摘要:
The invention relates to a test circuit configuration. Every gate terminal of a transistor to be tested is coupled to a gate voltage source in such a manner that the gate voltage can be measured and adjusted individually on every gate terminal. The source terminal of every transistor to be tested can be coupled to the source voltage source in such a manner that the source voltage can be measured and adjusted individually on every source terminal.
摘要:
An apparatus and method for testing a plurality of electrical components that are coupled to one another. Further, an electrical selection unit, coupled to the electrical components to be tested, is provided for selecting at least one electrical component to be tested. A parasitic voltage drop in the testing circuit can be at least partially compensated using a control element coupled to the electrical components to be tested. The invention makes it possible, for testing of electrical components on a wafer over a large distance, i.e., several millimeters, to permit automated compensation of interference influences which occur as a result of the lines coupling or connecting the components to be tested.
摘要:
A circuit configuration for assessing capacitances in a matrix, which has a number of rows with at least one capacitance in at least one dimension, includes a test arm connected to first electrodes of each of the capacitances to be assessed and by which two different potentials can be applied to the first electrodes, a measurement arm connected to second electrodes of each of the capacitances to be assessed and that has a first measurement path and a second measurement path connected to a common potential. The first measurement path has an instrument for assessing the capacitances and the first and second measurement paths can be connected to the second electrodes. The circuit configuration has a drive device that connects each of the capacitances to be assessed individually to the two different potentials.
摘要:
In the pointer circuit, only one static memory (1) is respectively individually allocated to each output ( . . . , A.sub.n-1, A.sub.n, A.sub.n+1, . . . ), of which each respectively has a pair of mutually complementary memory terminals (Q, Q). The two terminals are in two stored logical states ("1," "0") differing from one another. A memory terminal (Q) of each memory is connected with the output allocated to this memory. The memories are controlled by clock signals. This results in advantageous surface requirement and power loss low, as well as high speed.
摘要:
The invention relates to a differential sense amplifier for sensing data stored in a plurality of memory cells of a memory cell array, including a first CMOS inverter having an output connected to a first bit line and an input connected to a second bit line complementary to the first bit line, and a second CMOS inverter having an output connected to the second bit line and an input connected to the first bit line (BL). Each CMOS inverter includes a pull-up transistor and a pull-down transistor, with the sense amplifier having a pair of precharge transistors arranged to be respectively coupled to the first and second bit lines, to precharge the first and second bit lines to a precharge voltage. The precharge transistors are constituted by the pull-up transistors or by the pull-down transistors.
摘要:
The invention relates to an arrangement comprising a logarithmizing unit and a subtracting unit, wherein the subtracting unit has an output at which a voltage value linearly proportional to the temperature can be tapped off.
摘要:
A semiconductor memory having read amplifier strips having a plurality of read amplifiers and having memory cell fields which have a plurality of memory cells connected to bit lines is disclosed. The read amplifier strips include at least two outer read amplifier strips between which the remaining read amplifier strips and the memory cell fields are arranged, wherein adjacent to at least one of the outer read amplifier strips, a reference circuit field is arranged, which has reference lines and reference circuit elements connected thereto, and wherein the reference lines are shorter than the bit lines of the memory cell fields.
摘要:
The invention relates to a first electrode that is provided with a holding area for holding probe molecules which can bind macro-molecular biopolymers. The first electrode and/or a second electrode is/are divided into a plurality of electrode segments that are electrically insulated from one another. The randomly selected electrode segments, independently from one another, can be electrically coupled in such a way that an effective electrode surface can be adjusted in the size thereof according to the selected electrode segments.
摘要:
The invention relates to a label identification system comprised of a transmitting-receiving unit and of identification labels on which the identification information is stored in the form of a digital identification information word. The provision of a circuit on the identification label in the form of a circuit arrangement, which is prefabricated using a polymer technique and on which the identification information is subsequently placed by the offset printing of conductor tracks, enables the provision of an identification label involving a minimal consumption of energy during inexpensive mass production. The bulk of the identification information processing is transferred to the transmitting-receiving unit.
摘要:
The invention relates to an electronic component that can be operated by means of an alternating voltage. Said component includes at least one input, at least one output and a pair of electronic sub-components with an identical function. The input(s) of the electronic component is/are coupled to a respective input of the electronic sub-components with an identical function and the output(s) of the electronic component is/are coupled to a respective output of said electronic sub-components. In addition, the electronic component is configured in such a way that at least one output only one output signal of the first sub-component of the pair of functionally identical electronic components can be picked up during a first half-wave of an alternating voltage, whereas only one output signal of the second sub-component of the pair of functionally identical electronic can be picked up during the second half-wave of the alternating voltage.