Thin film transistor array panel and manufacturing method thereof
    18.
    发明授权
    Thin film transistor array panel and manufacturing method thereof 有权
    薄膜晶体管阵列面板及其制造方法

    公开(公告)号:US09263467B2

    公开(公告)日:2016-02-16

    申请号:US14466665

    申请日:2014-08-22

    Abstract: A thin film transistor array panel according to an exemplary embodiment of the present disclosure includes: an insulating substrate; a gate electrode disposed on the insulating substrate; a gate insulating layer disposed on the gate electrode; a semiconductor disposed on the gate insulating layer; a source electrode and a drain electrode disposed on the semiconductor; an ohmic contact layer disposed at an interface between at least one of the source and drain electrodes and the semiconductor. Surface heights of the source and drain electrodes different, while surface heights of the semiconductor and the ohmic contact layer are the same. The ohmic contact layer is made of a silicide of a metal used for the source and drain electrodes.

    Abstract translation: 根据本公开的示例性实施例的薄膜晶体管阵列面板包括:绝缘基板; 设置在所述绝缘基板上的栅电极; 设置在栅电极上的栅极绝缘层; 设置在所述栅极绝缘层上的半导体; 设置在半导体上的源电极和漏电极; 欧姆接触层设置在源电极和漏电极中的至少一个与半导体之间的界面处。 源极和漏极的表面高度不同,而半导体和欧姆接触层的表面高度相同。 欧姆接触层由用于源极和漏极的金属的硅化物制成。

    THIN FILM TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
    19.
    发明申请
    THIN FILM TRANSISTOR AND METHOD OF MANUFACTURING THE SAME 审中-公开
    薄膜晶体管及其制造方法

    公开(公告)号:US20150084035A1

    公开(公告)日:2015-03-26

    申请号:US14261935

    申请日:2014-04-25

    Abstract: A thin film transistor includes: a substrate; an oxide semiconductor layer disposed on the substrate; a source electrode and a drain electrode each connected to the oxide semiconductor layer and facing each other with respect to the oxide semiconductor layer; an insulating layer disposed on the oxide semiconductor layer; and a gate electrode disposed on the insulating layer. The insulating layer includes a first layer that includes silicon oxide (SiOx), a second layer that is a hydrogen blocking layer, and a third layer that includes silicon nitride (SiNx). The first, second and third layers are sequentially stacked.

    Abstract translation: 薄膜晶体管包括:基板; 设置在所述基板上的氧化物半导体层; 源电极和漏电极,各自连接到氧化物半导体层并且相对于氧化物半导体层彼此面对; 设置在所述氧化物半导体层上的绝缘层; 以及设置在所述绝缘层上的栅电极。 绝缘层包括包含氧化硅(SiOx)的第一层,作为氢阻挡层的第二层和包括氮化硅(SiNx)的第三层。 顺序堆叠第一层,第二层和第三层。

    THIN FILM TRANSISTOR AND MANUFACTURING METHOD THEREOF
    20.
    发明申请
    THIN FILM TRANSISTOR AND MANUFACTURING METHOD THEREOF 有权
    薄膜晶体管及其制造方法

    公开(公告)号:US20150069399A1

    公开(公告)日:2015-03-12

    申请号:US14249329

    申请日:2014-04-09

    CPC classification number: H01L29/7869 H01L29/66969 H01L29/78696

    Abstract: A thin film transistor includes: a first semiconductor layer; a second semiconductor layer disposed on the first semiconductor layer; and a pair of source region and drain region formed by doping both sides of the first semiconductor layer and the second semiconductor layer with impurities, and the source region includes a first source layer on the same plane as the first semiconductor layer and a second source layer on the same plane as the second semiconductor layer, and the drain region includes a first drain layer on the same plane as the first semiconductor layer and a second drain layer on the same plane as the second semiconductor layer, and only one of the first semiconductor layer and the second semiconductor layer is a transistor channel layer.

    Abstract translation: 薄膜晶体管包括:第一半导体层; 设置在所述第一半导体层上的第二半导体层; 以及通过用杂质掺杂第一半导体层和第二半导体层的两侧而形成的一对源区和漏区,源极区包括与第一半导体层在同一平面上的第一源极层和第二源极层 在与第二半导体层相同的平面上,漏区包括与第一半导体层相同的平面上的第一漏极层和与第二半导体层在同一平面上的第二漏极层,并且仅第一半导体 层,第二半导体层是晶体管沟道层。

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