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公开(公告)号:US20250100029A1
公开(公告)日:2025-03-27
申请号:US18975080
申请日:2024-12-10
Applicant: SEMES CO., LTD.
Inventor: Ki-Moon KANG , Seung Un OH
Abstract: The inventive concept provides a substrate treating method. The substrate treating method includes first treating a substrate in a treating space according to a reference recipe; second treating a substrate in the treating space according to the reference recipe after the first treating; and optimizing an inner ambient of the treating space according to the reference recipe, and wherein the optimizing includes a purge operation of supplying and discharging a treating fluid to/from the treating space.
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公开(公告)号:US20240170304A1
公开(公告)日:2024-05-23
申请号:US18515611
申请日:2023-11-21
Applicant: SEMES CO., LTD.
Inventor: Ho Jong HWANG , Hyun Goo PARK , Hyo Won YANG , Ki-Moon KANG , Sang Min LEE , Se Hoon OH , Won Sik SON
IPC: H01L21/67
CPC classification number: H01L21/67017 , H01L21/67109
Abstract: The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes treating modules having an opening for taking in and taking out a substrate and which are stacked on each other; and an air flow generating member for generating a downward airflow at each treating module, and wherein the air flow generating member includes: a pan unit configured to supply an air; a spray unit configured to be provided above the treating module and which sprays an air supplied from the pan unit; and an exhaust unit configured to exhaust an air sprayed by the spray unit to outside of the treating module.
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公开(公告)号:US20210023582A1
公开(公告)日:2021-01-28
申请号:US16936132
申请日:2020-07-22
Applicant: SEMES CO., LTD.
Inventor: Chan Young HEO , Kihoon CHOI , Ki-Moon KANG , Do Heon KIM , Jaeseong LEE
Abstract: An apparatus for treating a substrate includes a process chamber having a treatment space defined therein, a support unit for supporting the substrate in the treatment space, a fluid supply unit for supplying supercritical fluid to the treatment space, and a controller configured to control the fluid supply unit, wherein the fluid supply unit is configured to selectively supply the supercritical fluid at a first density or a second density higher than the first density into the treatment space. Thus, drying efficiency of the substrate when drying the substrate using the supercritical fluid may be improved.
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4.
公开(公告)号:US20180093306A1
公开(公告)日:2018-04-05
申请号:US15721188
申请日:2017-09-29
Applicant: SEMES CO., LTD.
Inventor: Ki-Moon KANG , Anton KORIAKIN , In IL JUNG , Hae-Won CHOI
IPC: B08B7/00 , C11D11/00 , H01L21/311 , H01L21/67
CPC classification number: B08B7/0021 , C07C31/02 , C11D7/5022 , C11D11/0047 , H01L21/31133 , H01L21/67051 , H01L21/6708 , H01L21/67109 , H01L21/6719
Abstract: Disclosed are an anhydrous substrate cleaning composition, a substrate treating method, and a substrate treating apparatus. The substrate cleaning composite includes an etching compound that provides a component for treating a substrate, and a solvent that dissolves the etching compound, wherein the substrate cleaning composite is an anhydrous composite that does not include water.
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公开(公告)号:US20230402295A1
公开(公告)日:2023-12-14
申请号:US17835498
申请日:2022-06-08
Applicant: SEMES CO., LTD.
Inventor: Ki-Moon KANG , Hyun Goo PARK , Hyo Won YANG
IPC: H01L21/67 , C23C16/44 , C23C16/455
CPC classification number: H01L21/67017 , C23C16/4412 , H01L21/67173 , C23C16/45551
Abstract: The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes a high pressure chamber configured to form a treating space for performing a supercritical treating process therein; a substrate support unit configured to support a substrate at the treating space; a fluid supply unit configured to supply a treating fluid to the treating space; and an exhaust unit configured to exhaust an atmosphere of the treating space, and wherein the fluid supply unit comprises a cover plate opposite to a treating surface of a substrate supported by the substrate support unit, and having a supply hole for supplying the treating fluid to the treating surface.
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公开(公告)号:US20230384029A1
公开(公告)日:2023-11-30
申请号:US17825420
申请日:2022-05-26
Applicant: SEMES CO., LTD.
Inventor: Ki-Moon KANG , Hyun Goo PARK , Hyo Won YANG
IPC: F26B5/00
CPC classification number: F26B5/005
Abstract: The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes a chamber having a treating space therein; a substrate support unit configured to support a substrate in the treating space; and a fluid supply unit configured to supply a fluid in a supercritical state to the treating space, wherein the fluid supply unit comprises: a supply line provided at a top wall of the chamber; and a discharge unit installed at the top wall of the chamber and configured to discharge a fluid to a substrate, and wherein the discharge unit comprises: a body having a discharge fluid channel for the fluid; a nozzle plate provided at a discharge end of the body; and a blocking plate within the discharge fluid channel and spaced apart from the nozzle plate.
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公开(公告)号:US20210020430A1
公开(公告)日:2021-01-21
申请号:US16929190
申请日:2020-07-15
Applicant: SEMES CO., LTD.
Inventor: Do Heon KIM , Kihoon CHOI , Chan Young HEO , Ki-Moon KANG
Abstract: Disclosed is a method of treating a substrate. In one embodiment, supercritical fluid is supplied to a treatment space in a chamber such that the substrate in the treatment space is treated. The supercritical fluid is supplied to the treatment space while exhausting the treatment space. A temperature of the supercritical fluid supplied when exhausting the treatment space is higher than a temperature of the supercritical fluid supplied to the treatment space for treating the substrate.
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8.
公开(公告)号:US20190080902A1
公开(公告)日:2019-03-14
申请号:US16129089
申请日:2018-09-12
Applicant: SEMES CO., LTD.
Inventor: Hae-Won CHOI , Ki-Moon KANG , Kihoon CHOI , Anton KORIAKIN , Chan Young HEO , Jaeseong LEE , Kwon Taek LIM , Yong Hun KIM , Sang Ho LEE
IPC: H01L21/02 , B08B3/08 , C09K13/08 , C11D7/36 , C11D7/50 , C11D7/34 , C11D11/00 , H01L21/687 , H01L21/67
Abstract: Disclosed are an anhydrous substrate cleaning composition, a substrate treating method, and a substrate treating apparatus. The anhydrous substrate cleaning composition includes an etching composite that provides fluorine, a solvent that dissolves the etching composite, and a binder that is a composite including phosphorous.
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