SUBSTRATE AND METHOD FOR PRODUCING THE SAME
    1.
    发明公开

    公开(公告)号:US20230398655A1

    公开(公告)日:2023-12-14

    申请号:US18333125

    申请日:2023-06-12

    IPC分类号: B24B7/22

    CPC分类号: B24B7/228

    摘要: Proposed herein is a method for producing a substrate suitable for mask blanks for EUVL and the method being capable of suppressing a concave defect having a depth of less than 5 nm.
    The present invention provides a method for producing a substrate in which final polishing is performed by a polishing apparatus having an upper polishing plate equipped with a polishing pad, the method comprising the steps of placing a substrate stock in the polishing apparatus so that the main surface of the substrate stock face toward the upper polishing plate; rotating the upper polishing plate and polishing the substrate stock concomitantly with a polishing slurry on the main surface of the substrate stock; and raising the upper polishing plate which is kept being rotated to separate it from the main surface of the polished substrate stock.

    LID FOR OPTICAL ELEMENT PACKAGE, OPTICAL ELEMENT PACKAGE, AND MANUFACTURING METHOD FOR LID FOR OPTICAL ELEMENT PACKAGE AND OPTICAL ELEMENT PACKAGE

    公开(公告)号:US20210351326A1

    公开(公告)日:2021-11-11

    申请号:US17277531

    申请日:2019-09-02

    IPC分类号: H01L33/48

    摘要: A lid for an optical element package, comprising: a window material provided in front of the light emitting direction of an optical element of a housing member, inside of which the optical element is housed; and a metal-based adhesive layer formed on a part at which the window material contacts the housing member, wherein with the lid for an optical element package, the metal-based adhesive layer is formed by an adhesive composition including metal nanoparticles, a solder powder, and a dispersion medium coated by a coating agent. It is possible to address deterioration and cracking due to light of short wavelengths, distortion or decay of the adhesive agent due to heat generation of the light emitting element, and the problem of long-term reliability accompanying these. Specifically, it is possible to provide the lid for an optical element package and the optical element package with excellent heat resistance, ultraviolet resistance, etc.

    MASK BLANKS SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME

    公开(公告)号:US20230037856A1

    公开(公告)日:2023-02-09

    申请号:US17856191

    申请日:2022-07-01

    IPC分类号: G03F1/60

    摘要: A mask blanks substrate having a flatness of a calculation surface of 100 nm or less when a calculation region passing through central portions of first and second main surfaces and extending in a horizontal direction is set, a first region surface is cut out, a second region surface is cut out by setting a reference plane and a rotation axis and rotating the substrate by 180°, least square planes are calculated, the first and second region surfaces are converted into height maps to positions on the least square planes, the height map of the to second region surface is set as a reverse height map by symmetrically moving the height map, and a map of a calculated height obtained by adding heights of the height map of the first region surface and the reverse height map of the second region surface is set as the calculation surface.

    POLISHING COMPOSITION
    7.
    发明申请

    公开(公告)号:US20220372331A1

    公开(公告)日:2022-11-24

    申请号:US17732242

    申请日:2022-04-28

    IPC分类号: C09G1/02 C09K3/14

    摘要: A polishing composition including a colloidal silica containing colloidal silica particles, a pH adjusting agent, and a chelating agent provides a substrate that has a surface having a high flatness, low defects and a low surface roughness with low cost and high productivity, and a substrate having high surface quality suitable as a substrate for mask blanks such as a glass substrate containing SiO2 as a main component, particularly, as a substrate for mask blanks used in EUVL.

    SUBSTRATE FOR MASK BLANKS AND METHOD FOR MANUFACTURING THE SAME

    公开(公告)号:US20230418149A1

    公开(公告)日:2023-12-28

    申请号:US18327136

    申请日:2023-06-01

    IPC分类号: G03F1/24 G03F1/44

    CPC分类号: G03F1/24 G03F1/44

    摘要: A substrate for mask blanks having first and second main surfaces of 152 mm×152 mm square and a thickness of 6.35 mm, wherein: when a range of 132 mm×132 mm square centered on an intersection of diagonal lines is defined as a calculation region in each of the first and second main surfaces, on a substrate surface of the calculation region of at least one of the first and second main surfaces, flatness of the substrate surface of the calculation region based on a least square plane is 100 nm or less, and a difference (PV) between a highest value and a lowest value of a height of a calculation surface represented by a difference between shapes of the substrate surfaces before and after smoothing processing with a Gaussian filter (10 mm×10 mm) based on the least square plane is 20 nm or less.