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公开(公告)号:US12009432B2
公开(公告)日:2024-06-11
申请号:US17679413
申请日:2022-02-24
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Hitoshi Kunitake , Yasuhiro Jinbo , Naoki Okuno , Masahiro Takahashi , Tomonori Nakayama
IPC: H01L29/786 , G09G3/32
CPC classification number: H01L29/78603 , G09G3/32 , H01L29/78681 , G09G2300/0426
Abstract: A transistor whose characteristic degradation due to stray light is small is provided. The transistor includes a first insulator, a second insulator over the first insulator, a metal oxide over the second insulator, a first and a second conductor over the metal oxide, a third insulator over the first insulator, the second insulator, the metal oxide, the first conductor, and the second conductor, a fourth insulator over the metal oxide, a fifth insulator over the fourth insulator, and a third conductor over the fifth insulator. The third insulator has an opening to overlap with a region between the first conductor and the second conductor. The fourth insulator, the fifth insulator, and the third conductor are positioned in the opening. The metal oxide has a bandgap greater than or equal to 3.3 eV. The transistor has Vsh higher than or equal to −0.3 V.
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公开(公告)号:US11978742B2
公开(公告)日:2024-05-07
申请号:US18137032
申请日:2023-04-20
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Masahiro Takahashi , Takuya Hirohashi , Masashi Tsubuku , Noritaka Ishihara , Masashi Oota
IPC: H01L27/12 , C23C14/08 , G01N23/207 , G02F1/1368 , H01L21/66 , H01L29/04 , H01L29/24 , H01L29/66 , H01L29/786 , H01L21/02
CPC classification number: H01L27/1225 , C23C14/086 , G01N23/207 , G02F1/1368 , H01L22/12 , H01L29/04 , H01L29/24 , H01L29/66969 , H01L29/7869 , H01L29/78693 , H01L21/0237 , H01L21/02422 , H01L21/02554 , H01L21/02565 , H01L21/02631 , H01L2924/0002 , H01L2924/0002 , H01L2924/00
Abstract: A metal oxide film including a crystal part and having highly stable physical properties is provided. The size of the crystal part is less than or equal to 10 nm, which allows the observation of circumferentially arranged spots in a nanobeam electron diffraction pattern of the cross section of the metal oxide film when the measurement area is greater than or equal to 5 nmφ and less than or equal to 10 nmφ.
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公开(公告)号:US11799080B2
公开(公告)日:2023-10-24
申请号:US16611791
申请日:2018-05-11
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Mayumi Mikami , Aya Uchida , Yumiko Yoneda , Yohei Momma , Masahiro Takahashi , Teruaki Ochiai
IPC: H01B1/08 , H01M4/525 , C01G53/00 , H01M4/131 , H01M4/133 , H01M4/134 , H01M4/36 , H01M4/505 , H01M6/16 , H01M10/0525 , H01M4/139 , H01M4/02
CPC classification number: H01M4/525 , C01G53/50 , H01B1/08 , H01M4/131 , H01M4/133 , H01M4/134 , H01M4/139 , H01M4/366 , H01M4/505 , H01M6/164 , H01M10/0525 , C01P2002/74 , H01M2004/028
Abstract: A positive electrode active material having high capacity and excellent cycle performance is provided. The positive electrode active material has a small difference in a crystal structure between the charged state and the discharged state. For example, the crystal structure and volume of the positive electrode active material, which has a layered rock-salt crystal structure in the discharged state and a pseudo-spinel crystal structure in the charged state at a high voltage of approximately 4.6 V, are less likely to be changed by charge and discharge as compared with those of a known positive electrode active material.
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公开(公告)号:US11444274B2
公开(公告)日:2022-09-13
申请号:US16914539
申请日:2020-06-29
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Masahiro Takahashi , Teruaki Ochiai , Yohei Momma , Ayae Tsuruta
Abstract: A positive electrode active material particle with little deterioration is provided. A power storage device with little deterioration is provided. A highly safe power storage device is provided. The positive electrode active material particle includes a first crystal grain, a second crystal grain; and a crystal grain boundary positioned between the crystal grain and the second crystal grain; the first crystal grain and the second crystal grain include lithium, a transition metal, and oxygen; the crystal grain boundary includes magnesium and oxygen; and the positive electrode active material particle includes a region where the ratio of the atomic concentration of magnesium in the crystal grain boundary to the atomic concentration of the transition metal in first crystal grain and the second crystal grain is greater than or equal to 0.010 and less than or equal to 0.50.
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公开(公告)号:US11387343B2
公开(公告)日:2022-07-12
申请号:US16975855
申请日:2019-02-26
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei Yamazaki , Masahiro Takahashi , Tomoki Hiramatsu
IPC: H01L29/49 , H01L29/66 , H01L29/786 , H01L29/04 , H01L21/02
Abstract: A stack with excellent electrical characteristics and reliability is provided. The stack includes an insulator, a conductor, and a first oxide between the insulator and the conductor; the first oxide includes a first c-axis-aligned crystal region; and a c-axis of the first crystal region is substantially perpendicular to a plane of the first oxide on the insulator side. Alternatively, the stack includes an insulator, a conductor, a first oxide between the insulator and the conductor, and a second oxide facing the first oxide with the insulator therebetween; the first oxide includes a first c-axis-aligned crystal region; a c-axis of the first crystal region is substantially perpendicular to a plane of the first oxide on the insulator side; the second oxide includes a second c-axis-aligned crystal region; and a c-axis of the second crystal region is substantially perpendicular to a plane of the second oxide on the insulator side.
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公开(公告)号:US20210305553A1
公开(公告)日:2021-09-30
申请号:US17345565
申请日:2021-06-11
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Takahiro KAWAKAMI , Teruaki OCHIAI , Yohei MOMMA , Ayae TSURUTA , Masahiro Takahashi , Mayumi MIKAMI
IPC: H01M4/36 , H01M4/04 , H01M4/62 , H01G11/24 , H01G11/86 , H01G11/50 , H01G11/60 , H01M4/505 , H01M4/525
Abstract: Provided is a positive electrode active material which suppresses a reduction in capacity due to charge and discharge cycles when used in a lithium ion secondary battery. A covering layer is formed by segregation on a superficial portion of the positive electrode active material. The positive electrode active material includes a first region and a second region. The first region exists in an inner portion of the positive electrode active material. The second region exists in a superficial portion of the positive electrode active material and part of the inner portion thereof. The first region includes lithium, a transition metal, and oxygen. The second region includes magnesium, fluorine, and oxygen.
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公开(公告)号:US10998449B2
公开(公告)日:2021-05-04
申请号:US16864364
申请日:2020-05-01
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Masahiro Takahashi , Kengo Akimoto , Shunpei Yamazaki
IPC: H01L29/786 , H01L27/12 , H01L29/24 , H01L29/66 , H01L29/04 , H01L27/32 , C01G15/00 , G02F1/1343 , G02F1/1362 , G02F1/1368 , H01L21/02
Abstract: To provide an oxide semiconductor film having stable electric conductivity and a highly reliable semiconductor device having stable electric characteristics by using the oxide semiconductor film. The oxide semiconductor film contains indium (In), gallium (Ga), and zinc (Zn) and includes a c-axis-aligned crystalline region aligned in the direction parallel to a normal vector of a surface where the oxide semiconductor film is formed. Further, the composition of the c-axis-aligned crystalline region is represented by In1+δGa1-δO3(ZnO)m (0
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公开(公告)号:US10892282B2
公开(公告)日:2021-01-12
申请号:US16024997
申请日:2018-07-02
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Masahiro Takahashi , Takuya Hirohashi , Masashi Tsubuku , Noritaka Ishihara , Masashi Oota
IPC: H01L29/10 , H01L27/12 , H01L29/04 , H01L21/66 , H01L29/24 , G02F1/1368 , G01N23/207 , H01L29/66 , C23C14/08 , H01L29/786 , H01L21/02
Abstract: A metal oxide film including a crystal part and having highly stable physical properties is provided. The size of the crystal part is less than or equal to 10 nm, which allows the observation of circumferentially arranged spots in a nanobeam electron diffraction pattern of the cross section of the metal oxide film when the measurement area is greater than or equal to 5 nmφ and less than or equal to 10 nmφ.
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公开(公告)号:US10658517B2
公开(公告)日:2020-05-19
申请号:US16295365
申请日:2019-03-07
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei Yamazaki , Motoki Nakashima , Masahiro Takahashi
IPC: H01L29/10 , H01L29/786 , H01L29/06 , H01L29/24 , H01L29/36 , H01L29/423 , H01L29/66 , H01L29/417
Abstract: A highly reliable semiconductor device and a method for manufacturing the semiconductor device are provided. The semiconductor device is manufactured with a high yield, so that high productivity is achieved. In a semiconductor device including a transistor in which a source electrode layer and a drain electrode layer are provided over and in contact with an oxide semiconductor film, entry of impurities and formation of oxygen vacancies in an end face portion of the oxide semiconductor film are suppressed. This can prevent fluctuation in the electric characteristics of the transistor which is caused by formation of a parasitic channel in the end face portion of the oxide semiconductor film.
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公开(公告)号:US10403839B2
公开(公告)日:2019-09-03
申请号:US15339016
申请日:2016-10-31
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Satoko Shitagaki , Satoshi Seo , Nobuharu Ohsawa , Hideko Inoue , Masahiro Takahashi , Kunihiko Suzuki
Abstract: Provided is a light-emitting element with high external quantum efficiency, or a light-emitting element with a long lifetime. The light-emitting element includes, between a pair of electrodes, a light-emitting layer including a guest material and a host material, in which an emission spectrum of the host material overlaps with an absorption spectrum of the guest material, and phosphorescence is emitted by conversion of an excitation energy of the host material into an excitation energy of the guest material. By using the overlap between the emission spectrum of the host material and the absorption spectrum of the guest material, the energy smoothly transfers from the host material to the guest material, so that the energy transfer efficiency of the light-emitting element is high. Accordingly, a light-emitting element with high external quantum efficiency can be achieved.
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