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1.发明申请公开(公告)号：US20200043697A1
公开(公告)日：2020-02-06
申请号：US16653162
申请日：2019-10-15
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, JR. , Daniel Stephen Gardiner , David P. Nackashi , William Bradford Carpenter
Abstract: A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.
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公开(公告)号：US09818578B2
公开(公告)日：2017-11-14
申请号：US14626234
申请日：2015-02-19
Applicant: PROTOCHIPS, INC.
Inventor： Daniel Stephen Gardiner , William Bradford Carpenter , John Damiano, Jr. , Franklin Stampley Walden, II , David P. Nackashi
CPC classification number: H01J37/261 , G01K11/32 , G01L11/025 , G01L19/04 , H01J37/16 , H01J37/20 , H01J37/3178 , H01J2237/2001 , H01J2237/2002 , H01J2237/2801
Abstract: An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
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3.发明授权公开(公告)号：US10256563B2
公开(公告)日：2019-04-09
申请号：US15830127
申请日：2017-12-04
Applicant: Protochips, Inc.
Inventor： John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
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公开(公告)号：US20180203423A1
公开(公告)日：2018-07-19
申请号：US15919575
申请日：2018-03-13
Applicant: PROTOCHIPS, INC.
Inventor： Daniel S. Gardiner , John Damiano, JR. , David P. Nackashi , William Bradford Carpenter , James Rivenbark , Mark Uebel , Michael Zapata, III , Rebecca Thomas , Franklin Stampley Walden, II
CPC classification number: G05B9/02 , G01M3/3272 , G05D7/0635 , H01J37/18 , H01J37/20 , H01J2237/006 , H01J2237/182 , H01J2237/2002 , H01J2237/2007 , H01J2237/2802
Abstract: System and method for safely controlling the containment of gas within a manifold system and the delivery of gas to a sample holder for an electron microscope for imaging and analysis.
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5.发明申请公开(公告)号：US20180068827A1
公开(公告)日：2018-03-08
申请号：US15811911
申请日：2017-11-14
Applicant: Protochips, Inc.
Inventor： Daniel Stephen Gardiner , William Bradford Carpenter , John Damiano, JR. , Franklin Stampley Walden, II , David P. Nackashi
CPC classification number: H01J37/261 , G01K11/32 , G01L11/025 , G01L19/04 , H01J37/16 , H01J37/20 , H01J2237/2001 , H01J2237/2002 , H01J2237/2003 , H01J2237/206 , H01J2237/2801
Abstract: An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
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Patent Agency Ranking
6.发明申请MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS OR LARGER CONDUCTIVE SAMPLES 审中-公开用于电子可流体流体储存器或较大导电样品的MEMS框架加热平台公开(公告)号：US20170062177A1
公开(公告)日：2017-03-02
申请号：US15253126
申请日：2016-08-31
Applicant: PROTOCHIPS, INC.
Inventor： Franklin Stampley Walden II , John Damiano, JR. , Daniel Stephen Gardiner , David P. Nackashi , William Bradford Carpenter
CPC classification number: H01J37/20 , H01J2237/2001 , H01J2237/2002 , H01J2237/2003
Abstract: A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.
Abstract translation: 一种加热装置，其具有图案化成坚固的MEMs基底的加热元件，其中加热元件与流体储存器或体导电样品电隔离，但足够靠近具有流体或样品的可成像窗口/区域，使得 样品通过传导加热。 加热装置可用于显微镜样品架，例如用于SEM，TEM，STEM，X射线同步加速器，扫描探针显微镜和光学显微镜。
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7.发明授权Method for forming an electrical connection to an sample support in an electron microscope holder 有权在电子显微镜支架中与样品支架形成电连接的方法公开(公告)号：US09437393B2
公开(公告)日：2016-09-06
申请号：US14079223
申请日：2013-11-13
Applicant: PROTOCHIPS, INC.
Inventor： John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
CPC classification number: H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79
Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
Abstract translation: 用于电子显微镜样品架的电连接器。 电连接器为位于样品保持器中的样品支撑装置提供电接触，用于电气，温度和/或电化学控制。
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8.发明授权公开(公告)号：US11869744B2
公开(公告)日：2024-01-09
申请号：US17570481
申请日：2022-01-07
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , Daniel Stephen Gardiner , William Bradford Carpenter
CPC classification number: H01J37/20 , G01F1/34 , G05D7/0635 , H01J2237/006 , H01J2237/26
Abstract: A fluid metering system for gas independent pressure and flow control through an electron microscope sample holder includes: a pressure control system that supplies gas; an inlet line providing gas from the pressure control system to the sample holder; an outlet line receiving gas from the sample holder; and a variable leak valve that controls gas flow in the outlet line. The gas flows from an upstream tank of the pressure control system through the sample holder and variable leak valve to a downstream tank of the pressure control system due to the pressure difference of the two tanks as the variable leak valve meters flow in the outlet line. Flow rates are established by monitoring pressure changes at source and collection tanks of known volumes with gas independent pressure gauges. A method of directing the gas flow to a residual gas analyzer (RGA) is also presented.
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9.发明授权公开(公告)号：US10777380B2
公开(公告)日：2020-09-15
申请号：US16653162
申请日：2019-10-15
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , Daniel Stephen Gardiner , David P. Nackashi , William Bradford Carpenter
Abstract: A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.
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10.发明申请公开(公告)号：US20180097307A1
公开(公告)日：2018-04-05
申请号：US15830127
申请日：2017-12-04
Applicant: Protochips, Inc.
Inventor： John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
CPC classification number: H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79
Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
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