Abstract:
Methods, apparatuses, and various apparatus components, such as base plates, lipseals, and contact ring assemblies are provided for reducing contamination of the contact area in the apparatuses. Contamination may happen during removal of semiconductor wafers from apparatuses after the electroplating process. In certain embodiments, a base plate with a hydrophobic coating, such as polyamide-imide (PAI) and sometimes polytetrafluoroethylene (PTFE), are used. Further, contact tips of the contact ring assembly may be positioned further away from the sealing lip of the lipseal. In certain embodiments, a portion of the contact ring assembly and/or the lipseal also include hydrophobic coatings.
Abstract:
Methods, apparatuses, and various apparatus components, such as base plates, lipseals, and contact ring assemblies are provided for reducing contamination of the contact area in the apparatuses. Contamination may happen during removal of semiconductor wafers from apparatuses after the electroplating process. In certain embodiments, a base plate with a hydrophobic coating, such as polyamide-imide (PAI) and sometimes polytetrafluoroethylene (PTFE), are used. Further, contact tips of the contact ring assembly may be positioned further away from the sealing lip of the lipseal. In certain embodiments, a portion of the contact ring assembly and/or the lipseal also include hydrophobic coatings.
Abstract:
A test support program to effectively and reliably check performance of functions which operate with other unspecified servers. A pair of a request message and a response message is stored as a message log. When a processing function based on a program under development being checked outputs a test request message, a computer selects a message log appropriate to the test request message as a template message under preset selection rules. The computer creates a test response message by editing the response message of the selected template message under preset editing rules. Then the computer sends the created test response message as a response to the test request message.
Abstract:
Methods, apparatuses, and various apparatus components, such as base plates, lipseals, and contact ring assemblies are provided for reducing contamination of the contact area in the apparatuses. Contamination may happen during removal of semiconductor wafers from apparatuses after the electroplating process. In certain embodiments, a base plate with a hydrophobic coating, such as polyamide-imide (PAI) and sometimes polytetrafluoroethylene (PTFE), are used. Further, contact tips of the contact ring assembly may be positioned further away from the sealing lip of the lipseal. In certain embodiments, a portion of the contact ring assembly and/or the lipseal also include hydrophobic coatings.
Abstract:
The present invention provides improved methods and devices for electroplating copper on a wafer. Some implementations of the present invention involve the pre-treatment of the wafer with a solution containing accelerator molecules. Preferably, the bath into which the wafer is subsequently placed for electroplating has a reduced concentration of accelerator molecules. The pre-treatment causes a reduction in roughness of the electroplated copper surface, particularly during the initial phases of copper growth.
Abstract:
An electroplating solution contains a wetting agent in addition to a suppressor and an accelerator. In some embodiments, the solution has a cloud point temperature greater than 35° C. to avoid precipitation of wetting agent or other solute out of the plating solution. In some embodiments, the wetting agent decreases the air-liquid surface tension of the electroplating solution to 60 dyne/cm2 or less to increase the wetting ability of the solution with a substrate surface. In some embodiments of a method for plating metal onto substrate surface, the electroplating solution has a measured contact angle with the substrate surface less than 60 degrees.
Abstract:
A disk playback apparatus designed such that the linear velocity of the disk is stabilized during a short period corresponding to one to several revolutions of the disk and occurrence therein of vibration and noise is suppressed is disclosed. The apparatus is characterized in that the revolving axis of the turntable on which the disk is mounted is driven by a low-torque spindle motor and the wheel effect of the revolving axis or the spindle motor is made larger.
Abstract:
A liquid detersive bleaching composition which comprises 3 to 10 wt.% of sodium hypochlorite (in terms of the amount of available chlorine), 0.5 to 3 wt.% of caustic alkali, 0.3 to 7 wt.% of polyoxyethylene alkylphenyl ether sulfate (a) having the formula (I) and 0.1 to 5 wt.% of polyoxyethylene alkylphenyl ether sulfate sulfonate (b) having the formula (II), wherein the molar ratio of (a) to (b) is in the range of from 20/80 to 85/15 and the total amount of (a) and (b) is in the range of from more than 0.5 wt.% to less than 10 wt.%.Formula (I): ##STR1## (wherein R represents straight-chain or branched-chain alkyl group having 5 to 15 carbon atoms, m is an integer ranging from 3 to 15, and M represents Na or K.)formula (II): ##STR2## (wherein R' represents straight-chain or branched-chain alkyl group having 5 to 15 carbon atoms, n is an integer ranging from 3 to 15, and M represents Na or K.)
Abstract:
The present invention provides improved methods and devices for electroplating copper on a wafer. Some implementations of the present invention involve the pre-treatment of the wafer with a solution containing accelerator molecules. Preferably, the bath into which the wafer is subsequently placed for electroplating has a reduced concentration of accelerator molecules. The pre-treatment causes a reduction in roughness of the electroplated copper surface, particularly during the initial phases of copper growth.
Abstract:
A test support program to effectively and reliably check performance of functions which operate with other unspecified servers. A pair of a request message and a response message is stored as a message log. When a processing function based on a program under development being checked outputs a test request message, a computer selects a message log appropriate to the test request message as a template message under preset selection rules. The computer creates a test response message by editing the response message of the selected template message under preset editing rules. Then the computer sends the created test response message as a response to the test request message.