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    MICROMETER
    1.
    发明申请
    MICROMETER 有权

    公开(公告)号：US20150059196A1

    公开(公告)日：2015-03-05

    申请号：US14473444

    申请日：2014-08-29

    Applicant: MITUTOYO CORPORATION

    Inventor： Yoshiro ASANO ,  Sadayuki MATSUMIYA ,  Shigeru OHTANI ,  Atsuya NIWANO ,  Shozaburo TSUJI

    IPC: G01B3/18

    CPC classification number: G01B3/18

    Abstract: A micrometer with good usability is provided. A micrometer has a frame with an anvil at one end and a spindle at another end, the spindle moving closer to or further away from the anvil. The frame is covered with a heat shield cover. The heat shield cover has a first anti-slip part. The first anti-slip part preferably has a plurality of protrusions.

    Abstract translation: 提供了具有良好可用性的千分尺。 千分尺具有在一端具有砧座的框架，另一端具有主轴，主轴移动靠近或远离砧座。 框架覆盖有隔热罩。 隔热罩具有第一防滑部分。 第一防滑部优选具有多个突起。

    SURFACE ROUGHNESS MEASURING UNIT AND COORDINATE MEASURING APPARATUS
    2.
    发明申请
    SURFACE ROUGHNESS MEASURING UNIT AND COORDINATE MEASURING APPARATUS 有权
    表面粗糙度测量装置和坐标测量装置

    公开(公告)号：US20140109422A1

    公开(公告)日：2014-04-24

    申请号：US14050553

    申请日：2013-10-10

    Applicant: MITUTOYO CORPORATION

    Inventor： Kotaro HIRANO ,  Nobuyuki HAMA ,  Masanori ARAI ,  Sadayuki MATSUMIYA

    IPC: G01B5/28 ,  G01B5/012

    CPC classification number: G01B5/012 ,  B82Y35/00 ,  G01B5/008 ,  G01B5/016 ,  G01B5/28 ,  G01B7/023

    Abstract: A surface roughness measuring unit according to the present invention includes a contact pin unit having a contact pin and a displacement detector, the contact pin being provided so as to project and retract through a through-hole of a skid and scanning and moving along a surface of a work piece, the displacement detector detecting displacement of the contact pin in a direction perpendicular to the work piece surface; a driver moving the contact pin unit forward and backward along the surface of the work piece; and a joint coupling the contact pin unit and the driver to a measurement head holder of a coordinate measuring system. The surface roughness measuring unit further includes a contact detector that detects contact of the skid on the surface of the work piece.

    Abstract translation: 根据本发明的表面粗糙度测量单元包括具有接触销和位移检测器的接触针单元，所述接触销设置成通过滑动件的通孔突出和缩回并沿着表面移动 位移检测器检测接触销在垂直于工件表面的方向上的位移; 驱动器沿着工件的表面向前和向后移动接触销单元; 以及将接触针单元和驱动器联接到坐标测量系统的测量头保持器。 所述表面粗糙度测量单元还包括接触检测器，其检测所述工件在所述工件的表面上的接触。

    MEASURING HEAD
    3.
    发明申请
    MEASURING HEAD 审中-公开

    公开(公告)号：US20180274914A1

    公开(公告)日：2018-09-27

    申请号：US15933840

    申请日：2018-03-23

    Applicant: MITUTOYO CORPORATION

    Inventor： Sadayuki MATSUMIYA ,  Tomoyuki MIYAZAKI ,  Shuichi KAMIYAMA ,  Hideyuki ARAI

    IPC: G01B21/06 ,  G01B13/03 ,  G05D16/00 ,  G01B21/04 ,  G01B5/008

    Abstract: A measuring head includes a first slide mechanism for a first measurement axis provided to be detachable to external moving devices; a second slide mechanism for a second measurement axis held to be movable by the first slide mechanism; a third slide mechanism for a third measurement axis held to be movable by the second slide mechanism; a probe held to be movable by the third slide mechanism; pneumatic cylinders for connecting slider parts and guide parts included in each slide mechanism; and automatic pressure regulators for respectively changing air pressures supplied to each pneumatic cylinder in accordance with measurement postures of the measuring head.

    MEASURING PROBE AND MEASURING PROBE SYSTEM
    4.
    发明申请
    MEASURING PROBE AND MEASURING PROBE SYSTEM 审中-公开

    公开(公告)号：US20170284794A1

    公开(公告)日：2017-10-05

    申请号：US15460994

    申请日：2017-03-16

    Applicant: MITUTOYO CORPORATION

    Inventor： Kazuhiko HIDAKA ,  Sadayuki MATSUMIYA

    IPC: G01B11/24

    CPC classification number: G01B11/2441 ,  G01B11/2425

    Abstract: A measuring probe for measuring a screw groove of a relatively movable ball screw includes a light source, an objective lens formed to correspond to the screw groove of the ball screw, arranged to be opposed to the screw groove of the ball screw in a non-contact manner, and configured to emit light from the light source to the screw groove of the ball screw, and a line sensor configured to detect an interference pattern generated by reflected light from the screw groove of the ball screw and reflected light on a surface of the objective lens. This enables high-accuracy measurement of a specified area of a shape of a side surface of a relatively movable work in a non-contact manner.

    MEASURING PROBE AND MEASURING PROBE SYSTEM
    5.
    发明申请
    MEASURING PROBE AND MEASURING PROBE SYSTEM 有权

    公开(公告)号：US20170097221A1

    公开(公告)日：2017-04-06

    申请号：US15281326

    申请日：2016-09-30

    Applicant: MITUTOYO CORPORATION

    Inventor： Kazuhiko HIDAKA ,  Nobuyuki HAMA ,  Tatsuki NAKAYAMA ,  Sadayuki MATSUMIYA

    IPC: G01B5/012

    CPC classification number: G01B5/012 ,  G01B5/204

    Abstract: A measuring probe for measuring a screw groove of a relatively rotatable ball screw includes a stylus having a tip end portion configured to contact the screw groove, a radial-direction displacement mechanism configured to support the stylus so as for the stylus to be displaceable in an X direction toward an axial center of the ball screw, an axial-direction displacement mechanism configured to support the stylus so as for the stylus to be displaceable in an axial direction (Z direction) of the axial center, and sensors configured to detect displacement of the stylus produced by the radial-direction displacement mechanism and the axial-direction displacement mechanism. This enables high-accuracy measurement of a predetermined position of a side surface of a relatively rotatable work.

    METHOD AND DEVICE FOR CONTROLLING ROTARY TABLE
    7.
    发明申请
    METHOD AND DEVICE FOR CONTROLLING ROTARY TABLE 审中-公开
    用于控制旋转表的方法和装置

    公开(公告)号：US20160305894A1

    公开(公告)日：2016-10-20

    申请号：US15093134

    申请日：2016-04-07

    Applicant: MITUTOYO CORPORATION

    Inventor： Sadayuki MATSUMIYA ,  Hidemitsu ASANO ,  Masato KON

    IPC: G01N23/04

    CPC classification number: G01N23/046 ,  G01N2223/309 ,  G01N2223/3306 ,  G01N2223/3308

    Abstract: An XY shift mechanism can shift a rotary table in a two-dimensional direction (XY direction) orthogonal to a rotation axis of the rotary table. By collaborative control of the shift position of the rotary table in the two-dimensional direction in synchronization with the rotation of the rotary table, rotation is made possible about a virtual rotation center that is set at an arbitrary position on the rotary table. The collaborative control of the shift position of the rotary table in the two-dimensional direction also corrects rotation eccentricity owing to the eccentricity of the rotary table. Thus, the virtual rotation center can be set at an arbitrary position on the rotary table, thus enabling obtainment of high resolution tomographic images of a plurality of regions of interest of an object, without the need for repositioning of the object.

    Abstract translation: XY移动机构可以使与旋转台的旋转轴正交的二维方向（XY方向）的旋转台移动。 通过与旋转台的旋转同步地与二维方向的旋转台的换档位置协同控制，可以围绕设置在旋转台上的任意位置的虚拟旋转中心进行旋转。 旋转台在二维方向的换档位置的协同控制也由于旋转台的偏心而校正旋转偏心。 因此，可以将虚拟旋转中心设置在旋转台上的任意位置，从而能够获得对象的多个感兴趣区域的高分辨率断层图像，而不需要重新定位对象。

    PROBE HEAD ROTATING MECHANISM
    9.
    发明申请
    PROBE HEAD ROTATING MECHANISM 审中-公开
    探头头旋转机构

    公开(公告)号：US20170059297A1

    公开(公告)日：2017-03-02

    申请号：US15241627

    申请日：2016-08-19

    Applicant: MITUTOYO CORPORATION

    Inventor： Yoshikazu OOYAMA ,  Hayato KUSAMA ,  Sadayuki MATSUMIYA ,  Hitoshi OHTA

    IPC: G01B5/012

    CPC classification number: G01B5/012 ,  G01B5/0014 ,  G01B7/001

    Abstract: A probe head rotation mechanism, situated between a spindle and a probe of a coordinate measurement device, includes: a main body frame supported by the spindle; a rotor supported by the main body frame so as to be capable of tilting with respect to an axial center of the spindle; the main body frame; and a motor supported by the main body frame and driving the rotor. A motor main body is arranged away from lying on the axial center of the spindle, and an axial center of the motor is oriented outward in a diameter direction of the spindle.

    Abstract translation: 位于坐标测量装置的主轴和探头之间的探头旋转机构包括：由主轴支撑的主体框架; 由所述主体框架支撑的转子，以能够相对于所述心轴的轴心倾斜; 主体框架; 以及由主体框架支撑并驱动转子的电动机。 电动机主体被布置成远离主轴的轴向中心，并且电动机的轴向中心沿主轴的直径方向向外取向。

    FORM MEASURING MACHINE
    10.
    发明申请
    FORM MEASURING MACHINE 有权
    形式测量机

    公开(公告)号：US20150292851A1

    公开(公告)日：2015-10-15

    申请号：US14669667

    申请日：2015-03-26

    Applicant: MITUTOYO CORPORATION

    Inventor： Takeshi YAMAMOTO ,  Sadayuki MATSUMIYA ,  Atsushi SHIMAOKA ,  Kazuhiko HIDAKA ,  Tomoyuki MIYAZAKI ,  Yasunori MORI

    IPC: G01B3/00 ,  G01B5/20

    CPC classification number: G01B3/008 ,  G01B5/20

    Abstract: A measuring force includes a stem, an arm, a detector, a rotation fulcrum, and a measuring force adjuster. A probe which makes contact with a workpiece is provided on the stem. An end portion of the arm is joined to the stem. The rotation fulcrum acts as a fulcrum for a rotating motion of the stem and the arm. The detector detects a displacement amount of the rotating motion of the arm. A crossed spring of the rotation fulcrum imparts on the stem and the arm a torque around an axis of the rotating motion in accordance with the displacement amount of the rotating motion. The measuring force adjuster imparts on the arm and the stem a torque, in a reverse direction of the torque generated by the crossed spring, by an attraction force generated by a magnetic force between at least two magnetic members mutually arranged at opposite ends.

    Abstract translation: 测量力包括杆，臂，检测器，旋转支点和测量力调节器。 在杆上设置与工件接触的探针。 臂的端部连接到杆。 旋转支点用作杆和臂的旋转运动的支点。 检测器检测臂的旋转运动的位移量。 旋转支点的交叉弹簧根据旋转运动的位移量，在杆和臂上施加围绕旋转运动的轴线的转矩。 测量力调节器通过由在相对端相互布置的至少两个磁性构件之间的磁力产生的吸引力，在与交叉弹簧产生的扭矩相反的方向上向臂和杆施加扭矩。

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