Chip package with degassing holes
    2.
    发明授权
    Chip package with degassing holes 有权
    芯片封装带脱气孔

    公开(公告)号:US06225687B1

    公开(公告)日:2001-05-01

    申请号:US09388768

    申请日:1999-09-02

    申请人: Dustin P. Wood

    发明人: Dustin P. Wood

    IPC分类号: H01L2316

    摘要: A semiconductor device package includes multiple built-up layers of metal sandwiching non-conductive layers. The metal layers have grids of degassing holes arranged in rows and columns. The rows and columns are locatable via a first coordinate system. Signal traces are embedded within the non-conductive layers such that the signal traces are also sandwiched between the metal layers with degassing holes. The signal traces generally run at zero degrees, 45 degrees, and 90 degrees relative to a second coordinate system. The first coordinate system is rotated relative to the second coordinate system to lower impedance variations of different traces. Impedance variations decrease due to the decreased variation in the number of degassing holes passed over or under by a trace. The grid of degassing holes on one metal layer can be offset in two dimensions relative to the degassing holes on another layer.

    摘要翻译: 半导体器件封装包括金属夹层非导电层的多个堆积层。 金属层具有以排和列排列的脱气孔格栅。 行和列可通过第一个坐标系定位。 信号迹线嵌入在非导电层内,使得信号迹线也被夹在具有脱气孔的金属层之间。 信号迹线通常相对于第二坐标系以零度,45度和90度的速度运行。 第一坐标系相对于第二坐标系旋转以降低不同轨迹的阻抗变化。 阻抗变化由于通过痕迹通过或减少的脱气孔的数量的变化减小而减小。 一个金属层上的脱气孔的网格可以相对于另一层上的脱气孔在两个维度上偏移。