摘要:
A plasmonic display device is provided with liquid crystal dipole molecule control. The device is made from a first set of electrodes including at least one electrically conductive top electrode and at least one electrically conductive bottom electrode capable of generating a first electric field in a first direction. A second set of electrodes, including an electrically conductive right electrode and an electrically conductive left electrode, is capable of generating a second electric field in a second first direction. A dielectric layer overlies the bottom electrode, made from a liquid crystal material with molecules having dipoles responsive to an electric field. A plasmonic layer, including a plurality of discrete plasmonic particles, is interposed between the first and second set of electrodes and in contact with the dielectric layer. In one aspect, the plasmonic layer is embedded in the dielectric layer.
摘要:
A method is provided for fabricating a semiconductor nanoparticle embedded Si insulating film for short wavelength luminescence applications. The method provides a bottom electrode, and deposits a semiconductor nanoparticle embedded Si insulating film, including the element of N, O, or C, overlying the bottom electrode. After annealing, a semiconductor nanoparticle embedded Si insulating film has a peak photoluminescence (PL) at a wavelength in the range of 475 to 750 nanometers.
摘要:
A method is provided for fabricating a semiconductor nanoparticle embedded Si insulating film for electroluminescence (EL) applications. The method provides a bottom electrode, and deposits a semiconductor nanoparticle embedded Si insulating film, including an element selected from a group consisting of N and C, overlying the bottom electrode. After annealing, a semiconductor nanoparticle embedded Si insulating film is formed having an extinction coefficient (k) in a range of 0.01-1.0, as measured at about 632 nanometers (nm), and a current density (J) of greater than 1 Ampere per square centimeter (A/cm2) at an applied electric field lower than 3 MV/cm. In another aspect, the annealed semiconductor nanoparticle embedded Si insulating film has an index of refraction (n) in a range of 1.8-3.0, as measured at 632 nm, with a current density of greater than 1 A/cm2 at an applied electric field lower than 3 MV/cm.
摘要翻译:提供了一种用于制造用于电致发光(EL)应用的半导体纳米颗粒嵌入的Si绝缘膜的方法。 该方法提供底部电极,并且沉积半导体纳米颗粒嵌入的Si绝缘膜,其包括选自N和C组成的组的元素,覆盖在底部电极上。 在退火之后,形成半导体纳米颗粒嵌入的Si绝缘膜,其消光系数(k)在0.01〜1.0的范围内,在大约632纳米(nm)测量,电流密度(J)大于1安培 在施加的电场低于3MV / cm下的平方厘米(A / cm 2)。 在另一方面,被退火的半导体纳米颗粒嵌入的Si绝缘膜的折射率(n)在632nm处测量的范围为1.8-3.0,在施加的电场下的电流密度大于1A / cm 2 低于3 MV / cm。
摘要:
A method is provided for fabricating a semiconductor nanoparticle embedded Si insulating film for electroluminescence (EL) applications. The method provides a bottom electrode, and deposits a semiconductor nanoparticle embedded Si insulating film, including an element selected from a group consisting of N and C, overlying the bottom electrode. After annealing, a semiconductor nanoparticle embedded Si insulating film is formed having an extinction coefficient (k) in a range of 0.01-1.0, as measured at about 632 nanometers (nm), and a current density (J) of greater than 1 Ampere per square centimeter (A/cm2) at an applied electric field lower than 3 MV/cm. In another aspect, the annealed semiconductor nanoparticle embedded Si insulating film has an index of refraction (n) in a range of 1.8-3.0, as measured at 632 nm, with a current density of greater than 1 A/cm2 at an applied electric field lower than 3 MV/cm.
摘要翻译:提供了一种用于制造用于电致发光(EL)应用的半导体纳米颗粒嵌入的Si绝缘膜的方法。 该方法提供底部电极,并且沉积半导体纳米颗粒嵌入的Si绝缘膜,其包括选自N和C组成的组的元素,覆盖在底部电极上。 在退火之后,形成半导体纳米颗粒嵌入的Si绝缘膜,其消光系数(k)在0.01〜1.0的范围内,在大约632纳米(nm)测量,电流密度(J)大于1安培 在施加的电场低于3MV / cm下的平方厘米(A / cm 2)。 在另一方面,被退火的半导体纳米颗粒嵌入的Si绝缘膜的折射率(n)在632nm处测量的范围为1.8-3.0,在施加的电场下的电流密度大于1A / cm 2 低于3 MV / cm。
摘要:
A switchable viewing angle display method is provided. The method provides a front panel array of display pixels. Also provided is an array of microlenses underlying the array of display pixels. Each microlens has a focal point and each microlens is associated with a corresponding block of display pixels. A backlight panel has an edge-coupled waveguide pipe with an optical input connected to a column of light emitting diodes (LEDs). The backlight panel includes a top array of selectively enabled extraction pixels, a planar mirror underlying the waveguide pipe, and a bottom array of selectively enabled extraction pixels interposed between the waveguide pipe and the planar mirror. In response to accepting a display viewing angle change command, an extraction pixel is enabled from either the top array or the bottom array, and a waveguide pipe light extraction position is formed, changing the viewing angle.
摘要:
A switchable viewing angle display method is provided, using arrayed microlenses and a waveguide pipe with selectable light extraction positions. The method provides a front panel array of display pixels. Also provided is an array of microlenses underlying the array of display pixels. Each microlens has a focal point and each microlens is associated with a corresponding block of display pixels. A backlight panel has an edge-coupled waveguide pipe with an optical input connected to a column of light emitting diodes (LEDs). The backlight panel includes an array extraction pixels, each extraction pixel underlying a corresponding microlens, and the backlight panel also includes a planar mirror underlying the waveguide pipe. In response to a display viewing angle change command, a waveguide pipe's light extraction position is selected, which is the distance between the extraction pixels and their corresponding microlenses, and the display viewing angle is changed.
摘要:
A scattering tunable display is provided that uses reflection and edge-lit waveguide transmission modes of illumination. A front panel is provided with an array of selectable display pixels arranged in a plurality of sequences. A backlight panel includes a plurality of edge-coupled waveguide pipes formed in a plurality of rows. Each waveguide pipe has an optical input connected to a corresponding light emitting diode (LED), and an optical output index-matched to a corresponding sequence of display pixels. A display pixel is enabled and ambient visible spectrum illumination is measured. In response to the measured ambient illumination being above a first minimum threshold, the display pixel is operated in a reflective illumination mode. In response to the measured ambient illumination being below the first minimum threshold, the display pixel is operated in a transmissive illumination mode.
摘要:
A method is provided for fabricating a high quantum efficiency silicon (Si) nanoparticle embedded SiOXNY film for luminescence (electroluminescence—EL and photoluminescence—PL) applications. The method provides a bottom electrode, and deposits a Si nanoparticle embedded non-stoichiometric SiOXNY film, where (X+Y 0), overlying the bottom electrode. The Si nanoparticle embedded SiOXNY film is annealed. The annealed Si nanoparticle embedded SiOXNY film has an extinction coefficient (k) of less than about 0.001 as measured at 632 nanometers (nm), and a PL quantum efficiency (PLQE) of greater than 20%.
摘要:
A method is provided for fabricating a high quantum efficiency silicon (Si) nanoparticle embedded SiOXNY film for luminescence (electroluminescence—EL and photoluminescence—PL) applications. The method provides a bottom electrode, and deposits a Si nanoparticle embedded non-stoichiometric SiOXNY film, where (X+Y 0), overlying the bottom electrode. The Si nanoparticle embedded SiOXNY film is annealed. The annealed Si nanoparticle embedded SiOXNY film has an extinction coefficient (k) of less than about 0.001 as measured at 632 nanometers (nm), and a PL quantum efficiency (PLQE) of greater than 20%.
摘要:
A method is provided for forming a silicon (Si) nanocrystal embedded Si oxide electroluminescence (EL) device with a mid-bandgap transition layer. The method provides a highly doped Si bottom electrode, and forms a mid-bandgap electrically insulating dielectric film overlying the electrode. A Si nanocrystal embedded SiOx film layer is formed overlying the mid-bandgap electrically insulating dielectric film, where X is less than 2, and a transparent top electrode overlies the Si nanocrystal embedded SiOx film layer. The bandgap of the mid-bandgap dielectric film is about half that of the bandgap of the Si nanocrystal embedded SiOx film. In one aspect, the Si nanocrystal embedded SiOx film has a bandgap (Eg) of about 10 electronvolts (eV) and mid-bandgap electrically insulating dielectric film has a bandgap of about 5 eV. By dividing the high-energy tunneling processes into two lower energy tunneling steps, potential damage due to high power hot electrons is reduced.