Electrical test probe having shaped contacts
    44.
    发明公开
    Electrical test probe having shaped contacts 失效
    与形状联系的电气连接

    公开(公告)号:EP0529577A3

    公开(公告)日:1993-08-04

    申请号:EP92114444.0

    申请日:1992-08-25

    Abstract: Shaped contacts (40, 42) for interconnecting circuits or for use in an integrated circuit test probe are electroplated as integral parts of circuit traces (34) upon a stainless steel mandrel (10). A shaped, hardened steel indentation tool makes indentations (24a, 24b) of predetermined shape in the surface of the mandrel (10), which is provided with a pattern of dielectric, such as Teflon (12), or photoresist. Areas of the steel mandrel, including the indentations (24a, 24b), are electroplated with a pattern of conductive material (34, 36, 38), and a dielectric substrate is laminated to the conductive material. The circuit features formed by the indentations define raised contacts of a conical or pyramidal shape, having free ends with a small area that allows higher pressures to be applied to a surface against which the contacts are pressed. This enables the contacts to penetrate foreign materials, such as oxides, that may form on the surface of the pads, to which the contacts are to be connected to ensure a good contact without any need for wiping action.

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