公开(公告)号：US08118212B2

公开(公告)日：2012-02-21

申请号：US12766242

申请日：2010-04-23

申请人： Charles A. Miller

发明人： Charles A. Miller

IPC分类号： B65D5/00 ,  B65D5/72 ,  B65D17/00

CPC分类号： B65D71/36 ,  B65D5/5405 ,  B65D5/703 ,  B65D2571/00141 ,  B65D2571/0045 ,  B65D2571/00623 ,  B65D2571/0066 ,  B65D2571/00728

摘要： A package includes an article group formed of cylindrical articles disposed on their sides in a side-by-side parallel fashion, and a carton disposed around the group. The carton includes a top wall, opposed side walls, end walls and an article dispenser. The side walls are disposed alongside the ends of the articles while one end wall is disposed adjacent to the side wall of an endmost article. The dispenser is formed from the end and top walls and includes at least one retaining panel to hold all the articles in the carton until removed by the user.

摘要翻译： 一种包装物，其包括以并列方式设置在其侧面的圆柱形制品形成的物品组，以及围绕该组设置的纸箱。 纸箱包括顶壁，相对的侧壁，端壁和物品分配器。 侧壁沿着物品的端部设置，同时一个端壁邻近最后端物品的侧壁设置。 分配器由端壁和顶壁形成并且包括至少一个保持板，用于将所有的物品保持在纸箱中，直到使用者移除。

公开(公告)号：US07977958B2

公开(公告)日：2011-07-12

申请号：US11846446

申请日：2007-08-28

申请人： Charles A. Miller

发明人： Charles A. Miller

IPC分类号： G01R31/20

CPC分类号： G01R31/2889 ,  G01R31/31713

摘要： An emitter follower or source follower transistor is provided in the channel of a wafer test system between a DUT and a test system controller to enable a low power DUT to drive a test system channel. A bypass resistor is included between the base and emitter of the emitter follower transistor to enable bi-directional signals to be provided between the DUT channel and test system controller, as well as to enable parametric tests to be performed. The emitter follower transistor and bypass resistor can be provided on the probe card, with a pull down termination circuit included in the test system controller. The test system controller can provide compensation for the base to emitter voltage drop of the emitter follower transistor.

摘要翻译： 在DUT和测试系统控制器之间的晶片测试系统的通道中提供射极跟随器或源极跟随器晶体管，以使低功率DUT能够驱动测试系统通道。 在射极跟随器晶体管的基极和发射极之间包括一个旁路电阻，以便能够在DUT通道和测试系统控制器之间提供双向信号，以及执行参数测试。 射极跟随器晶体管和旁路电阻可以在探针卡上提供，测试系统控制器中包含一个下拉终端电路。 测试系统控制器可以为射极跟随器晶体管的基极到发射极电压降提供补偿。

公开(公告)号：US20100264947A1

公开(公告)日：2010-10-21

申请号：US12763907

申请日：2010-04-20

申请人： Charles A. Miller ,  John Matthew Long

发明人： Charles A. Miller ,  John Matthew Long

IPC分类号： G01R31/02

CPC分类号： G01R31/31926 ,  G01R1/07378 ,  G01R31/318511 ,  G11C29/56 ,  G11C2029/2602 ,  H05K1/0216 ,  H05K1/023 ,  H05K1/0289 ,  H05K2201/09254 ,  Y10T29/49117

摘要： An interconnect structure employs a closed-grid bus to link an integrated circuit tester channel to an array of input/output (I/O) pads on a semiconductor wafer so that the tester channel can concurrently communicate with all of the I/O pads. The interconnect structure includes a circuit board implementing an array of bus nodes, each corresponding to a separate one of the I/O pads. The circuit board includes at least two layers. Traces mounted on a first layer form a set of first daisy-chain buses, each linking all bus nodes of a separate row of the bus node array. Traces mounted on a second circuit board layer form a set of second daisy-chain buses, each linking all bus nodes of a separate column of the bus node array. Vias and other circuit board interconnect ends of the first and second daisy-chain buses so that they form the closed-grid bus. Each bus node is connected though a separate isolation resistor to a separate contact pad mounted on a surface of the circuit board. A set of spring contacts or probes link each contact pad to a separate one of the I/O pads on the wafer.

摘要翻译： 互连结构采用闭合栅格总线将集成电路测试器通道连接到半导体晶片上的输入/输出（I / O）焊盘阵列，使得测试仪通道可以同时与所有I / O焊盘通信。 互连结构包括实现总线节点阵列的电路板，每个总线节点对应于单独的一个I / O焊盘。 电路板包括至少两层。 安装在第一层上的轨迹形成一组第一个菊花链总线，每个链路总线连接总线节点阵列的单独行的所有总线节点。 安装在第二电路板层上的迹线形成一组第二菊花链总线，每条链路总线连接总线节点阵列的单独列的所有总线节点。 第一和第二菊花链总线的通路和其他电路板互连端，使得它们形成闭合栅格总线。 每个总线节点通过单独的隔离电阻器连接到安装在电路板表面上的单独的接触焊盘。 一组弹簧触点或探针将每个接触垫连接到晶片上的单独的I / O焊盘之间。

公开(公告)号：US20100200646A1

公开(公告)日：2010-08-12

申请号：US12766242

申请日：2010-04-23

申请人： Charles A. Miller

发明人： Charles A. Miller

IPC分类号： B65D5/72 ,  A47F1/06 ,  B65D17/28

CPC分类号： B65D71/36 ,  B65D5/5405 ,  B65D5/703 ,  B65D2571/00141 ,  B65D2571/0045 ,  B65D2571/00623 ,  B65D2571/0066 ,  B65D2571/00728

摘要： A package includes an article group formed of cylindrical articles disposed on their sides in a side-by-side parallel fashion, and a carton disposed around the group. The carton includes a top wall, opposed side walls, end walls and an article dispenser. The side walls are disposed alongside the ends of the articles while one end wall is disposed adjacent to the side wall of an endmost article. The dispenser is formed from the end and top walls and includes at least one retaining panel to hold all the articles in the carton until removed by the user.

摘要翻译： 一种包装物，其包括以并列方式设置在其侧面的圆柱形制品形成的物品组，以及围绕该组设置的纸箱。 纸箱包括顶壁，相对的侧壁，端壁和物品分配器。 侧壁沿着物品的端部设置，同时一个端壁邻近最后端物品的侧壁设置。 分配器由端壁和顶壁形成并且包括至少一个保持板，用于将所有的物品保持在纸箱中，直到使用者移除。

公开(公告)号：US07746937B2

公开(公告)日：2010-06-29

申请号：US11279816

申请日：2006-04-14

申请人： Charles A. Miller

发明人： Charles A. Miller

IPC分类号： H04B3/00 ,  H04L27/00

CPC分类号： H03F3/45475 ,  H03F3/211 ,  H03F3/24 ,  H03F2203/45594

摘要： A plurality of differential signal transmitters can transmit data signals differentially through a plurality of conductive signal lines. Ones of the signal lines can be shared between transmitters, and others of the signal lines need not be shared between transmitters.

摘要翻译： 多个差分信号发送器可以通过多个导电信号线差分地发送数据信号。 信号线的一部分可以在发射机之间共享，其他信号线不需要在发射机之间共享。

公开(公告)号：US07681309B2

公开(公告)日：2010-03-23

申请号：US11090613

申请日：2005-03-25

申请人： Charles A. Miller

发明人： Charles A. Miller

IPC分类号： H05K3/20

CPC分类号： H01L23/13 ,  H01L23/49811 ,  H01L23/5385 ,  H01L25/0652 ,  H01L2224/05571 ,  H01L2224/05573 ,  H01L2224/1134 ,  H01L2224/13099 ,  H01L2224/16 ,  H01L2224/16225 ,  H01L2924/00013 ,  H01L2924/00014 ,  H01L2924/01019 ,  H01L2924/01078 ,  H01L2924/15312 ,  H01L2924/1532 ,  H01L2924/16152 ,  H01L2924/19107 ,  H01L2924/3011 ,  H05K7/1092 ,  Y10T29/49126 ,  Y10T29/4913 ,  Y10T29/49147 ,  Y10T29/49149 ,  Y10T29/53174 ,  Y10T29/53178 ,  H01L2224/05599

摘要： A method is disclosed that can be used to interconnect an integrated circuit (IC) multiple die assembly to conductors on a substrate such that signals can be conveyed between the dies and the conductors on the substrate. The multiple die assembly can include a first IC die and at least one secondary IC die, which can be mounted on a surface of the first IC die. Signal paths can be provided between the first IC die and the secondary IC die. The method can include providing conductive contacts on the surface of the first IC die. Each such conductive contact can have a free end extending outward from the surface beyond the secondary IC die. The method can also include mounting the multiple die assembly on the substrate such that the free end of each contact is brought into contact with the conductors on the substrate. The secondary IC die can reside between the surface of the first IC die and the substrate, and the contacts can convey signals between the first IC die and the conductors on the substrate.

摘要翻译： 公开了一种可用于将集成电路（IC）多管芯组件与衬底上的导体互连的方法，使得可以在管芯和衬底上的导体之间传送信号。 多个模具组件可以包括第一IC管芯和至少一个次级IC管芯，其可安装在第一IC管芯的表面上。 可以在第一IC芯片和次级IC芯片之间提供信号路径。 该方法可以包括在第一IC芯片的表面上提供导电触点。 每个这样的导电接触件可以具有从表面超出次级IC管芯向外延伸的自由端。 该方法还可以包括将多个模具组件安装在基板上，使得每个接触件的自由端与基板上的导体接触。 次级IC芯片可以位于第一IC芯片的表面和基板之间，并且触点可以在第一IC芯片和基板上的导体之间传送信号。

公开(公告)号：US20100039739A1

公开(公告)日：2010-02-18

申请号：US12606788

申请日：2009-10-27

申请人： Bruce J. Barbara ,  Charles A. Miller

发明人： Bruce J. Barbara ,  Charles A. Miller

IPC分类号： H02H9/00

CPC分类号： G01R1/36 ,  G01R31/2889

摘要： A fault detection and protection circuit can include a comparing circuit (e.g., a comparator or a detector) that can be connected to a power line supplying power to an electronic device being tested. The comparing circuit can be configured to detect a fault in which the power line is shorted to ground. For example, the electronic device being tested may have a fault in which its power terminals are shorted to ground. Upon detection of such a fault, the comparing circuit activates one or more switches that shunt capacitors or other energy storage devices on the power line to ground. The comparing circuit may alternatively or in addition activate one or more switches that disconnect the power supply supplying power to the electronic device under test from probes contacting the electronic device.

摘要翻译： 故障检测和保护电路可以包括比较电路（例如，比较器或检测器），其可以连接到向所测试的电子设备供电的电力线。 比较电路可以被配置为检测电力线短路到地的故障。 例如，被测试的电子设备可能具有其电源端子短路到地的故障。 在检测到这种故障时，比较电路激活将电力线上的电容器或其他能量存储装置分流到地的一个或多个开关。 比较电路可以替代地或者另外激活一个或多个开关，该开关断开供给被测试的电子设备的电源与接触电子设备的探针的电源。

公开(公告)号：US20090267627A1

公开(公告)日：2009-10-29

申请号：US12498862

申请日：2009-07-07

申请人： Charles A. Miller

发明人： Charles A. Miller

IPC分类号： G01R1/067 ,  G01R19/00

CPC分类号： G01R31/2889 ,  G01R1/07342

摘要： A probe card assembly can comprise an interface, which can be configured to receive from a tester test signals for testing an electronic device. The probe card assembly can further comprise probes for contacting the electronic device and electronic driver circuits for driving the test signals to ones of the probes.

摘要翻译： 探针卡组件可以包括接口，其可以被配置为从测试仪接收测试用于测试电子设备的信号。 探针卡组件还可以包括用于接触电子设备的探针和用于将测试信号驱动到探针中的探针的电子驱动器电路。

公开(公告)号：US07609080B2

公开(公告)日：2009-10-27

申请号：US11306186

申请日：2005-12-19

申请人： Charles A. Miller ,  Bruce J. Barbara

发明人： Charles A. Miller ,  Bruce J. Barbara

IPC分类号： G01R31/26

CPC分类号： G01R1/36 ,  G01R31/2889

摘要： A fault detection and protection circuit can include a comparing circuit (e.g., a comparator or a detector) that can be connected to a power line supplying power to an electronic device being tested. The comparing circuit can be configured to detect a fault in which the power line is shorted to ground. For example, the electronic device being tested may have a fault in which its power terminals are shorted to ground. Upon detection of such a fault, the comparing circuit activates one or more switches that shunt capacitors or other energy storage devices on the power line to ground. The comparing circuit may alternatively or in addition activate one or more switches that disconnect the power supply supplying power to the electronic device under test from probes contacting the electronic device.

摘要翻译： 故障检测和保护电路可以包括比较电路（例如，比较器或检测器），其可以连接到向所测试的电子设备供电的电力线。 比较电路可以被配置为检测电力线短路到地的故障。 例如，被测试的电子设备可能具有其电源端子短路到地的故障。 在检测到这种故障时，比较电路激活将电力线上的电容器或其他能量存储装置分流到地的一个或多个开关。 比较电路可以替代地或者另外激活一个或多个开关，该开关断开供给被测试的电子设备的电源与接触电子设备的探针的电源。

公开(公告)号：US07540465B1

公开(公告)日：2009-06-02

申请号：US11243145

申请日：2005-10-04

申请人： Charles A. Miller ,  Roger L. Miller

发明人： Charles A. Miller ,  Roger L. Miller

IPC分类号： F16M13/00 ,  F16H7/14

CPC分类号： F16H7/14 ,  F16F15/073

摘要： A motor mount for a motor that drives an endless belt for a vibratory apparatus has a platform on which the motor is attached. The platform is supported on a base by a pivoting connection so that the platform rotates about an axis that is parallel to the motor shaft. Spring tension is applied to the belt drive by a leaf spring bias between the platform and the base at a distance from the pivotal connection.

摘要翻译： 用于驱动用于振动装置的环形带的电动机的电动机支架具有安装有电动机的平台。 平台通过枢转连接支撑在基座上，使得平台围绕平行于电机轴的轴线旋转。 弹簧张力通过平台和基座之间的板簧偏压在与枢转连接相距一定距离处施加到皮带传动装置。