Abstract:
In some embodiments, an analog-to-digital converter (ADC) comprises a loop filter configured to produce an error signal based on a difference between an analog input signal and a feedback signal. The ADC also comprises a main comparator set comprising one or more main comparators, the main comparator set configured to digitize the error signal and further configured to drive a main digital-to-analog converter (DAC). The ADC further comprises an auxiliary comparator set comprising a plurality of auxiliary comparators, the auxiliary comparator set configured to digitize the error signal when the ADC is in a runaway state and further configured to drive an auxiliary DAC to bring the error signal into a predetermined range.
Abstract:
In some embodiments, an analog-to-digital converter (ADC) comprises a loop filter configured to produce an error signal based on a difference between an analog input signal and a feedback signal. The ADC also comprises a main comparator set comprising one or more main comparators, the main comparator set configured to digitize the error signal and further configured to drive a main digital-to-analog converter (DAC). The ADC further comprises an auxiliary comparator set comprising a plurality of auxiliary comparators, the auxiliary comparator set configured to digitize the error signal when the ADC is in a runaway state and further configured to drive an auxiliary DAC to bring the error signal into a predetermined range.
Abstract:
In some embodiments, an analog-to-digital converter (ADC) comprises a loop filter configured to produce an error signal based on a difference between an analog input signal and a feedback signal. The ADC also comprises a main comparator set comprising one or more main comparators, the main comparator set configured to digitize the error signal and further configured to drive a main digital-to-analog converter (DAC). The ADC further comprises an auxiliary comparator set comprising a plurality of auxiliary comparators, the auxiliary comparator set configured to digitize the error signal when the ADC is in a runaway state and further configured to drive an auxiliary DAC to bring the error signal into a predetermined range.
Abstract:
An analog-to-digital conversion system and method includes, for example, a comparator for sampling an analogy quantity during a sampling period and for performing a series of bit-wise conversions on the sampled analog sample during a conversion period, where each bit-wise conversion occurs during a respective bit-wise conversion cycle in which successive bits of a sample are successively determined during a respective bit conversion cycle and in which a predetermined number of bit-wise conversions are to be performed. A clock generator is arranged for generating a clock signal for clocking the converter during the conversion period, wherein each bit conversion cycle includes a reset period having a first length and an amplification period having a second length, wherein one of the first and second lengths is dynamically selected.
Abstract:
A successive approximation analog-to-digital with an input for receiving an input analog voltage, and an amplifier with a first set of electrical attributes in a sample phase and a second set of electrical attributes, differing from the first set of electrical attributes, in a conversion phase.
Abstract:
A successive approximation analog-to-digital with an input for receiving an input analog voltage, and an amplifier with a first set of electrical attributes in a sample phase and a second set of electrical attributes, differing from the first set of electrical attributes, in a conversion phase.
Abstract:
A phase-locked loop (PLL) includes a state machine programmed to automatically produce a set of control signals to select a charge-pump current and integrating capacitance value to automatically adjust a loop bandwidth of the PLL. A charge-pump DAC generates a charge-pump current of magnitude controlled by the state machine control signals. An integrator integrates the charge-pump output current to produce an integrated charge-pump output signal. The integrator has a plurality of capacitors switchably selected by control signals from the state machine to produce an integrating capacitance value. A voltage controlled oscillator (VCO) produces a PLL output frequency in response to the integrated charge-pump output signal.
Abstract:
A temperature sensor uses a semiconductor device that has a known voltage drop characteristic that is proportional to absolute temperature (PTAT). A controllable current source is coupled to the semiconductor device and is operable to sequentially inject a bias current having a value I(bias) and fixed ratio N of I(bias) into the semiconductor device. A delta sigma analog to digital converter (ADC) has an input coupled to the semiconductor device. The delta sigma ADC is configured to sample and integrate a sequence of voltages pairs produced across the semiconductor device by repeatedly injecting an ordered sequence of selected bias currents into the semiconductor device. The ordered sequence of selected bias currents comprises M repetitions of (N×I(bias); I(bias)) and one repetition of (M×I(bias); M×N×I(bias)).
Abstract:
A successive approximation analog-to-digital with an input for receiving an input analog voltage, and an amplifier with a first set of electrical attributes in a sample phase and a second set of electrical attributes, differing from the first set of electrical attributes, in a conversion phase.
Abstract:
A system includes a storage device containing machine instructions and a plurality of digital values of an oversampled sinuisoidal signal. The system also includes a core coupled to the storage. The core is configured to execute the machine instructions, wherein, when executed, the machine instructions cause the core to implement a sigma-delta modulator that retrieves the plurality of digital values from the storage device as input to the modulator. The sigma-delta modulator is configured compute an output bit stream. The system further includes an analog filter configured to receive the output bit stream from the core and to low-pass filter the output bit stream to produce a sinusoidal output signal.