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    Instrument for high throughput measurement of material physical properties and method of using same
    2.
    发明申请
    Instrument for high throughput measurement of material physical properties and method of using same 失效
    用于材料物理性能高通量测量的仪器及其使用方法

    公开(公告)号：US20020029621A1

    公开(公告)日：2002-03-14

    申请号：US09779149

    申请日：2001-02-08

    Applicant: Symyx Technologies, Inc.

    Inventor： Damian Hajduk ,  Eric Carlson ,  J. Christopher Freitag ,  Oleg Kolosov ,  James R. Engstrom ,  Adam Safir ,  Ravi Srinivasan ,  Leonid Matsiev

    IPC: G01N003/48

    CPC classification number: B01L3/5085 ,  B01J2219/00707 ,  B01J2219/00718 ,  G01N5/00 ,  G01N11/00 ,  G01N19/00 ,  G01N29/02 ,  G01N29/222 ,  G01N2203/0286 ,  G01N2291/02466 ,  G01N2291/0255 ,  G01N2291/02818 ,  G01N2291/106 ,  Y10T436/12

    Abstract: An apparatus and method for screening combinatorial libraries of materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array of sensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the sample array that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of materials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, melt flow indexing, and rheology), among others.

    Abstract translation: 描述了通过测量单个文库成员对机械扰动的响应来筛选材料组合文库的装置和方法。 该装置通常包括用于容纳库构件的样本保持器，用于机械扰乱各个库构件的探针阵列，以及用于测量每个库构件对机械扰动的响应的传感器阵列。 正在进行筛选的图书馆成员组成一个样本数组，单独的图书馆成员构成了样本数组的元素，它们限于样本持有者的特定位置。 在筛选期间，设备通过移位样品阵列（样品架）和探针阵列来机械地干扰各个库成员。 通常，样本阵列的所有元素都被同时扰动，但是该装置也可以顺序扰乱单个或组的样本阵列元素。 灵活的装置和方法可以基于许多不同的体积物理性质（包括杨氏模量（挠曲，单轴延伸，双轴压缩和剪切））筛选材料库; 硬度（压痕），破坏（破坏时的应力和应变，韧性），粘附性（粘性，环粘性）和流动性（粘度，熔体流动指数和流变学）等。

    Parallel gas chromatograph with microdetector array
    3.
    发明申请
    Parallel gas chromatograph with microdetector array 失效
    具有微量检测器阵列的平行气相色谱仪

    公开(公告)号：US20040139784A1

    公开(公告)日：2004-07-22

    申请号：US10718196

    申请日：2003-11-20

    Applicant: Symyx Technologies, Inc.

    Inventor： Ravi Srinivasan ,  Daniel Meron Pinkas ,  Shenheng Guan ,  Michael Myslovaty ,  Mikhail Spitkovsy ,  James R. Engstrom ,  H. Sam Bergh

    IPC: G01N030/04

    CPC classification number: G01N30/18 ,  B01J19/0046 ,  B01J2219/00286 ,  B01J2219/00306 ,  B01J2219/00704 ,  G01N30/466 ,  G01N30/6004 ,  G01N30/6095 ,  G01N30/66 ,  G01N30/8631 ,  G01N2030/185 ,  G01N2030/208 ,  G01N2030/3084 ,  G01N2030/8881

    Abstract: Gas chromatographs of the invention generally comprise four or more analysis channels. Specifically, four or more gas chromatography columns are configured for parallel analysis of four or more gaseous samples with detection being effected using a microdetector array comprising four or more microdetectors. In one embodiment, the four or more microdetectors 510 are microfabricated detectors, and are integrally formed with a substrate or with one or more microchip bodies mounted on a substrate. In a preferred embodiment, a microdetector array comprises four or more thermal conductivity detectors having one or more thin-film detection filaments. A preferred heated environment for highly parallel gas chromatographs is also disclosed.

    Abstract translation: 本发明的气相色谱通常包含四个或更多个分析通道。 具体地说，四个或更多个气相色谱柱被配置用于并行分析四种或更多种气态样品，其中使用包含四个或更多微量检测器的微量检测器阵列进行检测。 在一个实施例中，四个或更多个微检测器510是微制造的检测器，并且与基板或与安装在基板上的一个或多个微芯片体整体形成。 在优选实施例中，微检测器阵列包括具有一个或多个薄膜检测丝的四个或更多个热导检测器。 还公开了用于高度平行的气相色谱仪的优选的加热环境。

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