DIFFUSION TEMPERATURE SHOCK MONITOR
    123.
    发明申请

    公开(公告)号:US20180358248A1

    公开(公告)日:2018-12-13

    申请号:US16005499

    申请日:2018-06-11

    CPC classification number: H01L21/67248 G01K3/005 G01K3/04 G01K7/01 G01K13/00

    Abstract: A temperature shock monitor includes a solvent material and a diffusion material. An energy barrier between the solvent material and the diffusion material is selected to be lower than is would conventionally be used in semiconductor devices such that the diffusion material diffuses into the solvent material when exposed to a temperature above a designated temperature threshold. At a later time, electrical parameters of the temperature shock monitor that change based on the amount of diffusion of the diffusion material into the solvent material allows one to determine whether the temperature shock monitor was exposed to a temperature above the temperature threshold.

    Measurement system
    125.
    发明授权

    公开(公告)号:US11193803B2

    公开(公告)日:2021-12-07

    申请号:US16262579

    申请日:2019-01-30

    Abstract: Various examples are directed to systems and methods for managing a sensor. A measurement system may receive, from a host device, a first register map describing a first configuration of a measurement system. The first configuration may be associated with a first sensor. The measurement system may compare the first register map to an error rule set indicating inconsistent register map arrangements. After comparing the first register map to the error rule set, the measurement system may configure a switch matrix of the measurement system to sample the first sensor according to the first configuration of the measurement system. The measurement system may receive a plurality of samples from a first sensor and generate first digital measurement data based at least in part on the plurality of samples.

    CIRCUITS, SYSTEMS, AND METHODS FOR PROVIDING ASYNCHRONOUS SAMPLE RATE CONVERSION FOR AN OVERSAMLPING SIGMA DELTA ANALOG TO DIGITAL CONVERTER

    公开(公告)号:US20210194497A1

    公开(公告)日:2021-06-24

    申请号:US16074356

    申请日:2017-02-01

    Abstract: A variable output data rate converter circuit preferably meets performance requirements while keeping the circuit complexity low. In some embodiments, the converter circuit may include an oversampling sigma delta modulator circuit to quantize an analog input signal at an oversampled rate, and output an sigma delta modulated signal, a transposed polynomial decimator circuit to decimate the sigma delta modulated signal, and output a first decimated signal, and an integer decimator circuit to decimate the first decimated signal by an integer factor and output a second decimated signal having a desired output data rate. The transposed polynomial decimator circuit has a transposed polynomial filter circuit and a digital phase locked loop circuit, which tracks a ratio between a sampling rate of the first decimated signal and the oversampled rate, and outputs an intersample position parameter to the transposed polynomial filter circuit.

    Magnetic sensor systems
    127.
    发明授权

    公开(公告)号:US10955493B2

    公开(公告)日:2021-03-23

    申请号:US16294192

    申请日:2019-03-06

    Abstract: A calibration apparatus for calibrating a magnetic sensor configured to generate an output signal indicative of magnetic field strength when a bias signal is applied to it is disclosed. The apparatus includes a test magnetic field generator (MFG) to generate magnetic fields of known magnitude, and further includes a processor to control the MFG to generate a known magnetic field, control the sensor to generate a test output signal when the MFG generates the known magnetic field and a known bias signal is applied to the sensor, and determine how to change the bias signal based on a deviation of the measured test output signal from an expected output signal. Using a test MFG that produces known magnetic fields when known bias signals are applied to sensors allows evaluating and compensating for changes in sensitivity of the sensors by accordingly changing bias signals applied to the sensors.

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