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公开(公告)号：US20240159999A1
公开(公告)日：2024-05-16
申请号：US18539243
申请日：2023-12-13
Applicant: Essenlix Corporation
Inventor： Stephen Y. Chou , Wei Ding , Ji Qi , Yuechang Zhang , Wu Chou , Mingquan Wu , Xing Li , Jun Tian
IPC: G02B21/34 , G01N33/543
CPC classification number: G02B21/34 , G01N33/54386 , G01N33/5094 , G01N2496/05
Abstract: A method of assaying an analyte in a sample is disclosed. The method includes having a sample holder with a sample contact area for contacting a sample with an analyte, having a plurality of calibration structures on the sample contact area of the sample holder, imaging a part of the sample contact area that has the calibration structures, and using an algorithm that includes an image, calibration structures in the image, and artificial intelligence and/or machine learning to identify the analyte and/or determine the analyte concentration.
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公开(公告)号：US11593590B2
公开(公告)日：2023-02-28
申请号：US17431345
申请日：2020-11-25
Applicant: Essenlix Corporation
Inventor： Xing Li , Wu Chou , Stephen Y. Chou , Wei Ding
Abstract: The present disclosure relates to devices, apparatus and methods of improving the accuracy of image-based assay, that uses imaging system having uncertainties or deviations (imperfection) compared with an ideal imaging system. One aspect of the present invention is to add the monitoring marks on the sample holder, with at least one of their geometric and/optical properties of the monitoring marks under predetermined and known, and taking images of the sample with the monitoring marks, and train a machine learning model using the images with the monitoring mark.
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公开(公告)号：US11415504B2
公开(公告)日：2022-08-16
申请号：US17175585
申请日：2021-02-12
Applicant: Essenlix Corporation
Inventor： Stephen Y. Chou , Wei Ding , Ji Qi , Jun Tian , Wu Chou
Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between two plates.
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公开(公告)号：US20220148177A1
公开(公告)日：2022-05-12
申请号：US17616178
申请日：2020-06-02
Applicant: Essenlix Corporation
Inventor： Wu Chou , Hongbing Li , Susan Y. Sun , Xing Li , Wei Ding , Stephen Y. Chou
Abstract: Among other things, the present invention provides devices and methods that stain a sample simply (e.g. one step) and quickly (e.g.
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公开(公告)号：US20200033579A1
公开(公告)日：2020-01-30
申请号：US16526864
申请日：2019-07-30
Applicant: Essenlix Corporation
Inventor： Stephen Y. Chou , Wei Ding , Ji Qi , Yuechang Zhang , Wu Chou , Mingquan Wu , Xing Li , Jun Tian
IPC: G02B21/34 , G01N33/543
Abstract: A method of assaying an analyte in a sample is disclosed. The method includes having a sample holder with a sample contact area for contacting a sample with an analyte, having a plurality of calibration structures on the sample contact area of the sample holder, imaging a part of the sample contact area that has the calibration structures, and using an algorithm that includes an image, calibration structures in the image, and artificial intelligence and/or machine learning to identify the analyte and/or determine the analyte concentration.
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Patent Agency Ranking
公开(公告)号：US12007320B2
公开(公告)日：2024-06-11
申请号：US18215302
申请日：2023-06-28
Applicant: Essenlix Corporation
Inventor： Stephen Y. Chou , Wu Chou , Xing Li , Hongbing Li , Yuecheng Zhang , Mingquan Wu , Wei Ding , Jun Tian
CPC classification number: G01N15/1433 , G06N20/00 , G06T7/0012 , G06T7/10 , G06T7/40 , G06T7/62 , G06T2207/10056 , G06T2207/30004 , G06T2207/30024 , G06T2207/30204
Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.
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公开(公告)号：US11885952B2
公开(公告)日：2024-01-30
申请号：US16526864
申请日：2019-07-30
Applicant: Essenlix Corporation
Inventor： Stephen Y. Chou , Wei Ding , Ji Qi , Yuecheng Zhang , Wu Chou , Mingquan Wu , Xing Li , Jun Tian
IPC: G02B21/34 , G01N33/543 , G01N33/50
CPC classification number: G02B21/34 , G01N33/54386 , G01N33/5094 , G01N2496/05
Abstract: A method of assaying an analyte in a sample is disclosed. The method includes having a sample holder with a sample contact area for contacting a sample with an analyte, having a plurality of calibration structures on the sample contact area of the sample holder, imaging a part of the sample contact area that has the calibration structures, and using an algorithm that includes an image, calibration structures in the image, and artificial intelligence and/or machine learning to identify the analyte and/or determine the analyte concentration.
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公开(公告)号：US11719618B2
公开(公告)日：2023-08-08
申请号：US17268847
申请日：2019-08-28
Applicant: Essenlix Corporation
Inventor： Stephen Y. Chou , Wei Ding , Wu Chou , Jun Tian , Yuecheng Zhang , Mingquan Wu , Xing Li
IPC: G01N15/14 , G02B21/34 , G06T7/00 , G06V10/34 , G06V10/44 , G06V20/69 , G06F18/2413 , G06V10/764 , G06V10/82 , G01N15/10
CPC classification number: G01N15/1475 , G02B21/34 , G06F18/24143 , G06T7/0012 , G06V10/34 , G06V10/44 , G06V10/454 , G06V10/764 , G06V10/82 , G06V20/69 , G01N2015/1006 , G06T2207/30004
Abstract: One aspect of the present invention is to provide systems and methods that improve the accuracy of an assay that comprise at least one or more parameters each having a random error.
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公开(公告)号：US11674883B2
公开(公告)日：2023-06-13
申请号：US17565115
申请日：2021-12-29
Applicant: Essenlix Corporation
Inventor： Stephen Y. Chou , Wei Ding , Wu Chou , Jun Tian , Yuecheng Zhang , Mingquan Wu , Xing Li
CPC classification number: G01N15/1484 , G01N1/2813 , G06N3/08 , G06N20/00 , G06T1/0014 , G01N2001/282
Abstract: The present invention is related to correct the errors in instruments, operation, and others using intelligent monitoring structures and machine learning, and others.
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公开(公告)号：US20220341842A1
公开(公告)日：2022-10-27
申请号：US17858931
申请日：2022-07-06
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wei DING , Ji QI , Jun Tian , Wu Chou
Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.
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