Abstract:
An operating method of a memory controller, configured to control a non-volatile memory device that performs a refresh read operation, detects a power on state or power off state of the non-volatile memory device and issues a refresh read command. The non-volatile memory device that receives the refresh read command is controlled to perform, one time, the refresh read operation including a read operation on one of a plurality of word lines with respect to each of the plurality of memory blocks.
Abstract:
A method of operating a storage device including first and second memory regions includes adjusting a write ratio of the first memory region to the second memory region for write data received from a host in response to a write request from the host, and writing the write data to the first and second memory regions at the adjusted write ratio. The first memory region includes memory cells having a first write speed, and the second memory region includes memory cells having a second write speed that is different from the first write speed.
Abstract:
A memory system includes a flash memory including a block having first sub-blocks and second sub-blocks different from each other, the second sub-blocks including free pages only; and a controller configured to erase the flash memory in units of the sub-blocks, and in a garbage collection operation, the controller is configured to copy data of a valid page of the first sub-blocks to at least one of the second sub-blocks.
Abstract:
A wafer to wafer bonding method includes performing a plasma process on a bonding surface of a first wafer, pressurizing the first wafer after performing the plasma process on the bonding surface of the first wafer, and bonding the first wafer to a second wafer. The plasma process has different plasma densities along a circumferential direction about a center of the first wafer. A middle portion of the first wafer protrudes after pressurizing the first wafer. The first wafer is bonded to the second wafer by gradually joining the first wafer to the second wafer from the middle portion of the first wafer to a peripheral region of the first wafer.
Abstract:
A nonvolatile memory device includes a first area of single-level cells (SLCs) and a second area of multi-level cells (MLCs). The device determines whether a free block can be created by copying data between memory blocks of the first area. Upon determining that the free memory block can be created by copying data between the memory blocks of the first area, the device copies the data between the memory blocks of the first area to create the free memory block. Otherwise, the device selects at least one memory block from the first area and allocates the selected memory block as free memory block by copying the data stored in the selected memory block of the first area to the second area.
Abstract:
In a memory system including a flash memory and a memory controller having a cache memory and a nonvolatile random access memory (NVRAM), a method of operating the memory system includes; receiving a write request specifying a write operation directed to a page of a designated active write block in the flash memory, storing a page mapping table for the active write block in the cache memory, generating update information for the page mapping table stored in the cache memory as a result of executing the write operation, and storing the update information in the NVRAM, and storing an updated version of the page mapping table in the flash memory after execution of the write operation is complete.
Abstract:
The design is defined by the visual features of the display of the DISPLAY SCREEN WITH GRAPHICAL USER INTERFACE FOR AN OVEN shown in the drawing, whether those features are features of shape, configuration, ornament or pattern, or a combination of any of those features. The structure shown in dotted line forms no part of the design.In the drawing:FIG. 1 is a front view of the DISPLAY SCREEN WITH GRAPHICAL USER INTERFACE FOR AN OVEN.