Integrated circuit and semiconductor device including the same
    1.
    发明授权
    Integrated circuit and semiconductor device including the same 有权
    集成电路和半导体器件包括相同的

    公开(公告)号:US09379705B2

    公开(公告)日:2016-06-28

    申请号:US14624646

    申请日:2015-02-18

    Abstract: An integrated circuit (IC) includes at least one unit cell. The at least one unit cell includes a first bit circuit configured to process a first bit signal, a second bit circuit configured to process a second bit signal, a first well spaced apart from boundaries of the at least one unit cell and biased to a first voltage, and a second well biased to a second voltage that is different from the first voltage. Each of the first and second bit circuits includes at least one transistor from among a plurality of transistors disposed in the first well.

    Abstract translation: 集成电路(IC)包括至少一个单元电池。 所述至少一个单元单元包括被配置为处理第一位信号的第一位电路,被配置为处理第二位信号的第二位电路,与所述至少一个单位单元的边界间隔开的第一阱,并被偏置到第一位 电压,第二阱偏压到不同于第一电压的第二电压。 第一和第二位电路中的每一个包括设置在第一阱中的多个晶体管中的至少一个晶体管。

    Scan flip-flop and scan test circuit including the same

    公开(公告)号:US11287474B2

    公开(公告)日:2022-03-29

    申请号:US16552109

    申请日:2019-08-27

    Abstract: A scan flip-flop includes an input unit and a flip-flop. The input unit is configured to select one signal from among a data input signal and a scan input signal to supply the selected one signal as an internal signal according to an operation mode. The flip-flop is configured to latch the internal signal according to a clock signal. The flip-flop includes a cross coupled structure that includes first and second tri-state inverters which share a first output node and face each other.

    Scan flip-flop and scan test circuit including the same

    公开(公告)号:US10429443B2

    公开(公告)日:2019-10-01

    申请号:US15663852

    申请日:2017-07-31

    Abstract: A scan flip-flop includes an input unit and a flip-flop. The input unit is configured to select one signal from among a data input signal and a scan input signal to supply the selected one signal as an internal signal according to an operation mode. The flip-flop is configured to latch the internal signal according to a clock signal. The flip-flop includes a cross coupled structure that includes first and second tri-state inverters which share a first output node and face each other.

    Semiconductor device having decoupling capacitors and dummy transistors
    10.
    发明授权
    Semiconductor device having decoupling capacitors and dummy transistors 有权
    具有去耦电容器和虚拟晶体管的半导体器件

    公开(公告)号:US08952423B2

    公开(公告)日:2015-02-10

    申请号:US13785156

    申请日:2013-03-05

    CPC classification number: H01L27/0207 H01L29/94

    Abstract: A semiconductor device includes a logic region disposed in a central region of the semiconductor device, and a peripheral region disposed in an outer region thereof. The logic region includes a line-shaped logic transistor and a box-shaped decoupling capacitor. The peripheral region includes a line-shaped peripheral transistor and a line-shaped peripheral dummy transistor disposed adjacent to the peripheral transistor.

    Abstract translation: 半导体器件包括布置在半导体器件的中心区域中的逻辑区域和设置在其外部区域中的周边区域。 逻辑区域包括线形逻辑晶体管和盒形去耦电容器。 周边区域包括线形外围晶体管和与外围晶体管相邻设置的线状外围虚拟晶体管。

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