OSCILLATOR CIRCUIT, DEVICE, AND METHOD

    公开(公告)号:US20210167728A1

    公开(公告)日:2021-06-03

    申请号:US17173743

    申请日:2021-02-11

    Abstract: A band-pass filter (BPF) includes a pair of coupled transformers including first through fourth conductive structures. The first conductive structure includes a first terminal and two first extending portions extending from the first terminal and configured as primary windings. The second conductive structure includes a second terminal and two second extending portions extending from the second terminal. A first via connects the third conductive structure to a first one of the two second extending portions, the third conductive structure and the first one of the two second extending portions thereby being configured as a first secondary winding. A second via connects the fourth conductive structure to a second one of the two second extending portions, the fourth conductive structure and the second one of the two second extending portions thereby being configured as a second secondary winding.

    INTEGRATED CIRCUIT WITH GUARD RING
    4.
    发明申请
    INTEGRATED CIRCUIT WITH GUARD RING 审中-公开
    集成电路与保护环

    公开(公告)号:US20150364417A1

    公开(公告)日:2015-12-17

    申请号:US14303206

    申请日:2014-06-12

    Abstract: An integrated circuit comprises an inductor over a substrate and a guard ring surrounding the inductor. The guard ring comprises a plurality of first metal lines extending in a first direction and a plurality of second metal lines extending in a second direction. The second metal lines of the plurality of second metal lines are each coupled with at least one first metal line of the plurality of first metal lines. The guard ring also comprises a staggered line comprising a connected subset of at least one first metal line of the plurality of first metal lines and at least one second metal line of the plurality of second metal lines. The first metal lines of the plurality of first metal lines outside of the connected subset, the second metal lines of the plurality of second metal lines outside of the connected subset, and the staggered line surround the inductor.

    Abstract translation: 集成电路包括衬底上的电感器和围绕电感器的保护环。 保护环包括沿第一方向延伸的多个第一金属线和沿第二方向延伸的多个第二金属线。 多个第二金属线中的第二金属线分别与多个第一金属线中的至少一个第一金属线耦合。 保护环还包括交错线,其包括多个第一金属线中的至少一个第一金属线和多个第二金属线中的至少一个第二金属线的连接子集。 连接子集外部的多个第一金属线中的第一金属线,连接子集外部的多个第二金属线中的第二金属线,以及交错线围绕电感器。

    TEST CIRCUIT AND METHOD
    5.
    发明公开

    公开(公告)号:US20230375614A1

    公开(公告)日:2023-11-23

    申请号:US18363143

    申请日:2023-08-01

    CPC classification number: G01R31/2884 G01R31/2879 G01R31/2853

    Abstract: An IC includes a device-under-test (DUT) configured to receive a first AC signal at a first node and output a second AC signal at a second node, the second AC signal being based on the first AC signal, and first and second detection circuits. Each of the first and second detection circuits includes a first gain stage coupled to a corresponding one of the first or second nodes through a first capacitive device, a second gain stage in a cascade arrangement with the first gain stage, and a low-pass filter configured to generate a DC signal based on an output signal of the second gain stage.

    TEST CIRCUIT AND METHOD
    6.
    发明公开

    公开(公告)号:US20230160954A1

    公开(公告)日:2023-05-25

    申请号:US18151959

    申请日:2023-01-09

    CPC classification number: G01R31/2884 G01R31/2879 G01R31/2853

    Abstract: An IC includes a plurality of pads at a top surface of a semiconductor wafer, an amplifier configured to receive a first AC signal at an input terminal, and output a second AC signal at an output terminal, a first detection circuit coupled to the input terminal and configured to output a first DC voltage to a first pad of the plurality of pads responsive to the first AC signal, and a second detection circuit coupled to the output terminal and configured to output a second DC voltage to a second pad of the plurality of pads responsive to the second AC signal.

    TEST CIRCUIT AND METHOD
    7.
    发明申请

    公开(公告)号:US20210341535A1

    公开(公告)日:2021-11-04

    申请号:US17376338

    申请日:2021-07-15

    Abstract: A test circuit includes an oscillator configured to generate an oscillation signal, a device-under-test (DUT) configured to output an AC signal based on the oscillation signal, a first detection circuit configured to generate a first DC voltage having a first value based on the oscillation signal, and a second detection circuit configured to generate a second DC voltage having a second value based on the AC signal.

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