Abstract:
Memory circuitry includes memory components operable in response to first edges of an internal clock. The memory circuitry also includes internal clock generating circuitry to generate the internal clock in response to a system clock. The first edges of the internal clock are generated in response to both a rising and a falling edge of the system clock.
Abstract:
A write is performed to a first cell of a memory at a first row and column during a first memory access cycle. A memory access operation is made to a second cell at a second row and column during an immediately following second memory access cycle. If the memory access is a read from the second cell and the second row is the same as the first row, or if the memory access is a write to the second cell and the second row is the same as the first row and the second column is different than the first column, then a simultaneous operation is performed during the second memory access cycle. The simultaneous operation is an access of the second cell (for read or write) and a re-write of data from the first memory access cycle write operation back to the first cell.
Abstract:
An embodiment of a method for automated test pattern generation (ATPG), a system for ATPG, and a memory configured for ATPG. For example, an embodiment of a memory includes a first test memory cell, a data-storage memory cell, and a test circuit configured to enable the test cell and to disable the data-storage cell during a test mode.
Abstract:
Delays are introduced in self-timed memories by introducing a capacitance on the path of a signal to be delayed. The capacitances are realized by using idle-lying metal layers in the circuitry. The signal to be delayed is connected to the idle-lying capacitances via programmable switches. The amount of delay introduced depends on the capacitance introduced in the path of signal, which in turn depends on state of the switches. The state of the switches is controlled by delay codes provided externally to the delay introducing circuitry. Since idle-lying metal capacitances are utilized, the circuitry can be implemented using a minimum amount of additional hardware. Also, the delay provided by the circuitry is a function of memory cell SPICE characteristics and core parasitic capacitances.
Abstract:
A write is performed to a first cell of a memory at a first row and column during a first memory access cycle. A memory access operation is made to a second cell at a second row and column during an immediately following second memory access cycle. If the memory access is a read from the second cell and the second row is the same as the first row, or if the memory access is a write to the second cell and the second row is the same as the first row and the second column is different than the first column, then a simultaneous operation is performed during the second memory access cycle. The simultaneous operation is an access of the second cell (for read or write) and a re-write of data from the first memory access cycle write operation back to the first cell.
Abstract:
An embodiment of a method for automated test pattern generation (ATPG), a system for ATPG, and a memory configured for ATPG. For example, an embodiment of a memory includes a first test memory cell, a data-storage memory cell, and a test circuit configured to enable the test cell and to disable the data-storage cell during a test mode.
Abstract:
An embodiment of a method for automated test pattern generation (ATPG), a system for ATPG, and a memory configured for ATPG. For example, an embodiment of a memory includes a first test memory cell, a data-storage memory cell, and a test circuit configured to enable the test cell and to disable the data-storage cell during a test mode.
Abstract:
An embodiment of a method for automated test pattern generation (ATPG), a system for ATPG, and a memory configured for ATPG. For example, an embodiment of a memory includes a first test memory cell, a data-storage memory cell, and a test circuit configured to enable the test cell and to disable the data-storage cell during a test mode.