摘要:
A noise reducing apparatus and associated method and program for improving image quality in an image are provided. The noise reducing apparatus detects a flat area from an image and analyzes the noise from the flat area, and then it suppresses a noise component of the image based on the noise analysis result.
摘要:
A nitride-based semiconductor light-emitting device of an embodiment includes a semiconductor multilayer structure having a growing plane which is an m-plane and being made of a GaN-based semiconductor. The semiconductor multilayer structure includes a n-type semiconductor layer, a p-type semiconductor layer, a p-side electrode provided on the p-type semiconductor layer, and an active layer interposed between the n-type semiconductor layer and the p-type semiconductor layer. The ratio of the thickness of the active layer to the thickness of the n-type semiconductor layer, D, is in the range of 1.8×10−4≦D≦14.1×10−4. The area of the p-side electrode, S, is in the range of 1×102 μm2≦S≦9×104 μm2. A maximum current density which leads to 88% of a maximum of the external quantum efficiency is not less than 2 A/mm2.
摘要翻译:实施方式的氮化物系半导体发光元件具有半导体层叠结构,该半导体层叠结构具有作为m面的生长面并由GaN系半导体构成。 半导体多层结构包括n型半导体层,p型半导体层,设置在p型半导体层上的p侧电极以及介于n型半导体层和p型半导体层之间的有源层 半导体层。 有源层的厚度与n型半导体层的厚度D之比在1.8×10 -4 @ D @ 14.1×10 -4的范围内。 p侧电极S的面积在1×102mum2 @ S @ 9×104mum2的范围内。 导致外部量子效率最大值的88%的最大电流密度不小于2A / mm2。
摘要:
An image correction device includes a scene belonging rate computation unit that computes, from the feature value of an input image, a plurality of scene belonging rates each of which prescribes a probability with which the input image belongs to each category scene; an unknown scene belonging rate specification unit that specifies an unknown scene belonging rate prescribing a probability with which the input image belongs to an unknown scene; a by-scene correction parameter memory unit that stores by-scene correction parameters; a correction parameter combination unit that computes a combined correction parameter that is the weighted average of the correction parameters using the plurality of scene belonging rates and the unknown scene belonging rate; and an image correction unit that performs image correction processing for the input image using the combined correction parameter.
摘要:
A nitride semiconductor light-emitting element 300 is a nitride semiconductor light-emitting element which has a multilayer structure 310, the multilayer structure 310 including an active layer which is made of an m-plane nitride semiconductor. The multilayer structure 310 has a light extraction surface 311a which is parallel to an m-plane in the nitride semiconductor active layer 306 and light extraction surfaces 311b which are parallel to a c-plane in the nitride semiconductor active layer 306. The ratio of an area of the light extraction surfaces 311b to an area of the light extraction surface 311a is not more than 46%.
摘要:
Around a nitride-based semiconductor light-emitting element which has a polarization characteristic, a transparent encapsulating member which has a cylindrical shape is provided such that the symmetry plane of the cylindrical shape forms an angle of 25° to 65° with respect to the polarization direction of the nitride-based semiconductor light-emitting element.
摘要:
A printer apparatus is provided which receives concurrent input print data from plural input ports without increasing receiving buffer memory. A controller determines whether an image creator is used by other jobs when starting receiving print data through any one of the plural input ports. When not used, print data related to the current job is stored in a receiving buffer memory and at the same time print data stored in the buffer memory is printed via the image creator. On the other hand, when other jobs use the image creator, the print data related to the current job is stored in a hard disk unit and is printed when the image creating device becomes available.
摘要:
In the present invention, provided is a semiconductor device, including: a GaN channel layer which is provided on a substrate and through which electrons run; a barrier layer which is provided on the GaN channel layer and which contains at least one of In, Al, and Ga and contains N; a gate electrode which is provided on the barrier layer; and a source electrode and a drain electrode which are provided on the substrate across the gate electrode, in which, in a portion of the barrier layer between the gate electrode and the drain electrode, a magnitude of polarization of the barrier layer is smaller on the gate electrode side than on the drain electrode side. Thus, PAE can be improved by reducing Rd and Cgd simultaneously.
摘要:
A transmission module including a power supply voltage control unit that sets a power supply voltage to the high frequency amplifier in a variable manner, and a control circuit that controls an amplitude control unit, a phase control unit and the power supply voltage control unit. The control circuit and the power supply voltage control unit control the power supply voltage in accordance with an output power of the high frequency amplifier. The transmission module can carry out not only phase control but also amplitude control in a continuous manner, while suppressing amplitude and phase variation, and a high frequency amplifier in the transmission module is made highly efficient. In addition, a large directional gain, a low side lobe level and a low power consumption are achieved, as a phased array antenna apparatus using a transmission module.
摘要:
It is an object to provide an epitaxial silicon wafer that is provided with an excellent gettering ability in which a polysilicon layer is formed on the rear face side of a silicon crystal substrate into which phosphorus (P) and germanium (Ge) have been doped. A PBS forming step for growing a polysilicon layer is executed on the rear face side of a silicon crystal substrate into which phosphorus and germanium have been doped at a high concentration to execute a baking treatment. After a surface layer of the silicon crystal substrate is then polished up to a predetermined amount, a silicon epitaxial layer is grown by a CVD method. By the above steps, the number of LPDs (caused by an SF) that occur on the surface of the epitaxial silicon wafer due to the SF can be greatly reduced.
摘要:
It is an object to provide an epitaxial silicon wafer that is provided with an excellent gettering ability in which a polysilicon layer is formed on the rear face side of a silicon crystal substrate into which phosphorus (P) and germanium (Ge) have been doped. A silicon epitaxial layer is grown by a CVD method on the surface of a silicon crystal substrate into which phosphorus and germanium have been doped at a high concentration. After that, a PBS forming step for growing a polysilicon layer is executed on the rear face side of a silicon crystal substrate. By the above steps, the number of LPDs (caused by an SF) that occur on the surface of the epitaxial silicon wafer due to the SF can be greatly reduced.