Abstract:
A reception interface circuit includes a termination circuit, a buffer and an interface controller. The termination circuit is configured to change a termination mode in response to a termination control signal. The buffer is configured to change a reception characteristic in response to a buffer control signal. The interface controller is configured to generate the termination control signal and the buffer control signal such that the reception characteristic of the buffer is changed in association with the change in the termination mode. The reception interface circuit may support various communication standards by changing the reception characteristic of the buffer in association with the termination mode. Using the reception interface circuit, communication efficiency of transceiver systems such as a memory system and/or compatibility between a transmitter device and a receiver device may be improved.
Abstract:
A semiconductor device includes a semiconductor die, a defect detection structure and an input-output circuit. The semiconductor die includes a central region and a peripheral region surrounding the central region. The peripheral region includes a left-bottom corner region, a left-upper corner region, a right-upper corner region and a right-bottom corner region. The defect detection structure is formed in the peripheral region. The defect detection structure includes a first conduction loop in the left-bottom corner region, a second conduction loop in the right-bottom corner region, a third conduction loop in the left-bottom corner region and the left-upper corner region and a fourth conduction loop in the right-bottom corner region and the right-upper corner region. The input-output circuit is electrically connected to end nodes of the first conduction loop, the second conduction loop, the third conduction loop and the fourth conduction loop.
Abstract:
A semiconductor device, includes at least a first memory chip, which includes at least a first buffer connected to receive an input signal and a reference voltage; at least a first reference voltage generator configured to output a reference voltage based on a first control code; and at least a first self-training circuit for determining an operational reference voltage to use during a normal mode of operation of the semiconductor device. An output from the first buffer is input to the first self-training circuit, the first control code is output from the first self-training circuit into the first reference voltage generator, and the first buffer, the first self-training circuit, and the first reference voltage generator form a loop.
Abstract:
An equalizer circuit may include an equalizer controller and a plurality of equalizers. The equalizer controller may prove separate sets of enable signals, delay control signals and voltage control signals to the separate equalizers based on a control signal. The equalizers provide equalizer signals to separate connection nodes between separate pairs of logic circuits. An equalizer may be selectively activated based on a received enable signal. An equalizer may include a delay control circuit and a voltage control circuit. The delay control circuit may delay a received transfer signal to generate a delayed transfer signal based on a received delay control signal. The voltage control circuit may generate an equalizer signal based on the delayed transfer signal and a received voltage control signal. The equalizer circuit may reduce inter-symbol interference in the integrated circuit based on providing the equalizer signals to the connection nodes between the logic circuits.
Abstract:
An injection-locked phase-locked loop (ILPLL) circuit includes a delay-locked loop (DLL) and an ILPLL. The DLL is configured to generate a DLL clock by performing a delay-locked operation on a reference clock. The ILPLL includes a voltage-controlled oscillator (VCO), and is configured to generate an output clock by performing an injection synchronous phase-locked operation on the reference clock. The DLL clock is injected into the VCO as an injection clock of the VCO.
Abstract:
An apparatus includes data transmitter having first through N-th data drivers configured to provide first through N-th data signals, respectively, and a strobe driver configured to provide a strobe signal, and a data receiver having a strobe buffer configured to generate a control signal based on the strobe signal, and first through N-th sense amplifiers configured to sense N-bit data based on the control signal, a reference signal and the first through N-th data signals. The bus includes a strobe TSV configured to connect the strobe driver with the strobe buffer, and first through N-th data TSVs configured to connect the first through N-th data drivers with the first through N-th sense amplifiers, respectively. A reference signal supplier controls the reference signal such that a discharge speed of the reference signal is slower than a discharge speed of each of the first through N-th data signals during data transmission.
Abstract:
A reception interface circuit includes a reception buffer, a voltage generation circuit and a reception limiting circuit. The reception buffer receives an input signal through an input-output node to generate a buffer signal. The voltage generation circuit generates at least one control voltage based on a reflection characteristic at the input-output node. The reception limiting circuit is connected to the input-output node and limits at least one of a maximum voltage level and a minimum voltage level of the input signal based on the at least one control voltage. Power consumption may be reduced by limiting at least one of the maximum voltage level and the minimum voltage level of the input signal based on the reception characteristic at the input-output node using the reception limiting circuit, and an increased eye margin may be provided in comparison with a conventional termination circuit having the same power consumption.
Abstract:
A semiconductor device, includes at least a first memory chip, which includes at least a first buffer connected to receive an input signal and a reference voltage; at least a first reference voltage generator configured to output a reference voltage based on a first control code; and at least a first self-training circuit for determining an operational reference voltage to use during a normal mode of operation of the semiconductor device. An output from the first buffer is input to the first self-training circuit, the first control code is output from the first self-training circuit into the first reference voltage generator, and the first buffer, the first self-training circuit, and the first reference voltage generator form a loop.