Abstract:
A method for encoding a data value to be transmitted on an SPI serial bus includes an operation to modify a status register of a memory, at least at one chosen time instant, as a function of all or part of the data value to be transmitted.
Abstract:
An integrated circuit memory includes memory cells arranged in an array with rows and columns, each column including a first bit line and a second bit line. Each memory cell is formed by: a first select transistor with a first source-drain path; a second select transistor with a second source-drain path; a first floating gate transistor with a third source-drain path; and a second floating gate transistor with a fourth source-drain path. The first, second, third and fourth source-drain paths are coupled in series between the first bit line and the second bit line. The word line for each row of the memory is coupled to the gate terminals of the first and second select transistors. The control gate line for each row in coupled to the gate terminals of the first and second floating gate transistors.
Abstract:
The present disclosure relates to a method for writing in an EEPROM memory, the method comprising steps of: storing the bits of a word to be written in first memory units, erasing a word to be modified, formed by first memory cells connected to a word line and first bit lines, reading bits stored in the memory cells of a word line WL , in a first read mode and storing the bits read in second memory units, reading in a second read mode the bits stored in the memory cells of the word line, and programming each memory cell of the word line connected to a memory unit storing a bit in the programmed state of the word to be written, of an erased word or of a word comprising a bit having different states in the first and second read modes.
Abstract:
The disclosure relates to an integrated circuit electrically powered by a supply voltage and comprising a memory electrically erasable and/or programmable by means of a second voltage greater than the supply voltage. The integrated circuit comprises means for receiving the second voltage by the intermediary of a reception terminal of the supply voltage or by the intermediary of a reception or emission terminal of a data or clock signal. Applicable in particular to electronic tags comprising a reduced number of interconnection terminals.
Abstract:
The disclosure relates to a device for supplying to at least one integrated circuit a high voltage for erasing and/or programming of a memory. The device includes at least one contact terminal linked to at least one contact terminal of the integrated circuit, a monitor for monitoring a data signal received by the integrated circuit and detecting in the data signal a write command of the memory, and a voltage supplier for applying the high voltage to a terminal of the integrated circuit when a write command of the memory has been detected by the monitor.
Abstract:
An EEPROM includes a floating gate transistor having a source region, a channel region and a drain region. A first capa implant zone on a drain-side of the floating gate transistor has a first dopant concentration level. A second capa implant zone in the first capa implant zone adjacent the drain region has a second dopant concentration level that is greater than the first dopant concentration level. A gate oxide region insulates the floating gate electrode from the channel region, first capa implant zone and second capa implant zone. A thickness of the gate oxide region is thinner at the second capa implant zone than at the channel region and first capa implant zone.
Abstract:
An integrated circuit memory includes memory cells arranged in an array with rows and columns, each column including a first bit line and a second bit line. Each memory cell is formed by: a first select transistor with a first source-drain path; a second select transistor with a second source-drain path; a first floating gate transistor with a third source-drain path; and a second floating gate transistor with a fourth source-drain path. The first, second, third and fourth source-drain paths are coupled in series between the first bit line and the second bit line. The word line for each row of the memory is coupled to the gate terminals of the first and second select transistors. The control gate line for each row in coupled to the gate terminals of the first and second floating gate transistors.
Abstract:
A memory cell for use within a memory array includes a memory circuit and a read circuit. The memory circuit includes a non-volatile memory element (for example, a floating gate transistor) coupled to an RS flip flop. The RS flip flop is configured with a p-channel transistor coupled to receive a first enable signal and an n-channel transistor coupled to receive a second enable signal. The assertion of the enable signals is offset in time to control operations for forcing latch nodes to a specific voltage and enabling latching operation. The read circuit includes latch circuit coupled to outputs of the RS flip flop and operable as a sense amplifier circuit. The memory and read circuits are fabricated within a rectangular circuit area. Many such rectangular circuit area may be positioned adjacent to each other in a row or column of the memory array.
Abstract:
A method for managing a non-volatile memory may include a first phase of writing data to a first bank of a memory plane of the non-volatile memory, and then a second phase of writing the same data to a second bank of the same memory plane of the non-volatile memory in the case of success of the first writing phase.
Abstract:
A method of programming an EEPROM, including: a first mode where a writing into cells is performed under a first voltage; and a second mode where the writing is performed under a second voltage smaller than the first one.