摘要:
The invention relates to a mass spectrometer (1) for the mass spectrometric examination of gas mixtures (2), comprising: an ionizing apparatus (12), and an ion trap (10) for the storage and the mass spectrometric examination of the gas mixture (2). In one aspect of the invention, the ionizing apparatus (12) is designed to feed ions (13a) and/or metastable particles (13b) of an ionization gas (13) and/or electrons (20a) to the ion trap (10) for the ionization of the gas mixture (2) to be examined, and the mass spectrometer (1) is designed to determine, before the examination of the gas mixture (2), the number of ions (13a) and/or metastable particles (13b) of the ionization gas (13) that are present in the ion trap (10) and/or the number of ions (14a) of a residual gas (14), which residual gas is present in the ion trap (10). The invention further relates to the use of such a mass spectrometer (1) and to a method for the mass spectrometric examination of a gas mixture (2).
摘要:
The invention relates to an apparatus (1) for surface processing on a substrate (2), for example for applying a coating (14) to the substrate (2) or for removing a coating (14) from the substrate (2), wherein the apparatus (1) comprises: a chamber (5) enclosing an interior (4) and serving for arranging the substrate (2) for the surface processing, a process gas analyser (13a, 13b) for detecting at least one gaseous constituent of a residual gas atmosphere formed in the interior (4), wherein the process gas analyser (13a, 13b) comprises an ion trap (18) for storing the gaseous constituent to be detected, and an ionization device (17) for ionizing the gaseous constituent. The invention also relates to an associated method for monitoring surface processing on a substrate (2).
摘要:
The invention relates to a method for mass spectrometric examination of a gas mixture (2), comprising the following method steps: parallel or serial ionization of the gas mixture (2) to be examined by activating of at least two ionization devices (9a, 9b, 9c) operating using different ionization procedures, and/or ionizing of the gas mixture (2) in a detector (10), to which the gas mixture (2) and ions and/or metastable particles (29) of an ionization gas (30), which are produced by an ionization device (9), are fed, and detecting of the ionized gas mixture (2) in the detector (10) for the mass spectrometric examination thereof. The invention also relates to a mass spectrometer (21 ) for mass spectrometric examination of gas mixtures (2), comprising: an ionization unit (22) for ionizing the gas mixture (2), and a detector (10) for detecting the ionized gas mixture (2). The ionization unit (22) comprises at least two ionization devices (9a, 9b, 9c), arranged in parallel or in series, for ionizing the gas mixture (2) by means of different ionization procedures, wherein the ionization devices (9a, 9b, 9c) alternatively can be activated individually or together, and/or the ionization unit (22) has an ionization device (9) configured to feed ions and/or metastable particles (29) of an ionization gas (30) to the detector (10) in order to ionize the gas mixture (2) in the detector (10).
摘要:
An ionization device includes: a plasma generating device for generating metastable particles and/or ions of an ionization gas in a primary plasma region; a field generating device for generating a glow discharge in a secondary plasma region; an inlet for supplying a gas to be ionized into the secondary plasma region; and a further inlet for supplying the metastable particles and/or the ions of the ionization gas into the secondary plasma region. A mass spectrometer includes such an ionization device and a detector downstream of the outlet of the ionization device for the mass-spectrometric analysis of the ionized gas.
摘要:
The invention relates to a method for examining a gas (4) by mass spectrometry, comprising: ionizing the gas (4) for producing ions (4a, 4b), and storing, exciting and detecting at least some of the produced ions (4a, 4b) in an FT ion trap (2). In the method, producing and storing the ions (4a, 4b) in the FT ion trap (2) and/or exciting the ions (4a, 4b) prior to the detection of the ions (4a, 4b) in the FT ion trap (2) comprises at least one selective IFT excitation, in particular a SWIFT excitation (10), which is dependent on the mass-to-charge ratio (m/z) of the ions (4a, 4b). The invention further relates to a mass spectrometer (1).
摘要:
The invention relates to a method for connecting two components (1, 2) having different stiffnesses (E1, E2), comprising: bonding a plate-shaped body (3) onto the component (1) having greater stiffness (E1), the bonding being preferably performed using a joining agent, in particular an adhesive, correcting deformations produced by the bonding on the plate-shaped body (3), and connecting the component (2) having the lower stiffness (E2) to the plate- shaped body (3), in particular by wringing, by anodic bonding or by fusion bonding. The invention also relates to a composite structure (5), which has been produced according to the method and which can serve, for example, as a holding device for a wafer (6). Moreover, the first component (1) can serve as a carrier for the second component (2), e.g. if the latter is embodied as an EUV mirror.