摘要:
The present invention provides a method for writing data to a non-volatile memory device having first wirings and second wirings intersecting one another and memory cells arranged at each intersection therebetween, each of the memory cells having a variable resistive element and a rectifying element connected in series. According to the method, the second wirings are charged to a certain voltage not less than a rectifying-element threshold value, prior to a rise in a selected first wiring. Then, a selected first wiring is charged to a voltage required for writing or erasing, after which a selected second wiring is discharged.
摘要:
This disclosure concerns a memory including memory cell arrays including word lines extending in a first direction, bit lines extending in a second direction crossing the first direction, and memory cells provided to respectively correspond to cross-points in form of a lattice constituted by the word lines and the bit lines; sense amplifiers provided to respectively correspond to the bit lines and reading data stored in the memory cells; and bit line drivers provided to the bit lines and operating the bit lines when data is written to the memory cells, wherein the bit line drivers access the memory cells adjacent to a first memory cell diagonally with respect to the form of the lattice for writing the data to the adjacent memory cells during a data write operation without changing data stored in the memory cells adjacent to the first memory cell in the first and the second directions.
摘要:
The non-volatile semiconductor memory device has a circuit which maintains and holds the potentials of bit lines, and either ones of even-bit lines or odd-bit lines are connected to the circuit. When the bit line potential holding circuit is connected to even-bit lines and a block copy is performed, data is first outputted to the even-bit lines, and after the potential of the even-bit line is determined, the bit line potential holding circuit operates. Then, biasing of the potential of the even-bit lines is carried out by the bit line potential holding circuit, the potentials of the bit lines are maintained and held. At the same time, data is outputted to the odd-bit lines and the potentials of the odd-bit lines are determined. Then, a program voltage is supplied to a selected word line, and data is simultaneously written (programmed) in the memory cells connected to the even-bit lines, and the memory cells connected to the odd-bit lines.
摘要:
A first insulating film, a second insulating film, a first resist pattern is formed on a semiconductor substrate, the second insulating film is etched to form a second-insulating-film pattern, a third insulating film is deposited over the second-insulating-film pattern to form a third-insulating-film pattern, the first insulating film is etched to form a first-insulating-film pattern, a fourth insulating film and a second resist pattern is formed over the first-insulating-film pattern, fourth insulating film is etched to form a fourth-insulating-film pattern, a fifth insulating film is deposited over the fourth-insulating-film pattern to form a fifth-insulating-film pattern, line parts of first-insulating-film pattern is etched to form a first-insulating-film pattern for wiring, a wiring film is formed over the first-insulating-film pattern for wiring, the wiring film is removed until the first-insulating-film pattern for wiring is exposed to form a wiring pattern.p
摘要:
A semiconductor memory device disclosed herein includes: a first select gate line, a gate electrode of a first select transistor connected to the first select gate line; a second select gate line, a gate electrode of a second select transistor connected to the second select gate line; and word lines between the first select gate line and the second select gate line, gate electrodes of memory cells being respectively connected to the word lines, wherein when data in a memory cell connected to a first adjacent word line which is adjacent to the first select gate line is read, a voltage of the second select gate line is increased after a voltage of the first select gate line is increased, and when data in a memory cell connected to a second adjacent word line adjacent to the second select gate line is read, the voltage of the first select gate line is increased after the voltage of the second gate line is increased.
摘要:
A level shifter circuit comprises a first output MIS transistor of a first conductivity, and a second output MIS transistor of a second conductivity type having a second threshold voltage. The former has a first threshold voltage, wherein the output voltage is positively fed back to a gate terminal and the power supply voltage is applied to a first terminal to generate a first voltage at a second terminal. In the latter, the first voltage is applied to a first terminal and a second voltage is applied to a gate terminal to control conduction to generate the output voltage at a second terminal. The first and second charge type MIS transistors and the discharge MIS transistor are connected between the first terminal and gate terminal of the second output MIS transistor to charge or discharge the potential of the gate terminal of the second output MIS transistor.
摘要:
A non-volatile semiconductor memory device comprise a memory cell array having a plurality of memory cell units each having a plurality of electrically-programmable memory cell connected in series, a plurality of word lines each connected to each of control gates of said plurality of memory cells, said plurality of word lines including a selected word line connected to a control gate of selected one of said memory cells for programming, and a plurality of unselected word lines different from said selected word line, a bit line connected to one end of said memory cell unit, and a source line connected to another end of the memory cell unit, wherein, when data is programmed into the selected memory cells, a first potential is supplied to said selected word line, and a first unselected word line adjacent, toward a source line side, to said selected word line is set to floating state, and thereafter, a second potential which is higher than said first potential is supplied to said selected word line.
摘要:
A semiconductor memory device disclosed herein comprises: a memory cell array including memory blocks, each memory block including memory cells arranged in a matrix and the memory cell array including first select gate transistors to select one or more memory cells; a select gate line configured to input a control signal which controls continuity of the first select gate transistor to a gate of the first select gate transistor, the select gate line being shared between two adjacent memory blocks; and a row select circuit configured to select a memory block of a row designated by an input address signal, wherein the row select circuit comprises: only one transfer transistor provided between the select gate line and a non-select signal line to which a non-select signal is supplied, the non-select signal being the control signal indicating non-selection; and a select gate control circuit configured to bring the transfer transistor into conduction to supply the non-select signal to the select gate line when both the two adjacent memory blocks are not selected.
摘要:
According to this invention, the NAND type flash memory of high reliability is realized. It provides a semiconductor memory device comprising: a plurality of memory cells; a plurality of word lines formed by a first gate wiring layer; a plurality of first transistors for providing voltages to said word lines; and electrical connections for connection said word lines and sources or drains of said first transistors, said electrical connections being formed of both first wirings of a first wiring layer formed above said first gate wiring layer and second wirings of a second wiring layers formed above said first wiring layer.
摘要:
A semiconductor device comprises: a plurality of first wiring lines formed in a first layer with a first wiring width and a first wiring space; a plurality of second wiring lines formed in a second layer different from the above-described first layer with a second wiring width and a second wiring space larger than the above-described first wiring width and first wiring space; and a contact plug connecting the first wiring line and second wiring line. The above-described contact plug is formed over a plurality of adjacent ones of the above-described first wiring lines and has a pattern connecting the plurality of adjacent ones of the above-described first wiring lines and one of the above-described second wiring lines.