公开(公告)号：US20060071682A1

公开(公告)日：2006-04-06

申请号：US11061379

申请日：2005-02-18

Applicant: Yoshihiro Hashimoto

Inventor： Yoshihiro Hashimoto

IPC: G01R31/36

CPC classification number: G01R31/31924 ,  G01R31/3004

Abstract: A current measuring apparatus for measuring a power supply current received by an electronic device includes: a first current supplying unit for outputting a first current which is a part of the power supply current; a smoothing capacitor for smoothing the first current output by the first current supplying unit connected with one end thereof; a capacitor of device side for smoothing the power supply current, electrostatic capacity of the capacitor of device side being smaller than that of the smoothing capacitor and one end of the capacitor of device side being connected with the electronic device; a switch for making the first current flow from the smoothing capacitor to the capacitor of device side in case of being ON; a second current supplying unit for outputting a second current smaller than the first current to the capacitor of device side via a path parallel to the switch; and a power supply current acquiring unit for acquiring the power supply current on the basis of the second current output by the second current supplying unit.

Abstract translation: 用于测量由电子设备接收的电源电流的电流测量装置包括：第一电流供应单元，用于输出作为电源电流的一部分的第一电流; 平滑电容器，用于平滑与其一端连接的第一电流供应单元的第一电流输出; 用于平滑电源电流的器件侧电容器，器件侧的电容器的静电电容小于平滑电容器的电容器的静电电容，并且器件侧的电容器的一端与电子器件连接; 用于在导通时使从平滑电容器到器件侧的电容器的第一电流流动的开关; 第二电流供应单元，用于经由平行于开关的路径将小于第一电流的第二电流输出到装置侧的电容器; 以及电源电流获取单元，用于基于由第二电流供应单元输出的第二电流来获取电源电流。

公开(公告)号：US06975978B1

公开(公告)日：2005-12-13

申请号：US09699077

申请日：2000-10-27

Applicant: Masahiro Ishida ,  Takahiro Yamaguchi ,  Yoshihiro Hashimoto

Inventor： Masahiro Ishida ,  Takahiro Yamaguchi ,  Yoshihiro Hashimoto

IPC: G01R31/28 ,  G01R31/30 ,  G01R31/3183 ,  G06F11/22 ,  G06F17/50 ,  G01R31/26

CPC classification number: G01R31/318342 ,  G01R31/3004

Abstract: A test pattern sequence is generated (101), then a logic simulation of the operation of an IC under test in the case of applying each test pattern of the test pattern sequence, and a logic signal value sequence occurring in each signal line of the IC under test (102). The logic signal value sequence in each signal line is used to register in a fault list parts (a logic gate, signal line or signal propagation path) in which a fault (a delay fault or an open fault) detectable by a transient power supply current testing using the test pattern sequence is likely to occur (103).

Abstract translation: 产生测试图案序列（101），然后在应用测试图案序列的每个测试图案的情况下进行测试中的IC的操作的逻辑模拟，以及出现在IC的每个信号线中的逻辑信号值序列 被测试（102）。 每个信号线中的逻辑信号值序列用于寄存在故障列表部分（逻辑门，信号线或信号传输路径）中，其中由瞬态电源电流检测到的故障（延迟故障或开路故障） 可能发生使用测试图案序列的测试（103）。

公开(公告)号：US20050264810A1

公开(公告)日：2005-12-01

申请号：US11082652

申请日：2005-03-18

Applicant: Susumu Saito ,  Yoshihiro Hashimoto

Inventor： Susumu Saito ,  Yoshihiro Hashimoto

IPC: G01N15/02 ,  G01N15/14 ,  G01N21/00 ,  G01N21/94

CPC classification number: G01N15/0211 ,  G01N15/1456 ,  G01N21/94 ,  G01N2015/025 ,  G01N2015/1493

Abstract: A particle monitoring device includes a light source for emitting a measurement light; and a light projecting/receiving unit, connected to a depressurized vessel of a processing apparatus, for projecting the emitted measurement light into the depressurized vessel and receiving a scattered light from a particle floating in the depressurized vessel. The light projecting/receiving unit is disposed such that the scattered light is received substantially parallel to the measurement light. The particle monitoring device further includes a received light intensity detection unit. The received light intensity detection unit has a received light intensity detection unit for determining whether or not the detected intensity is greater than a predetermined value and an instruction unit for instructing the processing apparatus to start, continue or stop a processing operation of the processing apparatus depending on the determined result.

Abstract translation: 粒子监测装置包括用于发射测量光的光源; 以及与处理装置的减压容器连接的光投射/接收单元，用于将发射的测量光投射到减压容器中并接收来自浮动在减压容器中的颗粒的散射光。 光投射/接收单元被布置成使得散射光基本上平行于测量光被接收。 粒子监测装置还包括接收光强检测单元。 所接收的光强检测单元具有接收光强检测单元，用于确定检测强度是否大于预定值;以及指令单元，用于指示处理设备启动，继续或停止处理设备的处理操作依赖 对确定的结果。

公开(公告)号：US20050206829A1

公开(公告)日：2005-09-22

申请号：US11077216

申请日：2005-03-11

Applicant: Yoshihiro Hashimoto ,  Hidehiko Yamaguchi ,  Takashi Iwamoto ,  Takayuki Hayano ,  Naoshi Yamada ,  Toshihide Tsubata

Inventor： Yoshihiro Hashimoto ,  Hidehiko Yamaguchi ,  Takashi Iwamoto ,  Takayuki Hayano ,  Naoshi Yamada ,  Toshihide Tsubata

IPC: G02F1/1339 ,  G02F1/1335 ,  G02F1/1343

CPC classification number: G02F1/1343 ,  G02F1/133514 ,  G02F1/13394

Abstract: A liquid crystal display device of the present invention is one in which unevenness of display, spots generated due to lowering of voltage retention because of impurity ions are sufficiently eliminated and reliability of long-time/long-term use is improved. A liquid crystal display device of the present invention is one comprising a first substrate and a second substrate configured via a liquid crystal layer and a seal, wherein at least one of the first substrate and the second substrate comprises, towards the liquid crystal layer, a color filter layer, a transparent electrode and an alignment layer in this order and at least one of the transparent electrode and the alignment layer covers the color filter layer in a non-display region.

Abstract translation: 本发明的液晶显示装置是由于杂质离子而由于降低电压保持而产生的显示的不均匀性，并且长时间/长期使用的可靠性得到改善。 本发明的液晶显示装置是包括经由液晶层和密封构成的第一基板和第二基板的液晶显示装置，其中第一基板和第二基板中的至少一个朝向液晶层包括一个 滤色器层，透明电极和取向层，透明电极和取向层中的至少一个在非显示区域覆盖滤色器层。

公开(公告)号：US06756774B2

公开(公告)日：2004-06-29

申请号：US09936739

申请日：2002-01-02

Applicant: Yoshihiro Hashimoto

Inventor： Yoshihiro Hashimoto

IPC: G05F140

CPC classification number: H03H7/06

Abstract: A constant voltage source includes a constant voltage supplying circuit including an operational amplifier for supplying an output voltage to a load and a feedback circuit for feeding back the output voltage to the operational amplifier; a first inductance unit disposed between the constant voltage supplying circuit and the load; and a first bypass capacitor of which one terminal is coupled between the first inductance unit and the load and the other terminal is coupled to a constant voltage unit. The constant voltage source further includes a compensation circuit including a second resistor, a second inductance unit and a second bypass capacitor, one end of each of the second resistor, the second inductance unit and the second bypass capacitor being coupled to each other, wherein the other end of the second resistor is coupled to an end of the first inductance unit near the constant voltage supplying circuit, the other end of the second inductance unit is coupled to a load side end of the first inductance unit and the other end of the second bypass capacitor is coupled to the constant voltage unit.

Abstract translation: 恒压源包括：恒压供给电路，包括用于向负载提供输出电压的运算放大器和用于将输出电压反馈到运算放大器的反馈电路; 设置在恒压供给电路和负载之间的第一电感单元; 以及第一旁路电容器，其中一个端子耦合在第一电感单元和负载之间，另一个端子耦合到恒定电压单元。 恒压源还包括补偿电路，该补偿电路包括第二电阻器，第二电感单元和第二旁路电容器，第二电阻器，第二电感单元和第二旁路电容器中的每一个的一端彼此耦合，其中， 第二电阻器的另一端耦合到靠近恒压供应电路的第一电感单元的一端，第二电感单元的另一端耦合到第一电感单元的负载侧端，而第二电感单元的另一端 旁路电容器耦合到恒压单元。

公开(公告)号：US06255839B1

公开(公告)日：2001-07-03

申请号：US09208363

申请日：1998-12-10

Applicant: Yoshihiro Hashimoto

Inventor： Yoshihiro Hashimoto

IPC: G01R3126

CPC classification number: G01R31/31924 ,  G01R31/3004 ,  G01R31/31935

Abstract: An IC tester in which a voltage applied type current measuring circuit can be omitted is provided. A current detecting resistance element 21 is inserted into and in series with the output side of a driver 13 which is used in performing a function test for an IC, and a switch 41 is connected in parallel with the resistance element 21. In case of a function test, the switch 41 is turned on, and in case of measuring an input leakage current of a CMOS.IC 11, the switch 41 is turned off, and thereafter, switches 42 and 43 are sequentially turned on one after another to detect a voltage at each end of the resistance element 21 by an analog-to-digital converter 45. This procedure is performed for each of I/O blocks 12-1 to 12-n corresponding to pins of the CMOS.IC, and then, the difference between the detected voltages at the both ends of the resistance element 21 in each block is taken to find the presence/absence and/or the magnitude of the input leakage current.

Abstract translation: 提供了可以省略电压施加型电流测量电路的IC测试器。 电流检测电阻元件21被插入驱动器13的输出侧并且与驱动器13的输出侧串联，该驱动器13用于对IC执行功能测试，并且开关41与电阻元件21并联连接。在 功能测试中，开关41接通，在测量CMOS.IC11的输入漏电流的情况下，开关41断开，此后开关42和43依次依次接通，以检测出 通过模数转换器45在电阻元件21的每一端处施加电压。对与CMOS.IC的引脚相对应的I / O块12-1至12-n中的每一个执行该过程，然后， 取每个块中的电阻元件21的两端的检测电压之间的差异来求出输入漏电流的有无和/或大小。

公开(公告)号：US06223686B1

公开(公告)日：2001-05-01

申请号：US09474849

申请日：1999-12-30

Applicant: Masayasu Suzuki ,  Noritaka Akita ,  Yoshihiro Hashimoto

Inventor： Masayasu Suzuki ,  Noritaka Akita ,  Yoshihiro Hashimoto

IPC: C23C1600

CPC classification number: H01J37/32192 ,  C23C16/511 ,  H01J37/32678 ,  H01J37/32935

Abstract: A substrate to be coated with a thin film is placed inside a vacuum chamber, an ECR plasma is generated and introduced into the vacuum chamber by means of a specified magnetic field generated inside the vacuum chamber and a reaction gas, as well as an inert gas, is introduced into the vacuum chamber while a negative DC voltage superposed with a high-frequency pulse with frequency 25-250 kHz is applied to the substrate by a voltage applying device such that the voltage of the substrate reaches a positive value instantaneously. The frequency of the superposed pulse is selected by using an ammeter to determine an optimum frequency for minimizing the load current of the voltage-applying circuit.

Abstract translation: 将要涂覆薄膜的基板放置在真空室内，产生ECR等离子体并通过在真空室内产生的规定磁场和反应气体以及惰性气体将其引入真空室 被引入真空室中，同时通过电压施加装置将叠加有频率为25-250kHz的高频脉冲的负DC电压施加到衬底上，使得衬底的电压瞬时达到正值。 通过使用电流表来选择叠加脉冲的频率，以确定用于最小化施加电压的负载电流的最佳频率。

公开(公告)号：US5981238A

公开(公告)日：1999-11-09

申请号：US841663

申请日：1997-04-30

Applicant: Makoto Kaneko ,  Yoshihiro Hashimoto ,  Takakazu Endo ,  Mami Kato ,  Wataru Mizunashi

Inventor： Makoto Kaneko ,  Yoshihiro Hashimoto ,  Takakazu Endo ,  Mami Kato ,  Wataru Mizunashi

IPC: C12P13/04 ,  C12P13/20

CPC classification number: C12P13/04

Abstract: A process for producing an optically active aminopolycarboxylic acid, such as S,S-ethylenediamine-N,N'-disuccinic acid, from a mixture of a diamine, such as ethylenediamine, with fumaric acid using a microorganism having a lyase activity, wherein at least one metal ion selected from the group consisting of an alkaline earth metal, iron, zinc, copper, nickel, aluminum, titanium and manganese is added to the reaction system. According to this process, aminopolycarboxylic acids, such as S,S-ethylenediamine-N,N'-disuccinic acid, or metal complexes thereof, can be appropriately and efficiently produced while improving the reaction yield.

Abstract translation: 使用具有裂解酶活性的微生物从二胺（例如乙二胺）与富马酸的混合物制备光学活性氨基多羧酸如S，S-乙二胺-N，N'-二琥珀酸的方法，其中在 将至少一种选自碱土金属，铁，锌，铜，镍，铝，钛和锰的金属离子加入到反应体系中。 根据该方法，可以在提高反应收率的同时，适当且有效地制造氨基多元羧酸，如S，S-乙二胺-N，N'-二琥珀酸或其金属络合物。

公开(公告)号：US5594359A

公开(公告)日：1997-01-14

申请号：US459318

申请日：1995-06-02

Applicant: Yoshihiro Hashimoto

Inventor： Yoshihiro Hashimoto

IPC: G01R31/26 ,  G01R1/28 ,  G01R19/00 ,  G01R31/30 ,  G01R31/319 ,  G05F1/618 ,  G01R31/28

CPC classification number: G01R31/31924 ,  G01R31/30

Abstract: A voltage generating circuit provides little fluctuation of voltage to an IC load when the dynamic character of the IC is tested. In order to achieve this aim, a resistance is inserted between a power supply line and a feedback circuit after the static character of the IC is tested, and a current supply is set to draw current from the connecting point of the inserted resistance. The current supply inversely decreases or increases the amount of current drawn based upon the increment or the decrement of load current which flows through the inserted resistance.

Abstract translation: 当测试IC的动态特性时，电压产生电路对IC负载的电压波动很小。 为了实现该目的，在测试了IC的静态特性之后，在电源线和反馈电路之间插入电阻，并且设定电流源以从插入的电阻的连接点抽出电流。 电流根据流过插入电阻的负载电流的增量或减小而反向减小或增加所拉取的电流量。

公开(公告)号：US4526627A

公开(公告)日：1985-07-02

申请号：US613485

申请日：1984-05-24

Applicant: Hitoshi Iwata ,  Yoshihiro Hashimoto ,  Katsuhiko Yamada

Inventor： Hitoshi Iwata ,  Yoshihiro Hashimoto ,  Katsuhiko Yamada

IPC: C21D8/08 ,  C21D1/60 ,  C21D9/573 ,  C21D1/64

CPC classification number: C21D9/5732 ,  C21D1/60

Abstract: A method and apparatus for the direct heat treatment of medium- to high-carbon steel rods which provides an increased tensile strength and drawability by subjecting hot-rolled steel rods to controlled cooling with a coolant. Expanded spiral coils of hot-rolled medium- to high-carbon steel rod having an austenitic structure and which is continuously transported in a generally horizontal direction is cooled by passing the spiral coils through a vessel containing a coolant of a gas bubble-water mixed fluid under a strong turbulent action. The coolant fluid contains a uniform dispersion of oxidizing gas bubbles and is maintained at a temperature of not higher than 95.degree. C. Preferably, the coolant is caused to flow in the same direction as the direction of movement of the coil in the vessel. The surface of the rod may be oxidized by allowing it to cool in air before it is immersed in the coolant fluid.

Abstract translation: 一种用于直接热处理中高碳钢棒的方法和设备，其通过使热轧钢棒用冷却剂进行控制冷却来提供增加的拉伸强度和拉伸性。 具有奥氏体结构且在大致水平方向上连续输送的热轧中高碳钢棒的膨胀螺旋线圈通过使螺旋线圈穿过容纳气泡水混合流体的冷却剂的容器而被冷却 在强烈的动荡之下。 冷却剂流体包含均匀的氧化气泡分散体，并保持在不高于95℃的温度。优选地，使冷却剂沿与容器中的线圈的移动方向相同的方向流动。 杆的表面可以在空气中冷却之前被浸入冷却剂流体中而被氧化。