Abstract:
A test device and method may be used to detect voltage, current or signals of a digital multilevel memory cell system or to test operation or performance by applying inputted voltages, currents or signals to the memory cell system.
Abstract:
The invention presents a chipset for a mobile wallet system in a communication terminal having a SIM socket and a RFID antenna. The chipset includes a wallet module and a controller module. The wallet module has a contactless interface port coupled to the RFID antenna and a wallet memory for storing wallet applications. The controller module, connected to the SIM socket of the communication terminal, has a controller memory stored with SIM function software, mobile wallet application software and software to control the wallet module. The controller module is powered through the SIM socket, and the wallet module is powered through the SIM socket and the RFID antenna.
Abstract:
A local oscillator (LO) buffer circuit comprises first and second LO buffers arranged in a cross coupled configuration. The first LO buffer generates in-phase output signals in response to in-phase input signals, and quadrature output signals from the second LO buffer. The second LO buffer generates the quadrature output signals in response to quadrature input signals and the in-phase output signals. The LO buffers may include inductive loads. The LO buffers may include MOS transistors or bipolar junction transistors.
Abstract:
A memory system includes a sense amplifier for detecting content of data memory cells by comparison with a voltage stored in a reference cell. The sense amplifier may comprise a comparator, first and second load circuits, and a low impedance circuit. A first input of the comparator is coupled to the low impedance circuit and a reference voltage node. A second input of the comparator is coupled to a data voltage node. The first load circuit loads a reference cell coupled to the reference voltage node. The second load circuit loads a data cell coupled to the data voltage node.
Abstract:
An amplifier circuit comprises a detection power input circuit for receiving an RF signal, and a bias circuit that includes an output for generating a bias signal in response to a reference control voltage. The power detector further comprises a detection circuit for generating a power control voltage having a voltage characteristic that offsets temperature characteristics of the received RF signal. The amplifier circuit further comprises a power amplifier coupled to the bias circuit. The power amplifier includes a driver stage providing the RF signal. The detection circuit compensates temperature variation of the inputted detection voltage of the received RF signal.
Abstract:
A USB switching device can selectively connect between a removable card and a mobile wireless communication device and a computer. The removable card has a first port; the mobile wireless communicating device has a second port while the computer has a third port. The switching device comprises a first full duplex switch having an input and a first output and a second output, and a select port for switching the connection of the input to the first output and the connection of the input to the second output. The switching device further comprises a second full duplex switch having an input and a first output and a second output, and a select port for switching the connection of the input to the first output and the connection of the input to the second output. The switching device further comprises a third full duplex switch having an input and a first output and a second output, and a select port for switching the connection of the input to the first output and the connection of the input to the second output. The input of the first switch is connected to the first port. The input of the second switch is connected to the second port. The input of the third switch is connected to the third port. The first output of the first switch is connected to the second output of the second switch. The second output of the first switch is connected to the first output of the third switch. Finally, the first output of the second switch is connected to the second output of the third switch.
Abstract:
A memory system includes memory cells arranged in sectors. A decoder corresponding to a sector disables memory cells having a defective top gate. The decoder may include a low voltage or high voltage latch for the disabling. A top gate handling algorithm is included. The memory system may include dynamic top gate coupling. A programming algorithm and waveforms with top gate handling is included.
Abstract:
A memory device, and method of making and operating the same, including a substrate of semiconductor material of a first conductivity type, first and second spaced apart regions in the substrate of a second conductivity type with a channel region therebetween, an electrically conductive floating gate having a first portion disposed over and insulated from the channel region and a second portion disposed over and insulated from the first region and including a sharpened edge, an electrically conductive P/E gate having a first portion disposed over and insulated from the first region and a second portion extending up and over the floating gate second portion and insulated therefrom by a first layer of insulation material, and an electrically conductive select gate having a first portion disposed laterally adjacent to the floating gate and disposed over and insulated from the channel region.
Abstract:
A non-volatile memory device has an array of non-volatile memory cells, a first plurality of non-volatile memory reference cells, with each reference cell capable of being programmed to a reference level different from the other reference cells; and a second plurality of comparators. Each of the comparators is connectable to one of the first plurality of non-volatile memory reference cells and to one of a third plurality of memory cells from among the array of non-volatile memory cells.
Abstract:
A method of trimming down the volume of a semiconductor resistor element using electrical resistance feedback. After forming conductive material disposed between a pair of electrodes, a voltage is applied to the electrodes to produce an electrical current through the conductive material sufficient to heat and melt away a portion of the conductive material. By reducing the volume of the conductive material, its resistance is increased. The application of the voltage is ceased once the desired dimensions (and thus resistivity) of the conductive material is reached. The resulting semiconductor resistor element could have a fixed resistance, or could have a variable resistance (by using phase change memory material).