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11.发明授权公开(公告)号：US10256563B2
公开(公告)日：2019-04-09
申请号：US15830127
申请日：2017-12-04
Applicant: Protochips, Inc.
Inventor： John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
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公开(公告)号：US20180203423A1
公开(公告)日：2018-07-19
申请号：US15919575
申请日：2018-03-13
Applicant: PROTOCHIPS, INC.
Inventor： Daniel S. Gardiner , John Damiano, JR. , David P. Nackashi , William Bradford Carpenter , James Rivenbark , Mark Uebel , Michael Zapata, III , Rebecca Thomas , Franklin Stampley Walden, II
CPC classification number: G05B9/02 , G01M3/3272 , G05D7/0635 , H01J37/18 , H01J37/20 , H01J2237/006 , H01J2237/182 , H01J2237/2002 , H01J2237/2007 , H01J2237/2802
Abstract: System and method for safely controlling the containment of gas within a manifold system and the delivery of gas to a sample holder for an electron microscope for imaging and analysis.
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13.发明申请公开(公告)号：US20180068827A1
公开(公告)日：2018-03-08
申请号：US15811911
申请日：2017-11-14
Applicant: Protochips, Inc.
Inventor： Daniel Stephen Gardiner , William Bradford Carpenter , John Damiano, JR. , Franklin Stampley Walden, II , David P. Nackashi
CPC classification number: H01J37/261 , G01K11/32 , G01L11/025 , G01L19/04 , H01J37/16 , H01J37/20 , H01J2237/2001 , H01J2237/2002 , H01J2237/2003 , H01J2237/206 , H01J2237/2801
Abstract: An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
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14.发明授权公开(公告)号：US09666409B2
公开(公告)日：2017-05-30
申请号：US15288239
申请日：2016-10-07
Applicant: Protochips, Inc.
Inventor： John Damiano, Jr. , David P. Nackashi , Stephen E. Mick
CPC classification number: H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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15.发明申请MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS OR LARGER CONDUCTIVE SAMPLES 审中-公开用于电子可流体流体储存器或较大导电样品的MEMS框架加热平台公开(公告)号：US20170062177A1
公开(公告)日：2017-03-02
申请号：US15253126
申请日：2016-08-31
Applicant: PROTOCHIPS, INC.
Inventor： Franklin Stampley Walden II , John Damiano, JR. , Daniel Stephen Gardiner , David P. Nackashi , William Bradford Carpenter
CPC classification number: H01J37/20 , H01J2237/2001 , H01J2237/2002 , H01J2237/2003
Abstract: A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.
Abstract translation: 一种加热装置，其具有图案化成坚固的MEMs基底的加热元件，其中加热元件与流体储存器或体导电样品电隔离，但足够靠近具有流体或样品的可成像窗口/区域，使得 样品通过传导加热。 加热装置可用于显微镜样品架，例如用于SEM，TEM，STEM，X射线同步加速器，扫描探针显微镜和光学显微镜。
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Patent Agency Ranking
16.发明授权Method for forming an electrical connection to an sample support in an electron microscope holder 有权在电子显微镜支架中与样品支架形成电连接的方法公开(公告)号：US09437393B2
公开(公告)日：2016-09-06
申请号：US14079223
申请日：2013-11-13
Applicant: PROTOCHIPS, INC.
Inventor： John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
CPC classification number: H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79
Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
Abstract translation: 用于电子显微镜样品架的电连接器。 电连接器为位于样品保持器中的样品支撑装置提供电接触，用于电气，温度和/或电化学控制。
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公开(公告)号：US20150129778A1
公开(公告)日：2015-05-14
申请号：US14513969
申请日：2014-10-14
Applicant: PROTOCHIPS, INC.
Inventor： David P. Nackashi , John Damiano, Jr. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
CPC classification number: H01J37/20 , G01N1/28 , H01J2237/2002 , H01J2237/2007 , H01J2237/2008 , H01J2237/202 , H01J2237/26
Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
Abstract translation: 用于插入电子显微镜的样品支撑装置的新型样品架。 本发明的新型样品保持器为样品支撑装置提供机械支撑，以及对试样或样品支撑装置的电接触。
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公开(公告)号：US20130146784A1
公开(公告)日：2013-06-13
申请号：US13758839
申请日：2013-02-04
Applicant: PROTOCHIPS, INC.
Inventor： David P. Nackashi , John Damiano, JR. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
IPC: H01J37/20
CPC classification number: H01J37/20 , G01N1/28 , H01J2237/2007 , H01J2237/2008
Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
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公开(公告)号：US20250029810A1
公开(公告)日：2025-01-23
申请号：US18778444
申请日：2024-07-19
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Joshua Friend , Katherine Marusak Stephens
IPC: H01J37/244 , H04N23/667
Abstract: Disclosed herein are methods and systems for selectively managing different temporal and/or spatial resolution images and metadata collected during a transmission electron microscope (TEM) session. The system includes a transmission electron microscope and a computer system communicatively coupled to the transmission electron microscope. The computer system includes memory, data storage, and at least one processor configured for continuously receiving, from the transmission electron microscope, data captured at a lower temporal and/or spatial resolution and selectively receiving, from the transmission electron microscope, data captured at a higher temporal and/or spatial resolution.
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公开(公告)号：US12130858B2
公开(公告)日：2024-10-29
申请号：US18244587
申请日：2023-09-11
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Joshua Friend , Katherine Elizabeth Marusak
IPC: A61B6/00 , G06F16/51 , G06F16/535 , G06F16/538 , G06F16/58 , G06T1/00 , G06T7/20 , G06T11/60
CPC classification number: G06F16/535 , G06F16/51 , G06F16/538 , G06F16/5866 , G06T1/0007 , G06T7/20 , G06T11/60 , G06T2200/24 , G06T2207/10061
Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
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