Bias circuit scheme for improved reliability in high voltage supply with low voltage device
    11.
    发明授权
    Bias circuit scheme for improved reliability in high voltage supply with low voltage device 有权
    偏压电路方案,用于提高低压电源的可靠性

    公开(公告)号:US07902904B2

    公开(公告)日:2011-03-08

    申请号:US12330828

    申请日:2008-12-09

    CPC classification number: G05F3/16

    Abstract: Disclosed is a bias circuit with a first resistor connected between the supply voltage and a feedback node. Resistors are connected in series between the feedback node and the reference supply voltage. The connections between the resistors define at least one bias voltage. A second resistor is connected between the feedback node and a first drain node. A first field-effect transistor has a first gate node, the first drain node, and a first source node. The gate node is connected to the first supply voltage. A second field-effect transistor has a second gate node, a second drain node, and a second source node. The second drain node is connected to the first source node. The second gate node is connected to the bias voltage. The second source node is connected to an output signal node. The output signal node capable of experiencing an overshoot voltage.

    Abstract translation: 公开了一种偏置电路,其中第一电阻器连接在电源电压和反馈节点之间。 电阻器连接在反馈节点和参考电源电压之间。 电阻之间的连接限定了至少一个偏置电压。 第二电阻器连接在反馈节点和第一漏极节点之间。 第一场效应晶体管具有第一栅极节点,第一漏极节点和第一源节点。 门节点连接到第一电源电压。 第二场效应晶体管具有第二栅极节点,第二漏极节点和第二源节点。 第二排水节点连接到第一源节点。 第二栅极节点连接到偏置电压。 第二源节点连接到输出信号节点。 输出信号节点能够经历过冲电压。

    Apparatus and method for employing cloning for software development
    12.
    发明申请
    Apparatus and method for employing cloning for software development 审中-公开
    使用克隆进行软件开发的装置和方法

    公开(公告)号:US20060200645A1

    公开(公告)日:2006-09-07

    申请号:US11073784

    申请日:2005-03-07

    Applicant: Pankaj Kumar

    Inventor: Pankaj Kumar

    CPC classification number: G06F8/36

    Abstract: The present invention provides a method and apparatus for employing cloning for creating hierarchies of artifacts needed for development of software. The present invention also applies to managing cloning for the maintenance and modification of software artifacts including tracking and propagating the changes to the artifacts. In accordance with the present invention, cloning is applied to create new artifacts.

    Abstract translation: 本发明提供了一种用于使用克隆来创建开发软件所需的伪像层次的方法和装置。 本发明还适用于管理用于维护和修改软件工件的克隆,包括跟踪和传播对工件的改变。 根据本发明,应用克隆来创建新的伪像。

    Processing out of order transactions for mirrored subsystems using a cache to track write operations
    16.
    发明授权
    Processing out of order transactions for mirrored subsystems using a cache to track write operations 有权
    处理使用高速缓存跟踪写入操作的镜像子系统的顺序事务

    公开(公告)号:US08909862B2

    公开(公告)日:2014-12-09

    申请号:US12495676

    申请日:2009-06-30

    CPC classification number: G06F11/1666 G06F11/20 G06F2201/82

    Abstract: Methods and apparatus relating to processing out of order transactions for mirrored subsystems. A first device (that is mirroring data from a second device) includes a cache to track out of order write operations prior to writing data from the write operations to memory. A register may be used to track the state of the cache in response to receipt of a special transaction, which may be a posted transaction or snapshot. The first devise transmits an acknowledgement of commitment of the data to memory once all cache entries, as recorded at a select point by the register, are emptied or otherwise invalidated. Devices may communicate via a peripheral component interconnect express (PCIe) interconnect, and may include a point-to-point or serial link. Various components may be on the same integrated circuit die. An uninterrupted power supply or batteries may supply power in response to a power failure.

    Abstract translation: 涉及处理镜像子系统的乱序事务的方法和装置。 第一设备(即来自第二设备的镜像数据)包括在从写入操作到存储器的数据写入之前跟踪故障写入操作的高速缓存。 可以使用寄存器来跟踪高速缓存的状态以响应特殊事务的接收,这可以是已发布的事务或快照。 一旦在寄存器的选择点处记录的所有缓存条目被清空或以其他方式被无效,则第一设备将数据承诺的确认传送到存储器。 设备可以通过外围组件互连快速(PCIe)互连进行通信,并且可以包括点到点或串行链路。 各种组件可以在相同的集成电路管芯上。 不间断的电源或电池可能会供电以响应电源故障。

    Impedance mismatch detection circuit
    17.
    发明授权
    Impedance mismatch detection circuit 有权
    阻抗失配检测电路

    公开(公告)号:US08803535B2

    公开(公告)日:2014-08-12

    申请号:US13171725

    申请日:2011-06-29

    CPC classification number: H03F3/45475 H03F2203/45594

    Abstract: A comparison circuit for detecting impedance mismatch between pull-up and pull-down devices in a circuit to be monitored includes a comparator operative to receive first and second signals and to generate, as an output, a third signal indicative of a difference between the first and second signals. A first signal generator is operative to generate the first signal indicative of a difference between reference pull-up and pull-down currents that is scaled by a prescribed amount. The reference pull-up current is indicative of a current flowing through at least one corresponding pull-up transistor device in the circuit to be monitored. The pull-down reference current is indicative of a current flowing through at least one corresponding pull-down transistor device in the circuit to be monitored. A second signal generator connected with the second input of the comparator is operative to generate the second signal as a reference voltage defining a prescribed impedance mismatch threshold associated with the circuit to be monitored.

    Abstract translation: 用于检测待监测电路中的上拉和下拉器件之间的阻抗失配的比较电路包括一个比较器,用于接收第一和第二信号,并产生一个第三信号,该第三信号指示第一和第二信号之间的差值 和第二信号。 第一信号发生器用于产生表示参考上拉和下拉电流之间的差的第一信号,该下拉电流被缩放规定量。 参考上拉电流指示流过待监测电路中的至少一个对应的上拉晶体管器件的电流。 下拉参考电流表示流过待监测电路中的至少一个对应的下拉晶体管器件的电流。 与比较器的第二输入端连接的第二信号发生器可操作以产生第二信号作为参考电压,该参考电压限定与待监视电路相关联的规定阻抗失配阈值。

    Engine catalyst diagnostics
    18.
    发明授权
    Engine catalyst diagnostics 有权
    发动机催化剂诊断

    公开(公告)号:US08800356B2

    公开(公告)日:2014-08-12

    申请号:US13247640

    申请日:2011-09-28

    Abstract: Embodiments for predicting catalyst function are disclosed. One example embodiment includes applying a set of parameter readings for a given sample to a support vector machine to generate a classification output, recording a plurality of classification outputs for a plurality of successive samples over a first duration, and indicating catalyst degradation if a threshold percentage of the classification outputs indicates degraded catalyst performance. In this way, catalyst degradation may be indicated using a simplified model that does not require extensive calibration.

    Abstract translation: 公开了用于预测催化剂功能的实施方案。 一个示例性实施例包括将给定样本的一组参数读数应用于支持向量机以产生分类输出,在第一持续时间内记录多个连续样本的多个分类输出,并且如果阈值百分比 的分类输出表明催化剂性能下降。 以这种方式,可以使用不需要大量校准的简化模型来指示催化剂降解。

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