Method for setting a reference voltage for read operations

    公开(公告)号:US11495321B2

    公开(公告)日:2022-11-08

    申请号:US17387335

    申请日:2021-07-28

    摘要: Methods, systems, and devices for method for setting a reference voltage for read operations are described. A memory device may perform a first read operation on a set of memory cells using a first reference voltage and detect a first codeword based on performing the first read operation using the first reference voltage. The memory device may compare a first quantity of bits of the first codeword having a first logic value (e.g., a logic value ‘1’) with an expected quantity of bits having the first logic value (e.g., the expected quantity of logic value ‘1’s stored by the set of memory cells). The memory device may determine whether to perform a second read operation on the set of memory cells using a second reference voltage different than the first reference voltage (e.g., greater or less than the first reference voltage) based on the comparing.

    Storage device including power supply circuit and method of operating storage device

    公开(公告)号:US11495320B2

    公开(公告)日:2022-11-08

    申请号:US17169643

    申请日:2021-02-08

    摘要: A storage device includes a power supply circuit that receives a power disable signal from a host device and provides a first internal voltage and a second internal voltage, a non-volatile memory including a memory device, and a storage controller that controls the non-volatile memory and includes a processor that performs a data recovery operation on data stored in the memory device and a host interface that communicates with the host device. When the power disable signal is activated at a power off time, the storage controller is powered off, the power supply circuit interrupts the first internal voltage and the second internal voltage during a reference time following the power off time, and provides the first internal voltage to the processor after the reference time has elapsed following the power off time.

    Memory system, memory controller, and method for operating memory system performing integrity check operation on target code when voltage drop is detected

    公开(公告)号:US11495319B2

    公开(公告)日:2022-11-08

    申请号:US17162544

    申请日:2021-01-29

    申请人: SK hynix Inc.

    发明人: Jeen Park

    摘要: Embodiments of the present disclosure relate to a memory system, a memory controller, and a method of operating the memory system. According to embodiments of the present disclosure, a memory system may perform an integrity check operation on target code when information indicating whether a supply voltage supplied to a memory system is maintained at or below a first level for a first unit time is received from a voltage drop detector configured to sense a level of the supply voltage. Accordingly, the memory system is capable of minimizing the time of operation in the state in which a bit-flip occurs and preventing a problem in which irrecoverable data is recorded in a memory device due to malfunction of firmware.

    APPARATUSES, SYSTEMS, AND METHODS FOR ERROR CORRECTION

    公开(公告)号:US20220351800A1

    公开(公告)日:2022-11-03

    申请号:US17813079

    申请日:2022-07-18

    IPC分类号: G11C29/42 G11C7/10 G11C8/12

    摘要: Apparatuses, systems, and methods for error correction. A memory device may have a number of memory cells each of which stores a bit of information. A first latch may hold the encoded bit and provide it as a write parity bit to the memory array as part of a write operation. A second latch may hold a parity bit read from the memory array and the ECC circuit may generate a command signal based on that parity bit. A multiplexer latch may hold the encoded bit and provide a syndrome bit based on the command signal and the encoded bit. The syndrome bit may indicate if there is mismatch between the parity bit and the encoded bit. The logic which handles generating the syndrome bit may be separated from the logic tree.

    ON-THE-FLY PROGRAMMING AND VERIFYING METHOD FOR MEMORY CELLS BASED ON COUNTERS AND ECC FEEDBACK

    公开(公告)号:US20220351758A1

    公开(公告)日:2022-11-03

    申请号:US17748866

    申请日:2022-05-19

    摘要: The present invention relates to a method of operating memory cells, comprising reading a previous user data from the memory cells; writing a new user data and merging the new user data with the previous user data into write registers; generating mask register information, and wherein the mask register information indicates bits of the previous user data stored in the memory cells to be switched or not to be switched in their logic values; counting numbers of a first logic value and a second logic value to be written using the mask register information, respectively; storing the numbers of the first logic value and the second logic value into a first counter and a second counter, respectively; and applying a programming pulse to the memory cells according to the mask register information.

    STORAGE DEVICE AND OPERATING METHOD THEREOF

    公开(公告)号:US20220336036A1

    公开(公告)日:2022-10-20

    申请号:US17502590

    申请日:2021-10-15

    申请人: SK hynix Inc.

    IPC分类号: G11C29/42 G11C29/44 G11C29/12

    摘要: A storage device includes a memory device and a memory controller. The memory device stores a history read table including root bit information, read voltage information, and error bit information on each of a plurality of memory blocks, and performs a read operation of reading data stored in the plurality of memory blocks based on the history read table. When the read operation fails, a memory controller changes a level of a read voltage, and controls the memory device to perform a read retry operation of retrying the read operation by using the changed read voltage. When the read retry operation passes, the memory controller determines whether the history read table is to be updated by comparing the root bit information of the read retry operation with the root bit information of the history read table.

    ADAPTIVE DSP GENERATION OF READ THRESHOLDS FOR GAUSSIAN AND NON-GAUSSIAN DISTRIBUTIONS IN SOLID STATE STORAGE USING CUMULATIVE OBSERVED COUNTS

    公开(公告)号:US20220328121A1

    公开(公告)日:2022-10-13

    申请号:US17737781

    申请日:2022-05-05

    发明人: Yingquan Wu

    摘要: A level count disparity is determined based at least in part on: (1) an expected count of a plurality of cells in solid state storage and (2) an observed count of the plurality of cells in the solid state storage, where the observed count is associated with a number of cells in the solid state storage that are activated by performing a single read on the solid state storage using a previous read threshold. A next read threshold is determined, including by: determining a direction relative to the previous read threshold based at least in part on the level count disparity and independent of the second and earlier level count disparity; and determining a magnitude based at least in part on the level count disparity and the second and earlier level count disparity. Read data is obtained using the next read threshold and error correction decoding is performed.