公开(公告)号：US20070250284A1

公开(公告)日：2007-10-25

申请号：US11711644

申请日：2007-02-28

申请人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura ,  Takashi Ishimura

发明人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura ,  Takashi Ishimura

IPC分类号： G01R31/3187

CPC分类号： G11C29/12015 ,  G01R31/318552 ,  G01R31/31858 ,  G11C29/50012 ,  H03L7/00 ,  H03L7/06

摘要： A semiconductor integrated circuit of the present invention is provided with a clock control portion having a clock generation portion for generating a clock signal and an output command signal input portion for receiving a clock output command signal from the outside, and an internal circuit controlled by an output clock signal that is output from the clock control portion, and the clock control portion is configured so that it outputs the output clock signal to the internal circuit when a certain time period has passed from a time when the output command signal is received.

公开(公告)号：US07197725B2

公开(公告)日：2007-03-27

申请号：US10187413

申请日：2002-07-02

申请人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura ,  Takashi Ishimura

发明人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura ,  Takashi Ishimura

IPC分类号： G06F17/50

CPC分类号： G11C29/12015 ,  G01R31/318552 ,  G01R31/31858 ,  G11C29/50012 ,  H03L7/00 ,  H03L7/06

摘要： A semiconductor integrated circuit of the present invention is provided with a clock control portion having a clock generation portion for generating a clock signal and an output command signal input portion for receiving a clock output command signal from the outside, and an internal circuit controlled by an output clock signal that is output from the clock control portion, and the clock control portion is configured so that it outputs the output clock signal to the internal circuit when a certain time period has passed from a time when the output command signal is received.

摘要翻译： 本发明的半导体集成电路设置有时钟控制部分，其具有用于产生时钟信号的时钟产生部分和用于从外部接收时钟输出命令信号的输出命令信号输入部分和由外部控制的内部电路 输出时钟信号，并且时钟控制部分被配置为使得当从接收到输出命令信号的时间过去一段时间时，它将输出时钟信号输出到内部电路。

公开(公告)号：US07171600B2

公开(公告)日：2007-01-30

申请号：US10828263

申请日：2004-04-21

申请人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura

发明人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura

IPC分类号： G01R31/28

CPC分类号： G01R31/28 ,  G01R31/318505 ,  G01R31/318538 ,  G01R31/318558 ,  G06F17/50 ,  G11C5/02 ,  G11C5/025 ,  G11C29/48 ,  G11C2029/3202 ,  H01L23/12

摘要： An apparatus for testing a semiconductor device by mounting a plurality of chip intellectual properties (IPs) on a common semiconductor wiring substrate, including a silicon wiring substrate on which the chip IPs are mounted. A circuit for a boundary scan test is formed on the silicon wiring substrate by connecting flip-flops to wiring, which are arranged to test connections in the wiring. An IP on Super-Sub (IPOS) device or each chip IP may be arranged to facilitate a scan test, a built-in self-test (BIST), etc., on the internal circuit of the chip IP.

摘要翻译： 一种用于通过在公共半导体布线基板上安装多个芯片智能特性（IP）来测试半导体器件的装置，包括安装有芯片IP的硅布线基板。 通过将触发器连接到布线来测试布线中的连接，在硅布线基板上形成用于边界扫描测试的电路。 可以安排IP超级（IPOS）设备上的IP或每个芯片IP，以便在芯片IP的内部电路上进行扫描测试，内置自检（BIST）等。

公开(公告)号：US07348595B2

公开(公告)日：2008-03-25

申请号：US10828492

申请日：2004-04-21

申请人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura

发明人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura

IPC分类号： G11C5/02

CPC分类号： G01R31/28 ,  G01R31/318505 ,  G01R31/318538 ,  G01R31/318558 ,  G06F17/50 ,  G11C5/02 ,  G11C5/025 ,  G11C29/48 ,  G11C2029/3202 ,  H01L23/12

摘要： A semiconductor device constructed by mounting a plurality of chip intellectual properties (IPs) on a common semiconductor wiring substrate, a method for testing the device and a method for mounting the chip IPs. A silicon wiring substrate on which chip IPs can be mounted is provided. A circuit for a boundary scan test is formed on the silicon wiring substrate by connecting flip flops. The flip flops are connected to wiring and are arranged to test connections in the wiring. The entire IP On Super-Sub (IPOS) device or each chip IP may be arranged to facilitate a scan test, a built-in self-test (BIST), etc., on the internal circuit of the chip IP.

摘要翻译： 通过将多个芯片智能特性（IP）安装在公共半导体布线基板上构成的半导体器件，测试器件的方法和安装芯片IP的方法。 提供了可以安装芯片IP的硅布线基板。 通过连接触发器在硅布线基板上形成用于边界扫描测试的电路。 触发器连接到布线并被布置成测试布线中的连接。 整个IP On Super Sub（IPOS）设备或每个芯片IP可以被布置成便于在芯片IP的内部电路上进行扫描测试，内置自检（BIST）等。

公开(公告)号：US07032196B2

公开(公告)日：2006-04-18

申请号：US10828230

申请日：2004-04-21

申请人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura

发明人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura

IPC分类号： G06F17/50 ,  H01L23/58 ,  G01R31/28

CPC分类号： G01R31/28 ,  G01R31/318505 ,  G01R31/318538 ,  G01R31/318558 ,  G06F17/50 ,  G11C5/02 ,  G11C5/025 ,  G11C29/48 ,  G11C2029/3202 ,  H01L23/12

摘要： A semiconductor device constructed by mounting a plurality of chip intellectual properties (IPs) on a common semiconductor wiring substrate, a method for testing the device and a method for mounting the chip IPs. A silicon wiring substrate on which chip IPs can be mounted is provided. A circuit for a boundary scan test is formed on the silicon wiring substrate by connecting flip flops. The flip flops are connected to wiring and are arranged to test connections in the wiring. The entire IP On Super-Sub (IPOS) device or each chip IP may be arranged to facilitate a scan test, a built-in self-test (BIST), etc., on the internal circuit of the chip IP.

公开(公告)号：US06734549B2

公开(公告)日：2004-05-11

申请号：US10187269

申请日：2002-07-02

申请人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura

发明人： Sadami Takeoka ,  Mitsuyasu Ohta ,  Osamu Ichikawa ,  Masayoshi Yoshimura

IPC分类号： H01L2312

CPC分类号： G01R31/28 ,  G01R31/318505 ,  G01R31/318538 ,  G01R31/318558 ,  G06F17/50 ,  G11C5/02 ,  G11C5/025 ,  G11C29/48 ,  G11C2029/3202 ,  H01L23/12

摘要： A semiconductor device constructed by mounting a plurality of chip intellectual properties (IPs) on a common semiconductor wiring substrate, a method for testing the device and a method for mounting the chip IPs. A silicon wiring substrate on which chip IPs can be mounted is provided. A circuit for a boundary scan test is formed on the silicon wiring substrate by connecting flip flops. The flip flops are connected to wiring and are arranged to test connections in the wiring. The entire IP On Super-Sub (IPOS) device or each chip IP may be arranged to facilitate a scan test, a built-in self-test (BIST), etc., on the internal circuit of the chip IP.

摘要翻译： 通过将多个芯片智能特性（IP）安装在公共半导体布线基板上构成的半导体器件，测试器件的方法和安装芯片IP的方法。 提供了可以安装芯片IP的硅布线基板。 通过连接触发器在硅布线基板上形成用于边界扫描测试的电路。 触发器连接到布线并被布置成测试布线中的连接。 整个IP On Super Sub（IPOS）设备或每个芯片IP可以被布置成便于在芯片IP的内部电路上进行扫描测试，内置自检（BIST）等。

公开(公告)号：US3990092A

公开(公告)日：1976-11-02

申请号：US540340

申请日：1975-01-13

申请人： Masayoshi Yoshimura

发明人： Masayoshi Yoshimura

IPC分类号： H01L27/06 ,  H01L27/08 ,  H01L29/8605 ,  H01L27/04

CPC分类号： H01L27/0652 ,  H01L27/0802 ,  H01L29/8605

摘要： A semiconductor integrated circuit contains a resistance element, wherein a low resistance region of a first conductivity type, employed for a circuit resistance, is formed within a high resistance region of a second conductivity type, opposite to the first conductivity type. The low resistance region and the high resistance region are connected in parallel, so as to prevent the formation of a parasitic transistor and a parasitic thyristor.

摘要翻译： 半导体集成电路包括电阻元件，其中用于电路电阻的第一导电类型的低电阻区域形成在与第一导电类型相反的第二导电类型的高电阻区域内。 低电阻区域和高电阻区域并联连接，以防止形成寄生晶体管和寄生晶闸管。

公开(公告)号：US5495183A

公开(公告)日：1996-02-27

申请号：US440335

申请日：1995-05-12

申请人： Yukio Suzuki ,  Ikuro Masuda ,  Masahiro Iwamura ,  Shinji Kadono ,  Akira Urragami ,  Masayoshi Yoshimura ,  Toshiaki Matsubara

发明人： Yukio Suzuki ,  Ikuro Masuda ,  Masahiro Iwamura ,  Shinji Kadono ,  Akira Urragami ,  Masayoshi Yoshimura ,  Toshiaki Matsubara

IPC分类号： H03K19/0175 ,  H03K19/018 ,  H03K19/094 ,  H03K19/0944 ,  H03K19/177

CPC分类号： H03K19/1778 ,  H03K19/017518 ,  H03K19/01806 ,  H03K19/09429 ,  H03K19/09448 ,  H03K19/17784 ,  H03K19/17792

摘要： In an input level converter for TTL--CMOS level conversion (or other conversion to CMOS) for an internal logic block operating with CMOS levels, an output transistor for executing the charge or discharge of the output capacitance thereof is formed of a bipolar transistor. Thus, the propagation delay times and their capacitance-dependencies of the input level converter can be lessened. Similarly, in an output level converter for CMOS--TTL level conversion (or other conversion from CMOS) for the internal logic block operating with the CMOS levels, an output transistor for executing the charge or discharge of the output load capacitance thereof is formed of a bipolar transistor. Thus, the propagation delay times and their capacitance-dependencies of the output level converter can also be lessened.

摘要翻译： 在用于CMOS电平工作的内部逻辑块的TTL-CMOS电平转换（或其他转换为CMOS）的输入电平转换器中，用于执行其输出电容的充电或放电的输出晶体管由双极晶体管形成。 因此，可以减小输入电平转换器的传播延迟时间及其电容依赖性。 类似地，在用于CMOS电平操作的内部逻辑块的用于CMOS-TTL电平转换（或来自CMOS的其它转换）的输出电平转换器中，用于执行其输出负载电容的充电或放电的输出晶体管由 双极晶体管。 因此，也可以减小输出电平转换器的传播延迟时间及其电容依赖性。

公开(公告)号：US5245224A

公开(公告)日：1993-09-14

申请号：US845136

申请日：1992-03-03

申请人： Yukio Suzuki ,  Ikuro Masuda ,  Masahiro Iwamura ,  Shinji Kadono ,  Akira Uragami ,  Masayoshi Yoshimura ,  Toshiaki Matsubara

发明人： Yukio Suzuki ,  Ikuro Masuda ,  Masahiro Iwamura ,  Shinji Kadono ,  Akira Uragami ,  Masayoshi Yoshimura ,  Toshiaki Matsubara

IPC分类号： H03K19/0175 ,  H03K19/018 ,  H03K19/094 ,  H03K19/0944 ,  H03K19/177

CPC分类号： H03K19/09448 ,  H03K19/017518 ,  H03K19/01806 ,  H03K19/09429

摘要： In an input level converter for TTL-CMOS level conversion (or other conversion to CMOS) for an internal logic block operating with CMOS levels, an output transistor for executing the charge or discharge of the output capacitance thereof is formed of a bipolar transistor. Thus, the propagation delay times and their capacitance-dependencies of the input level converter can be lessened. Similarly, in an output level converter for CMOS-TTL level conversion (or other conversion from CMOS) for the internal logic block operating with the CMOS levels, an output transistor for executing the charge or discharge of the output load capacitance thereof is formed of a bipolar transistor. Thus, the propagation delay times and their capacitance-dependencies of the output level converter can also be lessened.

摘要翻译： 在用于CMOS电平工作的内部逻辑块的TTL-CMOS电平转换（或其他转换为CMOS）的输入电平转换器中，用于执行其输出电容的充电或放电的输出晶体管由双极晶体管形成。 因此，可以减小输入电平转换器的传播延迟时间及其电容依赖性。 类似地，在用于CMOS电平操作的内部逻辑块的用于CMOS-TTL电平转换（或来自CMOS的其它转换）的输出电平转换器中，用于执行其输出负载电容的充电或放电的输出晶体管由 双极晶体管。 因此，也可以减小输出电平转换器的传播延迟时间及其电容依赖性。

公开(公告)号：US5103120A

公开(公告)日：1992-04-07

申请号：US636892

申请日：1991-01-02

申请人： Yukio Suzuki ,  Ikuro Masuda ,  Masahiro Iwamura ,  Shinji Kadono ,  Akira Uragami ,  Masayoshi Yoshimura ,  Toshiaki Matsubara

发明人： Yukio Suzuki ,  Ikuro Masuda ,  Masahiro Iwamura ,  Shinji Kadono ,  Akira Uragami ,  Masayoshi Yoshimura ,  Toshiaki Matsubara

IPC分类号： H03K19/00 ,  H03K19/0175 ,  H03K19/018 ,  H03K19/094 ,  H03K19/0944 ,  H03K19/177

CPC分类号： H03K19/09448 ,  H03K19/017518 ,  H03K19/01806 ,  H03K19/09425 ,  H03K19/09429 ,  H01L2924/0002

摘要： In an input level converter for TTL - CMOS level conversion (or other conversion to CMOS) for an internal logic block operating with CMOS levels, an output transistor for executing the charge or discharge of the output capacitance thereof is formed of a bipolar transistor. Thus, the propagation delay times and their capacitance-dependencies of the input level converter can be lessened. Similarly, in an output level converter for CMOS - TTL level conversion (or other conversion from CMOS) for the internal logic block operating with the CMOS levels, an output transistor for executing the charge or discharge of the output load capacitance thereof is formed of a bipolar transistor. Thus, the propagation delay times and their capacitance-dependencies of the output level converter can also be lessened.

摘要翻译： 在用于CMOS电平工作的内部逻辑块的TTL-CMOS电平转换（或其他转换为CMOS）的输入电平转换器中，用于执行其输出电容的充电或放电的输出晶体管由双极晶体管形成。 因此，可以减小输入电平转换器的传播延迟时间及其电容依赖性。 类似地，在用于CMOS电平操作的内部逻辑块的CMOS-TTL电平转换（或来自CMOS的其它转换）的输出电平转换器中，用于执行其输出负载电容的充电或放电的输出晶体管由 双极晶体管。 因此，也可以减小输出电平转换器的传播延迟时间及其电容依赖性。