Device full memory access through standard PCI express bus

    公开(公告)号:US10241951B1

    公开(公告)日:2019-03-26

    申请号:US15796630

    申请日:2017-10-27

    Abstract: A method of transferring data between a host and a PCI device is disclosed. The method comprises mapping a fixed memory-mapping control block in a host memory of the host to a control register of a memory-mapping unit of the PCI device; mapping a dynamic data-access memory block in the host memory to a default memory block in a memory of the PCI device, wherein the memory-mapping unit translates an address between the dynamic data-access memory block and a memory block in the memory of the PCI device; and dynamically modifying a value in the control register of the memory-mapping unit through the fixed memory-mapping control block such that an address of the dynamic data-access memory block in the host memory is translated to a different address in the memory of the PCI device based on the modified value in the control register of the memory-mapping unit.

    Low-latency wake-up in a peripheral device

    公开(公告)号:US10409744B1

    公开(公告)日:2019-09-10

    申请号:US15251877

    申请日:2016-08-30

    Abstract: A processor in a peripheral device can include a wait-for-event mechanism, through which the processor can enter low-power mode and be woken from lower-power mode with an event. Using an event, rather than an interrupt, allows the processor to wake without the latency incurred by an interrupt handling routine. In various implementations, the processor may be configured to execute a sequence of instructions that include a wait-for-event instruction. The wait-for-event instruction can be called when the processor is idle. The wait-for-event instruction may initiate a low-power mode for the processor, wherein the processor suspends executing the sequence of instructions. The processor may further be configured to receive, at an event input, an event signal. The event signal may cause the processor to exit the low-power mode and to resume executing the sequence of instructions from the point at which the processor suspended executing the sequence of instructions.

    Device full memory access through standard PCI express bus

    公开(公告)号:US09804988B1

    公开(公告)日:2017-10-31

    申请号:US14928990

    申请日:2015-10-30

    Abstract: A method of transferring data between a host and a PCI device is disclosed. The method comprises mapping a fixed memory-mapping control block in a host memory of the host to a control register of a memory-mapping unit of the PCI device; mapping a dynamic data-access memory block in the host memory to a default memory block in a memory of the PCI device, wherein the memory-mapping unit translates an address between the dynamic data-access memory block and a memory block in the memory of the PCI device; and dynamically modifying a value in the control register of the memory-mapping unit through the fixed memory-mapping control block such that an address of the dynamic data-access memory block in the host memory is translated to a different address in the memory of the PCI device based on the modified value in the control register of the memory-mapping unit.

    Cross-platform device testing through low level drivers

    公开(公告)号:US09791506B1

    公开(公告)日:2017-10-17

    申请号:US14925044

    申请日:2015-10-28

    CPC classification number: G01R31/31907 G01R31/31919

    Abstract: In one example case, a cross-platform system includes a first automated test platform having a first test instrument and a first glue layer interface that exposes test functions to direct testing by the first test instrument. The system further includes a second automated test platform having a second test instrument and a second glue layer interface that exposes the same test functions to direct testing by the second test instrument. In the system, the glue layers abstract the respective and different control commands used by the different, first and second test instruments. Using the glue layers, the same higher-level test code can be executed by the control computers of both the first and second automated test platforms.

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