circuit configured to provide input command information to a selected register from among the plurality of registers according to at least one of a first address or a first chip selection signal, the input command information being received from outside the interface circuit, and a multiplexer circuit configured to receive output command information from the selected register from among the plurality of registers and output the output command information according to at least one of a second address or a second chip selection signal may be provided.

    Interface circuit, memory device, storage device, and method of operating the memory device

    公开(公告)号:US11960728B2

    公开(公告)日:2024-04-16

    申请号:US17536506

    申请日:2021-11-29

    CPC classification number: G06F3/0613 G06F3/0659 G06F3/0679

    Abstract: An interface circuit of a memory device including a plurality of memory dies including a plurality of registers corresponding to the plurality of memory dies, respectively, the plurality of registers each configured to store command information related to a data operation command, a demultiplexer circuit configured to provide input command information to a selected register from among the plurality of registers according to at least one of a first address or a first chip selection signal, the input command information being received from outside the interface circuit, and a multiplexer circuit configured to receive output command information from the selected register from among the plurality of registers and output the output command information according to at least one of a second address or a second chip selection signal may be provided.

    STORAGE DEVICE GENERATING MULTI-LEVEL CHIP ENABLE SIGNAL AND OPERATING METHOD THEREOF

    公开(公告)号:US20220236917A1

    公开(公告)日:2022-07-28

    申请号:US17479194

    申请日:2021-09-20

    Abstract: A storage device includes a controller including first and second pins and configured to output a multi-level chip enable signal through the second pin, and a memory device. The memory device includes third and fourth pins respectively connected to the first and second pins, and a plurality of memory chips commonly connected to the fourth pin. The plurality of memory chips respectively include a plurality of resistors connected to one another in a daisy-chain structure between the third pin and a first voltage terminal. The plurality of memory chips are configured to respectively generate a plurality of reference voltage periods that divide between a voltage level of the third pin and a voltage level of the first voltage terminal based on the plurality of resistors.

    Integrated circuit and storage device including integrated circuit

    公开(公告)号:US09897650B2

    公开(公告)日:2018-02-20

    申请号:US14957987

    申请日:2015-12-03

    CPC classification number: G01R31/31716 G01R31/2884 G01R31/3177

    Abstract: An integrated circuit including first pads and second pads, a first receiver circuit and a first driver circuit respectively connected to the first pad, a second receiver circuit and a second driver circuit respectively connected to the second pad, and a first loopback circuit having a first input terminal electrically connected to the first receiver circuit, a first output terminal electrically connected to the first driver circuit, a second output terminal electrically connected to the second driver circuit, and a second input terminal electrically connected to the second receiver circuit may be provided. At a normal mode, the first loopback circuit electrically connects the first input terminal to the second output terminal and electrically connects the second input terminal to the first output terminal. At a test mode, the first loopback circuit electrically connects the first input terminal to the first output terminal.

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