Surface examining apparatus for detecting the presence of foreign
particles on the surface
    2.
    发明授权
    Surface examining apparatus for detecting the presence of foreign particles on the surface 失效
    用于检测表面上外来颗粒的存在的表面检查装置

    公开(公告)号:US4795911A

    公开(公告)日:1989-01-03

    申请号:US14033

    申请日:1987-02-12

    IPC分类号: G01N21/94 G01N21/88

    CPC分类号: G01N21/94

    摘要: An apparatus usable with an object having a surface with a pattern, for examining the state of the surface, includes a projecting system for directing a light beam to the surface of the object, and a collecting system for collecting scattered light from the surface of the object. A projection of the optical axis of the collecting system onto the surface of the object extends in a direction different from a projection onto the surface of the object of a major portion of light diffracted from the pattern. A light-receiving unit receives the scattered light as collected by the collecting system and for producing an output corresponding to the state of the surface of the object.

    摘要翻译: 可用于具有用于检查表面状态的具有图案的表面的物体的装置包括用于将光束引导到物体的表面的投影系统和用于从该物体的表面收集散射光的收集系统 目的。 将收集系统的光轴投射到物体表面上的方向不同于从图案衍射的大部分光的物体的表面上的投影。 光接收单元接收由收集系统收集的散射光并产生与物体表面的状态对应的输出。

    Surface examining apparatus for detecting the presence of foreign
particles on two or more surfaces
    3.
    发明授权
    Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces 失效
    表面检查装置,用于检测两个或多个表面上的外来颗粒的存在

    公开(公告)号:US4886975A

    公开(公告)日:1989-12-12

    申请号:US348177

    申请日:1989-05-02

    IPC分类号: G01N21/94 G01N21/956

    摘要: An apparatus usable with an object having surfaces, for examining the states of the surfaces, includes on irradiating system for irradiating the surfaces of the object with a single light beam, and a plurality of light-receiving systems provided in association with the surfaces of the object, respectively, the plural light-receiving systems being arranged to receive light scatteringly reflected from the surfaces of the object, respectively, and to produce outputs corresponding to the states of the surfaces of the object, respectively.

    摘要翻译: 可用于具有用于检查表面状态的表面的物体的装置包括用于用单个光束照射物体的表面的照射系统,以及与所述物体的表面相关联地设置的多个光接收系统 目的是分别将多个光接收系统分别接收从物体的表面散射地反射的光,并分别产生与物体的表面的状态相对应的输出。

    Ultrasonic type flow sensor
    4.
    发明授权
    Ultrasonic type flow sensor 有权
    超声波流量传感器

    公开(公告)号:US08544344B2

    公开(公告)日:2013-10-01

    申请号:US13296365

    申请日:2011-11-15

    申请人: Eiichi Murakami

    发明人: Eiichi Murakami

    IPC分类号: G01F1/66

    CPC分类号: G01F1/662 G01F15/14

    摘要: First and second piezoelectric transducers 2 and 3 are fixed to a tubular main body 1 via first and second fitting bases 4 and 5. On front and rear surfaces of an end portion of each of the first and second piezoelectric transducers 2 and 3 are provided first and second electrodes 6 and 7. When the tubular main body 1 is secured to a circuit box, each of the end portions of the first and second piezoelectric transducers 2 and 3 is inserted between first and second contact members provided on the circuit box such that the first and second electrodes 6 and 7 are electrically connected to the first and second contact members, respectively to connect the first and second piezoelectric transducers 2 and 3 to the circuit box by one touch operation.

    摘要翻译: 第一和第二压电换能器2和3经由第一和第二配件基座4和5固定到管状主体1.在第一和第二压电换能器2和3中的每一个的端部的前表面和后表面被设置为第一 和第二电极6和7.当管状主体1固定到电路箱时,第一和第二压电换能器2和3的每个端部插入设置在电路箱上的第一和第二接触构件之间,使得 第一和第二电极6和7分别电连接到第一和第二接触构件,以通过一次触摸操作将第一和第二压电换能器2和3连接到电路箱。

    Wafer transport method
    6.
    发明授权
    Wafer transport method 失效
    晶圆输送方式

    公开(公告)号:US5562800A

    公开(公告)日:1996-10-08

    申请号:US308442

    申请日:1994-09-19

    摘要: A wafer transport method includes the steps of preparing a semiconductor process equipment having a transport chamber and a process chamber. An interface means connects the transport chamber to the process chamber. A transport means transports a semiconductor wafer from the transport chamber to the process chamber by way of the interface means. The transport means mounting a substrate is inserted into a communicating corridor including a supply means and an exhaust means. The substrate is transported while performing the supply and exhaust by sequentially controlling a supply shutoff means, an exhaust shutoff means, and a communicating shutoff means according to the position of a conductance part formed of a gap between the transport means and the communicating corridor. Thus, the substrate is transported at a high throughput without contamination of the substrate while keeping the different atmospheric conditions for the transport chamber and the process chamber, thereby manufacturing a semiconductor device with high performance capabilities.

    摘要翻译: 晶片输送方法包括准备具有输送室和处理室的半导体工艺设备的步骤。 接口装置将输送室连接到处理室。 传送装置通过接口装置将半导体晶片从传送室传送到处理室。 安装基板的输送装置被插入到包括供给装置和排气装置的通信走廊中。 通过根据由输送装置和通信走廊之间的间隙形成的电导部分的位置依次控制供给切断装置,排气关闭装置和通信切断装置,在进行供给和排出的同时运送基板。 因此,在保持输送室和处理室的不同大气条件的同时,以高通量输送基板而不污染基板,从而制造具有高性能的半导体器件。

    Exposure apparatus
    10.
    发明授权
    Exposure apparatus 有权
    曝光装置

    公开(公告)号:US07046330B2

    公开(公告)日:2006-05-16

    申请号:US11229829

    申请日:2005-09-20

    申请人: Eiichi Murakami

    发明人: Eiichi Murakami

    IPC分类号: G03B27/52 G03B27/42

    摘要: An exposure apparatus for printing, by exposure, a pattern of an original onto a substrate includes a housing tightly filled with a predetermined ambience and for accommodating therein at least a portion of an exposure light optical axis, and a detection system having an optical system, wherein a portion of a light path of the detection system is disposed in a first space enclosed by the housing, and wherein at least another portion of the detection system including an electrical element thereof is disposed in a second space outside the housing.

    摘要翻译: 用于通过曝光将原稿图案打印到基板上的曝光装置包括紧密地填充有预定环境并用于在其中容纳曝光光轴的至少一部分的外壳以及具有光学系统的检测系统, 其中所述检测系统的光路的一部分设置在由所述壳体包围的第一空间中,并且其中包括其电气元件的所述检测系统的至少另一部分设置在所述壳体外部的第二空间中。