Abstract:
A system can include a device under test (DUT) having a DUT voltage, a cable connected to the DUT, the cable having a cable inductance, and a power supply configured as a current source to provide a wide bandwidth voltage source to the DUT, wherein the DUT voltage is independent of the cable inductance.
Abstract:
A method for calibrating a test instrument having an initial output voltage level and an open output relay can include programming the test instrument for a certain current level, starting a timer, and stopping the timer (responsive to the test instrument entering compliance) to determine a time interval. The method can also include determining whether the time interval is within a desired range.
Abstract:
Embodiments of the present invention provide improved techniques and devices for reducing transformer commutation distortion caused by large load currents. Traditional power supplies which have two or more phases typically commutate a transformer during the end of each phase. When the load current is large, energy stored in the transformer's leakage inductance can cause undesirable effects during commutation. Embodiments of the present invention reduce these effects by lowering the voltage across the primary side of the transformer prior to commutation. In one embodiment, a capacitor is added to the primary side of the transformer. A switch directs current through the capacitor prior to commutation, allowing the capacitor to absorb the transformer's leakage inductance energy and lower the primary side voltage. Other suitable components, such as resistors, diodes, transistors, or additional transformer windings, may also be used to reduce the primary-side voltage prior to commutation.
Abstract:
A circuit structured to drive an isolated high speed voltage metal-oxide-semiconductor field-effect transistor (MOSFET) switch, including a first MOSFET and a second MOSFET configured to operate as a switch, a capacitor, a charging component in parallel with the capacitor, a first switch in series with the charging component, and a second switch in parallel with the charging component and the capacitor. The stored voltage in the capacitor is sent to the gates of the first MOSFET and the second MOSFET when a second switch is open and a first switch is closed.
Abstract:
A connection interface for connecting one or more devices under test (DUTs) to one or more remote test and measurement instruments includes a device-under-test connector for connecting a DUT to the interface, a host-instrument connector for connecting the interface to a host test and measurement instrument, and an electrical path between the device-under-test connector and the host-instrument connector. The connection interface also includes a display that has a first portion visually associated with the device-under-test connector and configured to display an identifier for a particular connection point on the DUT. In some embodiments, the first portion of the display is configured to display measurement data from the particular connection point on the DUT. In some embodiments, the display has a second portion that is configured to display information related to the host test and measurement instrument, or to display a name for a particular measurement of the DUT.
Abstract:
A switching power supply can include multiple power MOSFETs that receive an initial gate drive waveform comprising a fast slew rate region having a negative slope and a slow slew rate region also having a negative slope. The MOSFETs can turn off during the slow slew rate region of the initial gate drive waveform.
Abstract:
A method for producing sampled data, which as the requested sampling period is increased, each sample is the average of an increasing number of ADC samples such that a maximum number of ADC samples are evenly space across the sample period. The method can include choosing one of multiple ADC with varying speed versus resolution capabilities to further increase the quality of the sampled data as the sampling period increases.
Abstract:
A device with low dielectric absorption includes a printed circuit board (PCB), a component connection area including a first conductor layered on a top surface of the component connection area and a second conductor layered on a bottom surface of the component connection area, an aperture surrounding the component connection area, a low-leakage component connecting the component connection area to the PCB across the aperture, and a guard composed of a third conductor at least substantially surrounding the aperture on a top surface of the PCB and a fourth conductor at least substantially surrounding the aperture on a bottom surface of the PCB.
Abstract:
A circuit can include operational amplifier having a first input, a second input, and an output, first and second resistors in series between the output of the op-amp and a ground, and multiple switches configurable to toggle the circuit between a positive phase and a negative phase.
Abstract:
An isolated DC-to-DC switching power supply includes an isolation transformer having a magnetic core, a first winding around the magnetic core, a first winding-shield around the magnetic core, a second winding-shield within the first winding-shield, and a second winding within the second winding-shield. There is no direct coupling between the first winding and the second winding since the second winding is enclosed within the second winding-shield and the second winding-shield is enclosed within the first winding-shield.