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公开(公告)号：US07065176B2
公开(公告)日：2006-06-20
申请号：US10250010
申请日：2003-05-28
申请人： Kevin Moermond , Andy Joseph Galish , John Robert Brehm , Francis Howard Little , Dean Fredrich Graber , Michael Timothy La Tulippe , Ronald Cecil McFarland
发明人： Kevin Moermond , Andy Joseph Galish , John Robert Brehm , Francis Howard Little , Dean Fredrich Graber , Michael Timothy La Tulippe , Ronald Cecil McFarland
IPC分类号： G01B15/06
CPC分类号： G01N23/04
摘要： A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.
摘要翻译： 公开了一种检查部件的系统和方法。 检查部件的系统可以包括用于引导X射线束穿过部件的X射线源和x射线检测器，以在穿过部件之后检测X射线束。 可以包括处理器以将X射线检测器的X射线检测面板上的坐标转换成任何缺陷的部件上的位置的数字表示。
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公开(公告)号：US08205500B2
公开(公告)日：2012-06-26
申请号：US12277884
申请日：2008-11-25
申请人： Yanyan Wu , Edward James Nieters , Thomas James Batzinger , Nicholas Joseph Kray , James Norman Barshinger , Jian Li , Waseem Ibrahim Faidi , Prabhjot Singh , Francis Howard Little , Michael Everett Keller , Timothy Jesse Sheets
发明人： Yanyan Wu , Edward James Nieters , Thomas James Batzinger , Nicholas Joseph Kray , James Norman Barshinger , Jian Li , Waseem Ibrahim Faidi , Prabhjot Singh , Francis Howard Little , Michael Everett Keller , Timothy Jesse Sheets
CPC分类号： G01N29/07 , G01N29/0654 , G01N29/4418 , G01N2291/011
摘要： An ultrasound inspection system is provided for inspecting an object. The inspection system includes an ultrasound probe configured to scan the object and acquire a plurality of ultrasound scan data. The inspection system further includes a processor coupled to the ultrasound probe and configured to apply a transfer function to the ultrasound scan data to compensate for distortion of a plurality of ultrasound signals through the object and thereby generate a plurality of compensated ultrasound scan data, and to process the compensated ultrasonic scan data to characterize a feature in the object.
摘要翻译： 提供用于检查物体的超声检查系统。 检查系统包括被配置为扫描对象并获取多个超声扫描数据的超声波探头。 所述检查系统还包括处理器，其耦合到所述超声波探头并且被配置为将所述传递函数应用于所述超声波扫描数据以补偿通过所述物体的多个超声信号的失真，从而生成多个经补偿的超声波扫描数据，并且 处理补偿的超声波扫描数据以表征物体中的特征。
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公开(公告)号：US07840367B2
公开(公告)日：2010-11-23
申请号：US11946244
申请日：2007-11-28
申请人： Francis Howard Little , Yanyan Wu , Prabhjot Singh
发明人： Francis Howard Little , Yanyan Wu , Prabhjot Singh
摘要： An inspection artifact includes a central portion and multiple optical and coordinate measurement machine (CMM) alignment features arranged on the central portion. The optical and CMM alignment features are configured to align the coordinates for an optical or a CMM measurement system to a common coordinate system. Another inspection artifact includes a central portion and multiple computed tomography (CT) alignment features arranged on the central portion. The CT alignment features are configured to align the coordinates for a CT system to a common coordinate system.
摘要翻译： 检查工件包括中央部分和布置在中心部分上的多个光学和坐标测量机（CMM）对准特征。 光学和CMM对准特征被配置为将光学或CMM测量系统的坐标与公共坐标系对准。 另一种检查工件包括布置在中心部分上的中心部分和多个计算机断层摄影（CT）对准特征。 CT对准特征被配置为将CT系统的坐标与公共坐标系对齐。
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4.发明授权公开(公告)号：US08010315B2
公开(公告)日：2011-08-30
申请号：US11945456
申请日：2007-11-27
申请人： Yanyan Wu , Francis Howard Little , Prabhjot Singh
发明人： Yanyan Wu , Francis Howard Little , Prabhjot Singh
CPC分类号： G06K9/32 , G06K9/00 , G06K2209/19
摘要： An inspection method is provided and includes acquiring at least one inspection data set. Each inspection data set comprises inspection data for a component. The inspection method further includes mapping the inspection data set onto a three-dimensional (3D) model of the component, to generate a 3D inspection model for the component, and validating the inspection data against the 3D model of the component using at least one validation criterion. A multi-modality inspection method is also provided and includes acquiring multiple inspection data sets corresponding to multiple inspection modalities for a component and fusing the inspection data sets to form a fused data set. The multi-modality inspection method further includes mapping the fused data set onto a 3D model of the component to generate a 3D multi-modality inspection model for the component.
摘要翻译： 提供检查方法，包括获取至少一个检查数据集。 每个检查数据组包括组件的检查数据。 检查方法还包括将检查数据集映射到部件的三维（3D）模型上，以生成用于部件的3D检查模型，并使用至少一个验证来验证检测数据对组件的3D模型 标准。 还提供了一种多模式检查方法，包括获取对应于组件的多个检查模式的多个检查数据集，并将检验数据集合并形成融合数据集。 多模式检查方法还包括将融合数据集映射到组件的3D模型上，以生成用于组件的3D多模态检查模型。
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5.发明申请INSPECTION ARTIFACTS, SYSTEMS AND METHODS FOR FUSING MULTI-MODALITY INSPECTION DATA 有权用于融合多模式检验数据的检验手段，系统和方法公开(公告)号：US20090138231A1
公开(公告)日：2009-05-28
申请号：US11946244
申请日：2007-11-28
申请人： Francis Howard Little , Yanyan Wu , Prabhjot Singh
发明人： Francis Howard Little , Yanyan Wu , Prabhjot Singh
摘要： An inspection artifact includes a central portion and multiple optical and coordinate measurement machine (CMM) alignment features arranged on the central portion. The optical and CMM alignment features are configured to align the coordinates for an optical or a CMM measurement system to a common coordinate system. Another inspection artifact includes a central portion and multiple computed tomography (CT) alignment features arranged on the central portion. The CT alignment features are configured to align the coordinates for a CT system to a common coordinate system.
摘要翻译： 检查工件包括中央部分和布置在中心部分上的多个光学和坐标测量机（CMM）对准特征。 光学和CMM对准特征被配置为将光学或CMM测量系统的坐标与公共坐标系对准。 另一种检查工件包括布置在中心部分上的中心部分和多个计算机断层摄影（CT）对准特征。 CT对准特征被配置为将CT系统的坐标与公共坐标系对齐。
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公开(公告)号：US07099017B2
公开(公告)日：2006-08-29
申请号：US10446295
申请日：2003-05-28
CPC分类号： G01B11/285 , G01B11/24
摘要： A method and apparatus for measuring an opening defined within object using an optical sensor system is provided. The method includes positioning an illumination source adjacent the opening, illuminating a perimeter circumscribing the opening, receiving an image of the illuminated boundary, and calculating an area within the received boundary. The system includes a light source oriented to project a first sheet of light intersected by a first portion of the opening perimeter, the light source projecting a second sheet of light intersected by a second portion of the opening perimeter, a light detector receiving a portion of the sheet of light intersected by the object opening perimeter and reflected toward the light detector, and an image processor communicatively coupled to the light detector, the image processor programmed to sample an image from the detector and programmed determine the dimensions of the object opening from the sampled image.
摘要翻译： 提供一种使用光学传感器系统测量在物体内限定的开口的方法和装置。 该方法包括将照明源定位在靠近开口处，照亮围绕开口的周边，接收照明边界的图像，以及计算接收边界内的区域。 该系统包括一个光源，该光源被定向成投影由开口周边的第一部分相交的第一片光，该光源投射与该开口周边的第二部分相交的第二片光，一光接收器， 所述光束被物体开口周边相交并且朝向光检测器反射;以及图像处理器，其通信地耦合到光检测器，所述图像处理器被编程为从所述检测器采样图像，并且被编程以确定所述物体开口的尺寸 采样图像。
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公开(公告)号：US06711235B2
公开(公告)日：2004-03-23
申请号：US10161276
申请日：2002-05-31
IPC分类号： G21K102
CPC分类号： G01N23/04 , G01N2223/316 , G21K1/025
摘要： An X-ray inspection system is provided having an X-ray source and first and second collimators. The first and second collimators are arranged in relation to the source and the target such that the portion of the target actually illuminated by The X-ray beam is substantially equal to the size of a selected inspection zone.
摘要翻译： 提供具有X射线源和第一和第二准直仪的X射线检查系统。 第一和第二准直器相对于源和目标被布置，使得由X射线束实际照射的目标的部分基本上等于所选择的检查区的大小。
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8.发明申请METHOD AND SYSTEM FOR INTEGRATING EDDY CURRENT INSPECTION WITH A COORDINATE MEASURING DEVICE 有权用辅助测量装置集成EDDY电流检测的方法和系统公开(公告)号：US20100207619A1
公开(公告)日：2010-08-19
申请号：US12372881
申请日：2009-02-18
申请人： Yanyan Wu , Thomas James Batzinger , Nicholas Joseph Kray , Changting Wang , Haiyan Sun , Francis Howard Little , David Paul Lappas , David Michael Dombrowski
发明人： Yanyan Wu , Thomas James Batzinger , Nicholas Joseph Kray , Changting Wang , Haiyan Sun , Francis Howard Little , David Paul Lappas , David Michael Dombrowski
CPC分类号： G01B7/008 , G01B7/28 , G01N27/90 , G01N27/9046
摘要： A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.
摘要翻译： 用于集成用于测量机器部件的测量装置的方法包括提供坐标测量机（CMM）并组合涡流（EC）能力和CMM能力以形成检查探针。 该方法还包括将检查探针安装在CMM上，使得检查探针以CMM能力测量机器部件的外部边界，并且基本上同时测量机器的内部边界，内部缺陷，表面缺陷和材料特性中的至少一个 具有EC功能的组件，其直接与CMM提供的实际组件尺寸信息相关联。 检查数据可以与CAD模型同时链接和/或显示，以便能够直接比较检验数据和CAD模型上规定的标称要求。
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公开(公告)号：US20100124369A1
公开(公告)日：2010-05-20
申请号：US12274687
申请日：2008-11-20
申请人： Yanyan Wu , Donald Robert Howard , Harry Israel Ringermacher , Robert August Kaucic , Zhaohui Sun , Francis Howard Little , Xiaodong Tao , Patrick Joseph Howard , Matthew Edward Dragovich , Eric Scott Foster
发明人： Yanyan Wu , Donald Robert Howard , Harry Israel Ringermacher , Robert August Kaucic , Zhaohui Sun , Francis Howard Little , Xiaodong Tao , Patrick Joseph Howard , Matthew Edward Dragovich , Eric Scott Foster
CPC分类号： G01B11/02 , G01B11/24 , G06T7/001 , G06T7/337 , G06T2207/10048 , G06T2207/30164
摘要： A method for determining 3D distances on a 2D pixelized image of a part or object includes acquiring a real 2D pixelized image of the object, creating a simulated image of the object using the 3D CAD model and the 2D pixelized image, determining a specified cost function comparing the simulated image with the real 2D pixilated image and repositioning the simulated image in accordance with iterated adjustments of a relative position between the CAD model and the XID pixilated image to change the simulated image until the specified cost function is below a specified value. Then, the workstation is used to generate a 3D distance scale matrix using the repositioned simulated image, and to measure and display distances between selected pixels on a surface of the real image using 2D distances on the 2D pixelized image of the object and the 3D distance scale matrix.
摘要翻译： 一种用于确定部分或对象的2D像素化图像上的3D距离的方法包括获取对象的真实2D像素化图像，使用3D CAD模型和2D像素化图像创建对象的模拟图像，确定指定的成本函数 将模拟图像与真实2D像素化图像进行比较，并根据CAD模型和XID像素化图像之间的相对位置的迭代调整重新定位模拟图像，以改变模拟图像，直到指定的成本函数低于指定值。 然后，工作站用于使用重新定位的模拟图像生成3D距离尺度矩阵，并且使用对象的2D像素化图像上的2D距离来测量和显示在实际图像的表面上的所选像素之间的距离，并且3D距离 比例矩阵。
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10.发明申请METHOD AND SYSTEM FOR INTEGRATING ULTRASOUND INSPECTION (UT) WITH A COORDINATE MEASURING MACHINE (CMM) 失效用坐标测量机（CMM）整合超声波检测（UT）的方法和系统公开(公告)号：US20090165317A1
公开(公告)日：2009-07-02
申请号：US11964939
申请日：2007-12-27
IPC分类号： G01N29/265 , G01B5/012
CPC分类号： G01N29/265 , G01B5/012 , G01B17/02 , G01B21/04 , G01B21/047 , G01N2291/02854 , G01N2291/044 , G01N2291/2693 , Y10T29/49826
摘要： A method is provided for assembling a measurement device for use in measuring a machine component. The method includes providing a coordinate measuring machine (CMM). The method also includes combining ultrasonic inspection (UT) capabilities and CMM capabilities to form an inspection probe. The inspection probe is installed on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures internal boundaries of the machine component with the UT capabilities.
摘要翻译： 提供了用于组装用于测量机器部件的测量装置的方法。 该方法包括提供坐标测量机（CMM）。 该方法还包括组合超声波检测（UT）功能和CMM功能，形成检测探针。 检查探头安装在CMM上，以便检测探头以CMM功能测量机器部件的外部边界，并基本上同时测量机器部件的内部边界与UT功能。
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