Abstract:
An anisotropic electrically conductive film comprising a base film in the form of a porous film made of synthetic resin and having an electric insulation property, and an electrically conductive metal adhered to a resin section of porous construction in such a manner as to penetrate from a first surface to a second surface at a plurality of places on the base film, wherein electrically conductive sections which can be made electrically conductivity in the direction of the film thickness are independently provided; and a method of producing the same.
Abstract:
A method of manufacturing a drilled porous resin base material with conductive drilled inner wall surfaces, comprising a step 1 for penetrating liquid or solution into the porous structure of the porous resin base material, a step 2 for forming solid matter from the penetrated liquid or solution, a step 3 for forming a plurality of drilled holes passed from the first surface to the second surface of the porous resin base material having the solid matter in the porous structure, and a step 4 for melting or dissolving the solid matter and removing it from the porous structure. The method also comprises the step for selectively adhering catalysts to only the inner wall surfaces of the drilled holes and adhering a conductive metal to the inner wall surfaces.
Abstract:
A contact probe comprises a tip part to be brought into contact with a surface to be measured, a support part for support and electrical connection, and a spring part for connecting the tip part to the support part. The radius of curvature of the corner on the backside of the tip part in scrubbing while being in press contact is smaller than the corner on the front side. In scrubbing, the insulating film of the surface to be measured can be sufficiently removed while ensuring the electrical connection. Further, the adhering shavings can be reduced when the probe is moved off the surface, and the scratches on the surface can be also reduced. A contact probe of the invention has a predetermined projection and a bottom portion in a recess of the tip part. The projection breaks the insulating film of the curved surface to be measured to ensure the electrical contact. The bottom portion of the recess is brought into contact with the object to be measured, thereby preventing excessive bite of the projection.
Abstract:
A contact probe produced by forming a resin mold having a hole portion on a conductive substrate and burying the hole portion with a metal by electrocasting, the metal containing a cobalt-tungsten alloy. Or, a cobalt-molybdenum alloy may be used in place of a cobalt-tungsten alloy. Or, a contact probe is formed from nickel and cobalt or copper and a coating of a cobalt-tungsten alloy or a cobalt-molybdenum alloy is formed thereon to increase a wear resistance. A nickel-molybdenum alloy may be used in place of a cobalt-tungsten alloy and a cobalt-molybdenum alloy.
Abstract:
A method for manufacturing a metal microstructure 1 comprising a resin mold 13. For setting a mild manufacturing condition with little damage of the resin mold 13, and for mass-producing a high- precision metal microstructure 1 by uniform casting, this method is characterized by having the step of forming a resin mold laminate by fixing on a conductive substrate 11 a resin mold 13 having a vacancy penetrating in the thickness direction via a photosensitive polymer 12 the chemical composition of which is varied by an electron ray, ultraviolet ray, or a visible ray, the step of exposing the resin type laminate 2 to the electron ray, ultraviolet ray, or visible ray, the step of removing a photosensitized polymer 12c present in the vacancy of the resin mold 13, and the step of filling the vacant section of the resin type laminate 2 with a metal 14 by casting.
Abstract:
A method of manufacturing a contact probe, comprising an electroforming process for forming a metal layer (526) by performing an electroforming so as to fill clearances in a resist film (522) by using the resist film (522)as a pattern frame having a shape matching the contact probe disposed on a substrate (521), a tip working process for sharpening the area of the metal layer (526) forming the tip end part of the contact probe by diagonally cutting out the area, and a retrieval process for retrieving only the metal layer (526) from the pattern frame.