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公开(公告)号：US11340106B2
公开(公告)日：2022-05-24
申请号：US16944921
申请日：2019-01-14
IPC分类号： G01F23/284 , G01B15/08 , G01S13/86 , G01S13/89
摘要： Disclosed is a fill-level measuring device for determining the fill level in a container. The device comprises: a radar module for determining a distance to the surface of the filling material; a 3D camera for capturing at least one region of the surface of the filling material; and an evaluation circuit that is designed to measure a maximum distance and a minimum distance from the captured distance values and to determine the fill level on the basis of the distance, providing that the distance is smaller than the maximum distance value and greater than the minimum distance value. As a result of the redundancy or the verification provided by the 3D camera of the distance calculated by the radar module, the fill-level measuring device according to the invention is therefore more reliable with regard to the miscalculation of an incorrect fill level.
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公开(公告)号：US20220107176A1
公开(公告)日：2022-04-07
申请号：US17487896
申请日：2021-09-28
发明人： Yan WANG , Jian ZHANG , Zhiwen KANG , Yixiang WANG
摘要： An inspection apparatus for adjusting a working height for a substrate for multiple target heights is disclosed. The inspection apparatus includes a radiation source configured to provide a radiation beam and a beam splitter configured to split the radiation beam into multiple beamlets that each reflect off a substrate. Each beamlet contains light of multiple wavelengths. The inspection apparatus includes multiple light reflecting components, wherein each light reflecting component is associated with one of the beamlets reflecting off the substrate and is configured to support a different target height for the substrate by detecting a height or a levelness of the substrate based on the beamlet reflecting off the substrate.
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公开(公告)号：US20190186658A1
公开(公告)日：2019-06-20
申请号：US15844959
申请日：2017-12-18
申请人： Chevron U.S.A. Inc.
IPC分类号： F16L13/10 , F16L13/11 , F16L9/12 , G01B15/08 , G01N23/083 , C09J175/04 , C09J163/00 , C09J133/08 , C09J11/04 , C08K3/08 , C08K3/16 , C08K3/22 , C08K3/28 , C08K3/30
CPC分类号： F16L13/103 , C08K3/08 , C08K3/16 , C08K3/22 , C08K3/28 , C08K3/30 , C08K2003/0856 , C08K2003/2265 , C08K2003/3009 , C08K2003/3045 , C09J11/04 , C09J133/08 , C09J163/00 , C09J175/04 , F16L9/12 , F16L13/11 , G01B15/08 , G01N23/083
摘要： Disclosed are joints and methods for forming joints of nonmetallic components such as piping components made from a nonmetallic composite material. The components are joined by an adhesive containing an x-ray absorbing additive for providing a contrasting signal in x-ray inspection of the joint. The joints can be nondestructively tested by positioning the joints relative to an x-ray source and an x-ray detector. The joints and the adhesive therein are then exposed to x-ray radiation from the source of x-ray radiation. The x-ray radiation, having passed from the x-ray source to the x-ray detector, is detected over an area and an x-ray image of the x-ray radiation detected is created. The x-ray image is then read to identify defects in the joint.
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公开(公告)号：US08923478B2
公开(公告)日：2014-12-30
申请号：US13501874
申请日：2010-10-12
申请人： Stephen Knight , Stephen G. Drake
发明人： Stephen Knight , Stephen G. Drake
CPC分类号： G01N23/18 , G01N2223/628
摘要： An apparatus is provided for x-ray inspection of a pipeline girth weld. This comprises a directional x-ray source 5 which is insertable into a pipeline section and is rotatable within the pipeline. Means are provided to align the directional x-ray source with an external x-ray detector such that both may be rotated through 360 degrees substantially coaxially with the pipeline section. Means for sampling the data detected by the x-ray detector are provided so that it may be further analyzed.
摘要翻译： 提供了一种用于管道环形焊缝的X射线检查的装置。 这包括可插入到管道部分中并且可在管道内旋转的定向x射线源5。 提供了用于使定向x射线源与外部X射线检测器对准的装置，使得两者可以与管线部分大致同轴旋转360度。 提供了用于对由X射线检测器检测到的数据进行采样的装置，以便进一步分析。
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公开(公告)号：US08878717B2
公开(公告)日：2014-11-04
申请号：US13126061
申请日：2010-09-15
摘要： A projection detecting apparatus according to the present invention is that for detecting a projection on a surface of a running metal object, and includes a transmission antenna for radiating electromagnetic waves; a reception antenna for receiving reflected electromagnetic waves; and a transmission and reception signal processing section for processing a transmission signal and a reception signal. The transmission antenna and the reception antenna have unidirectionality and the transmission antenna and the reception antenna are installed in such a way that the reception antenna does not catch electromagnetic waves which have been radiated by the transmission antenna and reflected on the surface of the metal object and the reception antenna catches electromagnetic waves alone which have been radiated by the transmission antenna and reflected on the projection.
摘要翻译： 根据本发明的投影检测装置是用于检测行进的金属物体的表面上的突起，并且包括用于辐射电磁波的发射天线; 用于接收反射电磁波的接收天线; 以及发送和接收信号处理部分，用于处理发送信号和接收信号。 发送天线和接收天线具有单方向性，发送天线和接收天线的安装方式使得接收天线不会捕获被发送天线辐射并在金属物体的表面上反射的电磁波， 接收天线捕获由发射天线辐射并在投影上反射的单独的电磁波。
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公开(公告)号：US20080231865A1
公开(公告)日：2008-09-25
申请号：US12053497
申请日：2008-03-21
申请人： Peter Schwarz , Konrad Lex
发明人： Peter Schwarz , Konrad Lex
CPC分类号： G01N21/4738 , G01J3/462 , G01J2003/466 , G01N21/57 , G01N21/8806
摘要： The invention relates to a method for the quantitative determination of surface properties, wherein a spatially resolved image of a surface to be analysed, which contains a large number of measured values, is recorded. In a first method step, the measured values are analysed in order to determine those surface areas which have a specific physical property. A result value of this physical property is then determined, wherein this result value is characteristic of the values of the physical property of all those surface areas of the image determined by analysing the image. According to the invention, in addition to the result value, a further value (B) characteristic of the surface is determined and this characteristic value is displayed together with the result value (I).
摘要翻译： 本发明涉及一种用于定量测定表面性质的方法，其中记录了包含大量测量值的待分析表面的空间分辨图像。 在第一种方法步骤中，分析测量值以确定具有特定物理性质的那些表面积。 然后确定该物理性质的结果值，其中该结果值是通过分析图像确定的图像的所有这些表面积的物理性质的值的特征。 根据本发明，除了结果值之外，还确定表面的另外的值（B）特性，并且将该特征值与结果值（I）一起显示。
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7.发明申请Apparatus and method for image optimization of samples in a scanning electron microscope 失效扫描电子显微镜中样品图像优化的装置和方法公开(公告)号：US20050098724A1
公开(公告)日：2005-05-12
申请号：US10985144
申请日：2004-11-10
申请人： Neal Sullivan
发明人： Neal Sullivan
CPC分类号： H01J37/28 , H01J2237/2817 , H01J2237/2826
摘要： A system and method for identifying an optimal landing energy of a probe current in a scanning electron microscope system. A probe current having a known landing energy is directed at a sample for producing a signal electron beam. The current of the signal electron beam is measured by directing the beam to a current detector for calculating a current yield, which is the ratio of the signal current to the probe current. The landing energy can then be changed for subsequent measurements of the signal current to identify the landing energy which produces a desired current yield. Once identified, the landing energy value can be used to produce a signal electron beam directed towards an imaging detector to generate topographic images of samples.
摘要翻译： 用于在扫描电子显微镜系统中识别探针电流的最佳着陆能量的系统和方法。 具有已知着陆能量的探针电流被引导到用于产生信号电子束的样本。 通过将光束引导到电流检测器来计算电流产量，即信号电流与探针电流的比值来测量信号电子束的电流。 然后可以改变着陆能量以用于信号电流的随后测量，以识别产生期望电流产量的着陆能量。 一旦被识别，着陆能量值可用于产生指向成像检测器的信号电子束，以产生样本的地形图像。
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公开(公告)号：US4670652A
公开(公告)日：1987-06-02
申请号：US737478
申请日：1985-05-24
CPC分类号： H01J37/28
摘要： A charged particle beam microprobe apparatus capable of accurately determining the three-dimensional structure of a surface is disclosed in which a detection system including at least a pair of detectors disposed symmetrically with respect to the optical axis of an charged particle beam generating instrument is used for obtaining an image signal from a surface scanned with a charged particle beam, the image signal obtained by difference detection in the detection system is compared with a pair of variable reference levels opposite in polarity to each other, to be converted into positive and negative rectangular wave signals, and information on whether the scanned surface slopes upward or downward when viewed from the detection system and information on the gradient of the scanned surface are obtained from the polarity and pulse width of each of the positive and negative rectangular wave signals, respectively, to determine the three-dimensional structure of the scanned surface. That is, the charged particle beam apparatus does not utilize a phenomenon that the coefficient of backscattered electrons is proportional to the angle of slope of a primary beam impinging surface, and hence can use secondary electron suitable for forming a high resolution scanned image.
摘要翻译： 公开了一种能够精确地确定表面的三维结构的带电粒子束微探针装置，其中使用包括至少一对相对于带电粒子束产生装置的光轴对称设置的检测器的检测系统 从用带电粒子束扫描的表面获得图像信号，将通过检测系统中的差分检测获得的图像信号与彼此极性相反的一对可变参考电平进行比较，以被转换为正和负矩形波 信号，以及关于从检测系统观察扫描表面是向上还是向下倾斜的信息以及关于扫描表面的梯度的信息的信息分别从正和负矩形波信号的极性和脉冲宽度获得到 确定扫描表面的三维结构。 也就是说，带电粒子束装置没有利用背散射电子的系数与主光束入射表面的倾斜角成比例的现象，因此可以使用适于形成高分辨率扫描图像的二次电子。
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公开(公告)号：US12072181B2
公开(公告)日：2024-08-27
申请号：US17487896
申请日：2021-09-28
发明人： Yan Wang , Jian Zhang , Zhiwen Kang , Yixiang Wang
CPC分类号： G01B15/08 , H01J37/20 , H01J37/21 , H01J37/222 , H01J37/28 , H01J2237/20235 , H01J2237/2814
摘要： An inspection apparatus for adjusting a working height for a substrate for multiple target heights is disclosed. The inspection apparatus includes a radiation source configured to provide a radiation beam and a beam splitter configured to split the radiation beam into multiple beamlets that each reflect off a substrate. Each beamlet contains light of multiple wavelengths. The inspection apparatus includes multiple light reflecting components, wherein each light reflecting component is associated with one of the beamlets reflecting off the substrate and is configured to support a different target height for the substrate by detecting a height or a levelness of the substrate based on the beamlet reflecting off the substrate.
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公开(公告)号：US12044632B2
公开(公告)日：2024-07-23
申请号：US17744523
申请日：2022-05-13
IPC分类号： G01N23/046 , F01D21/00 , G01B15/08 , G01N23/06 , G08B21/18
CPC分类号： G01N23/046 , F01D21/003 , G01B15/08 , G01N23/06 , G08B21/182 , F05D2260/83 , G01N2223/04 , G01N2223/419
摘要： A method can comprise: scanning a tip of an airfoil of a bladed rotor, the tip including a coating disposed thereon, the coating comprising a metal plating and a plurality of protrusions, each protrusion in the plurality of protrusions extending from the metal plating; comparing a coating parameter of the coating to a coating parameter threshold based on scanner data from the scanning; and determining whether the coating maintains sufficient coverage of the tip of the airfoil based on the comparing.
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