摘要:
A numerically controlled machine tool, and method for control thereof, to display virtual two-dimensional future positions to be adopted by a workpiece and by the machine tool in a pre-set predictive time window. The system and method calculate target coordinate values defining positions of the tool along axes of the machine tool on the basis of a machining program. While machining is in progress, a processor receives the calculated target coordinate values to generate and display image data on the basis of the target coordinate values and of stored mathematical models of the machine, of the workpiece, and of the tool.
摘要:
A process control monitoring system for a process control plant uses graphic trend symbols to assist in detecting and monitoring trends of process variables within the process control plant. A graphic display application within the process control monitoring system may implement and display each graphic trend symbol to graphically indicate or encapsulate current trend and value information of a process variable within the process control plant. The graphic display application may display the graphic trend symbol in a spatially realistic location within a graphical representation of the process control plant while maintaining the hierarchical structure or each hierarchical level of the process plant. The graphic display application may also include a zoom feature that enables a user to quickly drill down through tend data to obtain more information and to support problem identification and diagnosis tasks.
摘要:
A system and method for generating a behavior model for simulating an automation system, wherein signal flows between components of the automation system are simulated. The system comprises a CAD application for developing CAD drawings of the components of the automation system, where the CAD application comprises first modules for defining a geometric scope of application for the data interfaces of the components, second modules for defining at least one signal transmission prerequisite, which marks at least one relative position of two scopes of application relative to each other, at which signal transmission is possible between associated data interfaces, third modules for verifying the compatibility of the data interfaces at which the signal transmission prerequisite is met, and fourth modules for generating the behavior model such that a signal flow between the data interfaces at which the signal transmission prerequisite and compatibility are met is modeled in the simulation.
摘要:
Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
摘要:
A computer implemented method and computer usable program code for interacting with a system schematic. A system schematic having a plurality of components is graphically displayed. In response to receiving a selection of a control component, a state of the control component is altered. A set of effector components from the plurality of components are animated using a cause-and-effect relationship between the control component and the set of effector components are animated.
摘要:
Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
摘要:
Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
摘要:
A computer is connected to a system formed by combining a robot with a peripheral device (such as a welder). The computer receives robot mechanical unit motion position information supplied from a robot controller and command information to be outputted to the peripheral device, and displays motions of the robot mechanical unit and the peripheral device on its display screen in an animation form.
摘要:
A computer-implemented apparatus is provided for coordinating paint-related process steps of at least one paint-application facility, said paint-related process steps comprising at least one of data collecting, calculating, evaluating and reporting volatile organic content of paint and actual and projected paint and solvent usage from a painting process and solvent and volatile organic emission regulation data.
摘要:
A computer-implemented apparatus and method for coordinating paint-related process steps of at least one paint-related facility. The paint-related process steps exhibit paint-related characteristics. A data acquisition module is provided for acquiring paint characteristic data indicative of the paint-related characteristics. A paint process control data structure is provided for interrelating the acquired paint characteristic data with at least two of the paint-related process steps to produce interrelated paint process control data. A paint process control coordinator is connected to the data acquisition module for storing the acquired paint characteristic data in the paint process control data structure. A data display is connected to the paint process control data structure for remotely receiving and viewing the interrelated paint process control data.