公开(公告)号：US09290971B2

公开(公告)日：2016-03-22

申请号：US14009389

申请日：2012-02-28

申请人： Toyohisa Amagai ,  Kinji Hoshikawa ,  Hiromu Inoue

发明人： Toyohisa Amagai ,  Kinji Hoshikawa ,  Hiromu Inoue

IPC分类号： E05B85/12 ,  E05B79/20 ,  E05B53/00 ,  E05B79/06 ,  E05B79/22

CPC分类号： E05B85/12 ,  E05B53/003 ,  E05B79/06 ,  E05B79/20 ,  E05B79/22 ,  E05B85/13

摘要： A door device for a vehicle includes a cable for connecting a handle device and a lock unit. A cable holding member mounted to the handle device is displaced between an engagement position in which the cable holding member engages with the cable and a non-engagement position in which the cable holding member does not engage with the cable. A contact portion of a door panel is configured such that when the handle device is being mounted to the door panel, the contact portion contacts the cable holding member in the non-engagement position and interferes with the assembly of the handle device to the door panel and the contact portion does not contact the cable holding member in the engagement position.

摘要翻译： 用于车辆的门装置包括用于连接手柄装置和锁定单元的电缆。 安装到手柄装置的电缆保持构件在电缆保持构件与电缆接合的接合位置和电缆保持构件不与电缆接合的非接合位置之间移动。 门板的接触部分被构造成使得当把手装置被安装到门板时，接触部分在非接合位置处接触电缆保持构件并且妨碍把手装置的组件到门板 并且接触部分在接合位置不接触电缆保持构件。

公开(公告)号：US07394048B2

公开(公告)日：2008-07-01

申请号：US11679411

申请日：2007-02-27

申请人： Hiromu Inoue ,  Tomohide Watanabe ,  Satoshi Endo ,  Masami Ikeda

发明人： Hiromu Inoue ,  Tomohide Watanabe ,  Satoshi Endo ,  Masami Ikeda

IPC分类号： G02B7/04

CPC分类号： G03F7/70641

摘要： A focusing device comprises a first imaging optical system, a second imaging optical system which splits the optical image in the direction of an AF sensor and further splits the optical image so that a front focus image in which the point that is in focus is in front of the optical image on the inspecting sensor and a back focus image in which the point that is in focus is behind the optical image on the inspecting sensor are formed on the AF sensor, a focus detecting circuit which detects an optimum focus position on the basis of a high-frequency component of a front sensor image in a front focus position and a high-frequency component of a back sensor image in a back focus position, and a focus control circuit which controls the focusing of the first imaging optical system on the basis of the focus position.

摘要翻译： 聚焦装置包括第一成像光学系统，第二成像光学系统，其在AF传感器的方向上分割光学图像，并进一步分割光学图像，使得其中焦点点在前面的前焦点图像 在AF传感器上形成检查传感器上的光学图像的背焦点图像和焦点上的焦点位于检测传感器上的光学图像之后的焦点检测电路，该焦点检测电路基于检测传感器的最佳聚焦位置 在前焦点位置处的前传感器图像的高频分量和后聚焦位置中的背传感器图像的高频分量的焦点控制电路，以及控制第一成像光学系统的聚焦在 基础的焦点位置。

公开(公告)号：US4922166A

公开(公告)日：1990-05-01

申请号：US338372

申请日：1989-04-12

申请人： Koji Ichida ,  Yoshifumi Nakayama ,  Hiromu Inoue

发明人： Koji Ichida ,  Yoshifumi Nakayama ,  Hiromu Inoue

IPC分类号： H01J29/50

CPC分类号： H01J29/503

摘要： An electron gun arrangement for color cathode-ray tubes comprising three cathodes for emitting electron beams, for example, for red, green and blue, and a main electron lens comprising three front electron lenses corresponding to the cathodes, respectively, and a back electron lens common to all the cathodes. Each front electron lens is formed with an aperture smaller than that of the back electron lens and is mounted so as to meet Fraunhofer conditions so that aberration is reduced. Electron beam transmitting apertures are formed in the grids forming the front electron lenses, respectively, with the respective center axes thereof parallel to each other, which makes it easy to manufacture the electron gun arrangement and enables accurate machining during manufacturing.

摘要翻译： 一种用于彩色阴极射线管的电子枪装置，包括用于发射例如红色，绿色和蓝色的电子束的三个阴极和分别包含对应于阴极的三个前部电子透镜的主电子透镜和一个背面电子透镜 对所有阴极是共同的。 每个前电子透镜形成有比后电子透镜小的孔，并且安装成满足弗劳恩霍夫条件，从而减小像差。 电子束透射孔分别形成在形成前电子透镜的栅格中，其各自的中心轴彼此平行，这使得容易制造电子枪装置并且能够在制造期间进行精确的机械加工。

公开(公告)号：US09036896B2

公开(公告)日：2015-05-19

申请号：US13083157

申请日：2011-04-08

申请人： Takanao Touya ,  Shuichi Tamamushi ,  Hidenori Sato ,  Hiroyuki Tanizaki ,  Takeshi Fujiwara ,  Eiji Sawa ,  Kentaro Okuda ,  Hiroyuki Ikeda ,  Hiromu Inoue ,  Hiroshi Tsukada

发明人： Takanao Touya ,  Shuichi Tamamushi ,  Hidenori Sato ,  Hiroyuki Tanizaki ,  Takeshi Fujiwara ,  Eiji Sawa ,  Kentaro Okuda ,  Hiroyuki Ikeda ,  Hiromu Inoue ,  Hiroshi Tsukada

IPC分类号： G06K9/00 ,  G06T7/00

CPC分类号： G06T7/001 ,  G01N21/9501 ,  G01N21/9503 ,  G01N21/956 ,  G06T7/0004 ,  G06T7/0006 ,  G06T7/70 ,  G06T7/74 ,  G06T2207/10004 ,  G06T2207/30141 ,  G06T2207/30148

摘要： A method and system for imaging an object to be inspected and obtaining an optical image; creating a reference image from design pattern data; preparing an inspection recipe including one or more templates and parameter settings necessary for the inspection; checking the pattern and the template against each other, and selecting the reference image which corresponds to the template; detecting first and second edges in the selected reference image in accordance with the parameter setting using determined coordinates as a reference; detecting first and second edges in the optical image, this optical image corresponds to the selected reference image; and determining an inspection value by acquiring the difference between the line width of the optical image and the reference image using the first edge and second edge of the reference image and the first edge and second edges of the optical image.

摘要翻译： 一种用于对待检查对象进行成像并获得光学图像的方法和系统; 从设计模式数据创建参考图像; 准备包括一个或多个模板和检查所需的参数设置的检查配方; 检查图案和模板，并选择与模板对应的参考图像; 根据使用确定的坐标作为参考的参数设置来检测所选参考图像中的第一和第二边缘; 检测光学图像中的第一和第二边缘，该光学图像对应于所选择的参考图像; 以及通过使用参考图像的第一边缘和第二边缘以及光学图像的第一边缘和第二边缘获取光学图像的线宽和参考图像之间的差来确定检查值。

公开(公告)号：US08761518B2

公开(公告)日：2014-06-24

申请号：US13183792

申请日：2011-07-15

申请人： Hiromu Inoue ,  Takeshi Fujiwara ,  Hiroshi Tsukada ,  Takashi Hirano

发明人： Hiromu Inoue ,  Takeshi Fujiwara ,  Hiroshi Tsukada ,  Takashi Hirano

IPC分类号： G06K9/48

CPC分类号： G01N21/95607 ,  G03F1/84

摘要： According to one embodiment, a pattern inspection apparatus includes a first inspection data creation section, a first delay section, a first recognition section, a first extraction section, a first and a second level difference calculation section, a first and a second determination section, and a first logic OR calculation section. The first extraction section extracts data of a sub-resolution pattern from the first inspection data and the first delay data. The first and second level difference calculation section calculate differences between an average output level of a surrounding region for a target pixel of the extracted data from the first inspection data or the first delay data and an output level of the extracted data. The first and second determination sections determine presence or absence of a defect. The first logic OR calculation section calculates logic OR of determination results of the first and second determination sections.

摘要翻译： 根据一个实施例，图案检查装置包括第一检查数据创建部，第一延迟部，第一识别部，第一提取部，第一和第二等级差计算部，第一和第二判定部， 和第一逻辑或计算部分。 第一提取部分从第一检查数据和第一延迟数据提取子分辨率图案的数据。 第一和第二电平差计算部分计算来自第一检查数据或第一延迟数据的提取数据的目标像素的周围区域的平均输出电平与提取的数据的输出电平之间的差。 第一和第二确定部分确定缺陷的存在或不存在。 第一逻辑或计算部分计算第一和第二确定部分的确定结果的逻辑或。

公开(公告)号：US20060257756A1

公开(公告)日：2006-11-16

申请号：US11478650

申请日：2006-07-03

申请人： Katsuki Ohashi ,  Hiromu Inoue ,  Akira Ono ,  Hiroyuki Ikeda

发明人： Katsuki Ohashi ,  Hiromu Inoue ,  Akira Ono ,  Hiroyuki Ikeda

IPC分类号： G03F1/00 ,  G06K9/00 ,  G03C5/00

CPC分类号： G03F7/70058 ,  G01N21/956 ,  G01N2021/95676 ,  G03F1/72 ,  G03F1/84 ,  Y10S430/146

摘要： A method for inspecting a photomask, comprising generating a laser beam, changing a phase of the laser beam to smooth the brightness distribution of the laser beam, applying the smoothed laser beam to the photomask, acquiring an image of the photomask using a sensor while the laser beam and the photomask are relatively moved, examining the image of the photomask for a defect of the mask-pattern of the photomask.

公开(公告)号：US5574800A

公开(公告)日：1996-11-12

申请号：US294510

申请日：1994-08-23

申请人： Hiromu Inoue ,  Kentaro Okuda

发明人： Hiromu Inoue ,  Kentaro Okuda

IPC分类号： G01B11/24 ,  G01N21/88 ,  G01N21/93 ,  G01N21/956 ,  G06K9/00

CPC分类号： G01N21/95607

摘要： The pattern edge direction in reference image data of an object to be examined is detected, the reference image data is differentiated using a differential operator in a direction along the pattern edge direction, and inspection image data obtained by picking up an image of the object to be inspected is differentiated using the differential operator in the direction along the pattern edge direction. The differential data obtained by the differential processing are compared with the inspection image data, and a pattern defect on the object to be inspected is detected based on the difference between these data.

摘要翻译： 检测被检查物体的参照图像数据中的图形边缘方向，使用差分算子在沿着图案边缘方向的方向上对参考图像数据进行微分，并且通过将对象的图像拾取而获得的检查图像数据 在沿图案边缘方向的方向上使用微分算子进行检查。 通过差分处理获得的差分数据与检查图像数据进行比较，并且基于这些数据之间的差异检测待检查对象上的图案缺陷。

公开(公告)号：US5204025A

公开(公告)日：1993-04-20

申请号：US681899

申请日：1991-04-08

申请人： Kimiko Yamada ,  Katuyosi Yada ,  Hiromu Inoue ,  Yousui Nemoto

发明人： Kimiko Yamada ,  Katuyosi Yada ,  Hiromu Inoue ,  Yousui Nemoto

IPC分类号： C08G59/00 ,  C08G59/28 ,  C08G59/32 ,  C08K3/08 ,  C08L63/00 ,  H01B1/22 ,  H05K1/09 ,  H05K9/00

CPC分类号： H05K1/095 ,  C08G59/28 ,  C08G59/3227 ,  C08K3/08 ,  C08L63/00 ,  H01B1/22

摘要： A conductive paste composition is described, which comprises an epoxy resin having a diglycidylamino group, a resol type phenol curing agent, and copper powder. The paste composition exhibits excellent moisture resistance and adhesion and provides a cured film of high conductivity level.

摘要翻译： 描述了一种导电糊剂组合物，其包含具有二缩水甘油氨基的环氧树脂，甲阶酚醛型酚固化剂和铜粉。 糊剂组合物表现出优异的耐湿性和粘合性，并提供高导电率的固化膜。

公开(公告)号：US07466854B2

公开(公告)日：2008-12-16

申请号：US11197501

申请日：2005-08-05

申请人： Eiji Sawa ,  Hiromu Inoue

发明人： Eiji Sawa ,  Hiromu Inoue

IPC分类号： G06K9/00 ,  G06K9/48 ,  G06K9/68 ,  H04N7/18 ,  G06F15/00

CPC分类号： G06T7/0006 ,  G01B11/028 ,  G01B11/2433 ,  G06K9/4638 ,  G06T2207/30148

摘要： A pair of edges that are located at ends as viewed in the widthwise direction of a design pattern are recognized. On the basis of the edge direction in which the paired edges are recognized, edge points on the design pattern are detected as sub-pixels. The widthwise dimension of the design pattern is calculated on the basis of the edge points. In addition, the widthwise dimension of a circuit pattern is calculated at the same position as the widthwise dimension of the design pattern. On the basis of the calculated widthwise dimensions, the semiconductor wafer circuit pattern is checked.

摘要翻译： 识别位于设计图案的宽度方向上观察的端部处的一对边缘。 基于识别成对边缘的边缘方向，设计图案上的边缘点被检测为子像素。 基于边缘点计算设计图案的宽度尺寸。 此外，在与设计图案的宽度尺寸相同的位置处计算电路图案的宽度尺寸。 基于计算出的宽度方向尺寸，检查半导体晶片电路图案。

公开(公告)号：US20080055606A1

公开(公告)日：2008-03-06

申请号：US11771456

申请日：2007-06-29

申请人： Hiromu Inoue ,  Tomohide Watanabe ,  Ryoji Yoshikawa

发明人： Hiromu Inoue ,  Tomohide Watanabe ,  Ryoji Yoshikawa

IPC分类号： G01B9/02

CPC分类号： G01N21/95607

摘要： An apparatus for inspecting a pattern, including: at least one of a first floodlight system for inspection by transmissive light and a second floodlight system for inspection by reflective light; an inspection optical system for capturing an image of the pattern on an object under inspection; and a stage for mounting and moving the object under inspection. The one of the first floodlight system and the second floodlight system includes a diffracted light control means for enhancing light diffracted by the pattern.

摘要翻译： 一种用于检查图案的装置，包括：用于通过透射光检查的第一泛光灯系统和用于通过反射光检查的第二泛光灯系统中的至少一个; 检查光学系统，用于捕获被检查物体上的图案的图像; 以及用于安装和移动被检查物体的台架。 第一泛光灯系统和第二泛光灯系统中的一个包括用于增强由图案衍射的光的衍射光控制装置。