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    SPECTROPHOTOMÈTRE HYPERSPECTRAL LARGE BANDE POUR ANALYSER UN OBJET DANS LE DOMAINE FLUORESCENT
    61.
    发明公开
    SPECTROPHOTOMÈTRE HYPERSPECTRAL LARGE BANDE POUR ANALYSER UN OBJET DANS LE DOMAINE FLUORESCENT 审中-公开
    宽带光谱分光光度计分析对象在荧光区域

    公开(公告)号：EP3069113A1

    公开(公告)日：2016-09-21

    申请号：EP14796056.1

    申请日：2014-11-07

    Applicant: Centre National d'Etudes Spatiales

    Inventor： BOURCIER, Frédéric

    IPC: G01J3/02 ,  G01J3/14 ,  G01J3/28

    CPC classification number: G01J3/2823 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0243 ,  G01J3/14

    Abstract: The invention relates to a wideband hyperspectral spectrophotometer suitable for analysing an object (0), comprising: an illuminating assembly (S) comprising at least one source (Si) for emitting a light beam having a wavelength belonging to the ultra-violet domain in the direction of an object (0) to be analysed, said assembly (S) furthermore being configured to scan line by line the object (0) to be analysed by means of the emitting source (Si); a spherical focusing mirror (M2); a first redirecting mirror (M1) comprising a front face (M11) oriented toward the spherical focusing mirror (M2), said first face (M11) having a metal coating, the first mirror (M1) furthermore having a back face (M12) opposite the first front face (M11), said back face (M12) also comprising a metal coating, said first focusing mirror (M1) comprising in its centre a slit (F) configured to let pass a line of the beam emitted by the object (0); the first redirecting mirror (M1), the spherical focusing mirror (M2) and the slit (F) being arranged so that a fluorescent beam emitted by the object (0) after absorption by the object of the ultraviolet beam originating from the illuminating assembly is reflected from the first face (M11) of the first mirror (M1) toward the focusing mirror (M2), said focusing mirror (M2) then reflecting the beam thus focused toward the slit (F).

    MONITORABLE SPECTROMETRIC MEASUREMENT DEVICE
    66.
    发明公开
    MONITORABLE SPECTROMETRIC MEASUREMENT DEVICE 审中-公开
    ÜBERWACHBARESPEKTRALPHOTOMETRIE-VORRICHTUNG

    公开(公告)号：EP2634559A1

    公开(公告)日：2013-09-04

    申请号：EP11836387.8

    申请日：2011-10-27

    Applicant: Mitaka Kohki Co., Ltd.

    Inventor： YAMAZAKI, Toshio

    IPC: G01N21/27 ,  G01J3/02 ,  G02B5/04

    CPC classification number: G01J3/0256 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0237 ,  G01J3/0243 ,  G01J3/0264 ,  G01J3/04 ,  G01J3/2823 ,  G01N21/31 ,  G01N2021/1793 ,  G02B27/1066 ,  G02B27/143

    Abstract: A spectroscopic measuring apparatus with monitoring capability includes a first optical path L1 that extends from a measuring object Sm through an optical system 30 and a slit 23 of a slit-mirror block 21 to a spectroscope main body 25 and a second optical path L2 that extends from the measuring object Sm through the optical system 30 and a mirror face 22 of the slit-mirror block 21 to a two-dimensional photographing unit 40. The slit 23 and spectroscope main body 25 are integrated into a spectroscopic unit 20.

    Abstract translation: 具有监测能力的光谱测量装置包括从测量对象Sm通过光学系统30延伸的第一光路L1和狭缝镜块21的狭缝23到分光计主体25和延伸的第二光路L2 从测量对象Sm通过光学系统30和狭缝镜块21的镜面22到二维拍摄单元40.狭缝23和分光镜主体25被集成到分光单元20中。

    Terahertz wave detection device, terahertz wavelength filter, imaging device, and measurement device
    67.
    发明公开
    Terahertz wave detection device, terahertz wavelength filter, imaging device, and measurement device 审中-公开
    太赫兹 - 维纳福森弗罗里奇特，太赫兹维伦滤波器，Abbildungsvorrichtung und Messvorrichtung

    公开(公告)号：EP2503310A2

    公开(公告)日：2012-09-26

    申请号：EP12160578.6

    申请日：2012-03-21

    Applicant: Seiko Epson Corporation

    Inventor： Tomioka, Hiroto

    IPC: G01J3/42 ,  G01J5/04 ,  G01J5/08 ,  G01J3/02

    CPC classification number: G01J5/085 ,  G01J3/0243 ,  G01J3/42 ,  G01J5/046 ,  G01J5/0831 ,  G01J5/0862 ,  H01P1/2005

    Abstract: A terahertz wave detection device includes a wavelength filter transmitting terahertz waves having a predetermined wavelength, and a detection portion detecting the terahertz waves having the predetermined wavelength that have passed through the wavelength filter by converting the terahertz waves into heat, wherein the wavelength filter includes a metal layer having a plurality of holes communicating with an incident surface onto which the terahertz waves are incident and an emission surface from which the terahertz waves having the predetermined wavelength are emitted, and a dielectric portion filling in the plurality of holes and made of a dielectric, wherein the plurality of holes are formed with a predetermined pitch along a direction that is perpendicular to a normal line of the incident surface.

    Abstract translation: 太赫兹波检测装置包括：发射具有预定波长的太赫兹波的波长滤波器;以及检测部分，通过将太赫兹波转换成热量来检测已经通过波长滤波器的具有预定波长的太赫兹波，其中波长滤波器包括 金属层，具有与入射到其上的入射面连通的多个孔，并且发射出具有预定波长的太赫兹波的发射面;以及填充在多个孔中并由电介质构成的电介质部分 ，其中所述多个孔沿着垂直于所述入射表面的法线的方向以预定间距形成。

    SPECTRAL MODULE AND METHOD FOR MANUFACTURING SPECTRAL MODULE
    69.
    发明公开
    SPECTRAL MODULE AND METHOD FOR MANUFACTURING SPECTRAL MODULE 审中-公开
    SPEKTRALMODUL UND VERFAHREN ZUR HERSTELLUNG EINES SPEKTRALMODULS

    公开(公告)号：EP2287577A1

    公开(公告)日：2011-02-23

    申请号：EP09746529.8

    申请日：2009-05-07

    Applicant: Hamamatsu Photonics K.K.

    Inventor： SHIBAYAMA Katsumi ,  KASAHARA Takashi ,  YOSHIDA Anna

    IPC: G01J3/18 ,  G02B7/00

    CPC classification number: G01J3/0205 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0243 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/04 ,  G01J3/18 ,  G01J3/2803 ,  G02B7/027 ,  H01L31/18

    Abstract: The present invention provides a highly reliable spectral module. When light L1 proceeding to a spectroscopic unit (4) passes through a light transmitting hole (50) in the spectral module (1) in accordance with the present invention, only the light having passed through a light entrance side unit (51) formed such as to become narrower toward a substrate (2) and entered a light exit side unit (52) formed such as to oppose a bottom face (5 1b) of the light entrance side unit (51) is emitted from a light exit opening (52a). Therefore, stray light M incident on a side face (51c) or bottom face (51b) of the light entrance side unit (51) is reflected to the side opposite to the light exit side unit (52) and thus is inhibited from entering the light exit side unit (52). Therefore, the reliability of the spectral module (1) can be improved.

    Abstract translation: 本发明提供了一种高度可靠的光谱模块。 当进入分光单元（4）的光L1通过本发明的光谱模块（1）中的透光孔（50）时，仅通过形成光入射侧单元（51）的光 为了朝向基板（2）变窄并且进入与光入射侧单元（51）的底面（51b）相对形成的光出射侧单元（52）从光出射开口（52a）发射 ）。 因此，入射在光入射侧单元（51）的侧面（51c）或底面（51b）上的杂散光M被反射到与光出射单元（52）相反的一侧，因此被禁止进入 光出射侧单元（52）。 因此，可以提高光谱模块（1）的可靠性。

    SPECTRAL MODULE
    70.
    发明公开
    SPECTRAL MODULE 审中-公开
    光谱模块

    公开(公告)号：EP2287574A1

    公开(公告)日：2011-02-23

    申请号：EP09746522.3

    申请日：2009-05-07

    Applicant: Hamamatsu Photonics K.K.

    Inventor： SHIBAYAMA Katsumi ,  YOKINO Takafumi ,  HIROSE Masaki ,  ITO Masashi

    IPC: G01J3/18 ,  G02B7/00

    CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0243 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/0286 ,  G01J3/0297 ,  G01J2003/1213 ,  G02B5/1814 ,  G02B5/1852 ,  G02B5/1861 ,  G02B7/025 ,  G02B27/4244

    Abstract: A spectral module 1 comprises a substrate 2 for transmitting light L1 incident thereon from a front face 2a, a lens unit 3 for transmitting the light L1 incident on the substrate 2, a spectroscopic unit 4 for reflecting and spectrally resolving the light L1 incident on the lens unit 3, and a photodetector 5 for detecting light L2 reflected by the spectroscopic unit 4. The substrate 2 is provided with a recess 19 having a predetermined positional relationship with alignment marks 12a, 12b and the like serving as a reference unit for positioning the photodetector 5, while the lens unit 3 is mated with the recess 19. The spectral module 1 achieves passive alignment between the spectroscopic unit 4 and photodetector 5 when the lens unit 3 is simply mated with the recess 19.

    Abstract translation: 光谱模块1包括用于透射从前表面2a入射到其上的光L1的基板2，用于透射入射到基板2上的光L1的透镜单元3，用于反射和光谱分辨入射到基板2上的光L1的分光单元4 透镜单元3以及用于检测由分光单元4反射的光L2的光检测器5.基板2设置有与对准标记12a，12b等具有预定位置关系的凹陷19，该对准标记12a，12b等用作用于定位 同时透镜单元3与凹部19配合。当透镜单元3简单地与凹部19配合时，光谱模块1实现光谱单元4和光电探测器5之间的被动对准。

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