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公开(公告)号:US11106530B2
公开(公告)日:2021-08-31
申请号:US16723836
申请日:2019-12-20
Applicant: Micron Technology, Inc.
Inventor: Chun Sum Yeung , Falgun G. Trivedi , Harish Reddy Singidi , Xiangang Luo , Preston Allen Thomson , Ting Luo , Jianmin Huang
IPC: G06F11/10 , G06F12/02 , G06F12/0882 , G06F11/07
Abstract: A variety of applications can include apparatus and/or methods that provide parity data protection to data in a memory system for a limited period of time and not stored as permanent parity data in a non-volatile memory. Parity data can be accumulated in a volatile memory for data programmed via a group of access lies having a specified number of access lines in the group. A read verify can be issued to selected pages after programming finishes at the end of programming via the access lines of the group. With the programming of the data determined to be acceptable at the end of programming via the last of the access lines of the group, the parity data in the volatile memory can be discarded and accumulation can begin for a next group having a specified number of access lines. Additional apparatus, systems, and methods are disclosed.
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公开(公告)号:US20210175902A1
公开(公告)日:2021-06-10
申请号:US17181712
申请日:2021-02-22
Applicant: Micron Technology, Inc.
Inventor: Xiangang Luo , Ting Luo
Abstract: Devices and techniques for variable read throughput control in a storage device are described herein. Bits from can be received for a read that is one of several types assigned to reads. A low-density parity-check (LDPC) iteration maximum can be set based on the type. LDPC iterations can be performed up to the LDPC iteration maximum and a read failure signaled in response to the LDPC iterations reaching the LDPC iteration maximum.
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公开(公告)号:US20210151111A1
公开(公告)日:2021-05-20
申请号:US17158555
申请日:2021-01-26
Applicant: Micron Technology, Inc.
Inventor: Ting Luo , Kulachet Tanpairoj , Harish Reddy Singidi , Jianmin Huang , Preston Allen Thomson , Sebastien Andre Jean
Abstract: Disclosed in some examples are systems, methods, memory devices, and machine readable mediums for a fast secure data destruction for NAND memory devices that renders data in a memory cell unreadable. Instead of going through all the erase phases, the memory device may remove sensitive data by performing only the pre-programming phase of the erase process. Thus, the NAND doesn't perform the second and third phases of the erase process. This is much faster and results in data that cannot be reconstructed. In some examples, because the erase pulse is not actually applied and because this is simply a programming operation, data may be rendered unreadable at a per-page level rather than a per-block level as in traditional erases.
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公开(公告)号:US10996867B2
公开(公告)日:2021-05-04
申请号:US16506372
申请日:2019-07-09
Applicant: Micron Technology, Inc.
Inventor: Jianmin Huang , Kulachet Tanpairoj , Harish Reddy Singidi , Ting Luo
IPC: G06F3/06 , G06F12/02 , G06F12/1009 , G06F12/1027
Abstract: Devices and techniques for managing partial superblocks in a NAND device are described herein. A set of superblock candidates is calculated. Here, a superblock may have a set of blocks that share a same position in each plane in each die of a NAND array of the NAND device. A set of partial super block candidates is also calculated. A partial superblock candidate is a superblock candidate that has at least one plane that has a bad block. A partial superblock use classification may then be obtained. Superblocks may be established for the NAND device by using members of the set of superblock candidates after removing the set of partial superblock candidates from the set of superblock candidates. Partial superblocks may then be established for classes of data in the NAND device according to the partial superblock use classification.
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公开(公告)号:US10930352B2
公开(公告)日:2021-02-23
申请号:US16601275
申请日:2019-10-14
Applicant: Micron Technology, Inc.
Inventor: Xiangang Luo , Jianmin Huang , Jung Sheng Hoei , Harish Reddy Singidi , Ting Luo , Ankit Vinod Vashi
Abstract: Devices and techniques temperature sensitive NAND programming are disclosed herein. A device controller can receive a command to write data to a component of the device. A temperature can be obtained in response to the command, and the temperature can be combined with a temperature compensation value to calculate a verification level. The command can then be executed in accordance with the verification level.
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公开(公告)号:US10347329B2
公开(公告)日:2019-07-09
申请号:US15689989
申请日:2017-08-29
Applicant: Micron Technology, Inc.
Inventor: Sebastien Andre Jean , Ting Luo
CPC classification number: G11C11/5628 , G11C16/10 , G11C16/3418 , G11C16/3459 , G11C2211/5641
Abstract: Devices and techniques to reduce corruption of preloaded data during assembly are disclosed herein. A memory device can perform operations to store received data, including preloaded data, up to a threshold amount on a memory array in a reflow-protection mode, and to transition from the reflow-protection mode to a normal-operation mode after the initial data exceeds the threshold amount.
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公开(公告)号:US20190066775A1
公开(公告)日:2019-02-28
申请号:US15689989
申请日:2017-08-29
Applicant: Micron Technology, Inc.
Inventor: Sebastien Andre Jean , Ting Luo
CPC classification number: G11C11/5628 , G11C16/10 , G11C16/3418 , G11C16/3459 , G11C2211/5641
Abstract: Devices and techniques to reduce corruption of preloaded data during assembly are disclosed herein. A memory device can perform operations to store received data, including preloaded data, up to a threshold amount on a memory array in a reflow-protection mode, and to transition from the reflow-protection mode to a normal-operation mode after the initial data exceeds the threshold amount.
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公开(公告)号:US10163498B1
公开(公告)日:2018-12-25
申请号:US15689989
申请日:2017-08-29
Applicant: Micron Technology, Inc.
Inventor: Sebastien Andre Jean , Ting Luo
CPC classification number: G11C11/5628 , G11C16/10 , G11C16/3418 , G11C16/3459 , G11C2211/5641
Abstract: Devices and techniques to reduce corruption of preloaded data during assembly are disclosed herein. A memory device can perform operations to store received data, including preloaded data, up to a threshold amount on a memory array in a reflow-protection mode, and to transition from the reflow-protection mode to a normal-operation mode after the initial data exceeds the threshold amount.
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公开(公告)号:US12242734B2
公开(公告)日:2025-03-04
申请号:US18237668
申请日:2023-08-24
Applicant: Micron Technology, Inc.
IPC: G06F3/06
Abstract: A system comprises a memory device including a plurality of management units and a processing device. The processing device is operatively coupled with the memory device and configured to place the plurality of management units into a first protective state by erasing the plurality of management units, identify a cursor satisfying a cursor definition, identify a subset of the plurality of management units based on a location, on the memory device, referenced by the cursor, and place a selected management unit of the subset of the plurality of management units into a second protective state by programming a protective data pattern to the selected management unit.
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公开(公告)号:US12183407B2
公开(公告)日:2024-12-31
申请号:US17736902
申请日:2022-05-04
Applicant: Micron Technology, Inc.
Inventor: Umberto Siciliani , Tao Liu , Ting Luo , Dionisio Minopoli , Giuseppe D'Eliseo , Giuseppe Ferrari , Walter Di Francesco , Antonino Pollio , Luigi Esposito , Anna Scalesse , Allison J. Olson , Anna Chiara Siviero
Abstract: Methods, systems, and devices for setting switching for single-level cells (SLCs) are described. A memory system may receive an access command from a host. The access command may correspond to an SLC block or to a multiple-level cell block. If the access command corresponds to an SLC block, the memory system may modify the access command to include one or more bits indicating a setting to use for performing the access operation corresponding to the access command. The setting may define one or more operating parameters for performing the access operation. The memory system may use bits to indicate the setting that are used to indicate a page address for multiple-level cell blocks. The memory system may issue the access command to a memory device, which may perform the access operation using the setting indicated in the one or more bits included by the memory system.
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