Abstract:
An in-situ on-line detection device and detection method for a long-distance metallurgical liquid metal component. The detection device comprises a front-end high-temperature resistant probe (18), a middle-end optical sensing device (19) and a back-end control platform (24), wherein the head of the front-end high-temperature resistant probe (18) is placed in a liquid metal (22), the tail thereof is coaxially connected to the middle-end optical sensing device (19), and an optical window (15) is arranged in the connection position; and the middle-end optical sensing device (19) is connected to the hack-end control platform (24) through a signal line (25). The detection device and detection method can provide a timely and valid message for quality control and a melting end, so that the detection time is greatly shortened, the detection distance can he adjusted extensively, the measurement result is accurate, and it can he achieved to measure components that are difficult to measure such as C, S, P, etc.
Abstract:
A mercury detection system that includes a flow cell having a mercury sensor, a light source and a light detector is provided. The mercury sensor includes a transparent substrate and a submonolayer of mercury absorbing nanoparticles, e.g., gold nanoparticles, on a surface of the substrate. Methods of determining whether mercury is present in a sample using the mercury sensors are also provided. The subject mercury detection systems and methods find use in a variety of different applications, including mercury detecting applications.
Abstract:
There is disclosed a distributed optical fiber sensor arranged to deliver probe light pulses of different wavelengths into corresponding different sensing optical fibers, and to determine one or more parameters as functions of position along each of the sensing fibers from detected backscattered light of each corresponding wavelength. In another arrangement, the different wavelengths are directed in different corresponding directions around a loop of sensing optical fiber.
Abstract:
A method of determining a parameter of a wafer is disclosed. Light is propagated through a waveguide disposed in the wafer. A first measurement of optical power is obtained at a first optical tap coupled to the waveguide and a second measurement of optical power is obtained at a second optical tap coupled to the waveguide using a photodetector placed at a selected location with respect to the wafer. A difference in optical power is determined between the first optical tap and the second optical tap from the first measurement and the second measurement. The parameter of the wafer is determined from the determined difference in optical power.
Abstract:
A method of determining a parameter of a wafer is disclosed. Light is propagated through a waveguide disposed in the wafer. A first measurement of optical power is obtained at a first optical tap coupled to the waveguide and a second measurement of optical power is obtained at a second optical tap coupled to the waveguide using a photodetector placed at a selected location with respect to the wafer. A difference in optical power is determined between the first optical tap and the second optical tap from the first measurement and the second measurement. The parameter of the wafer is determined from the determined difference in optical power.
Abstract:
An apparatus (01) configured for identifying numbers for layers having objects thereon within a container (02), the objects being accommodated in the container and arranged in layers. the apparatus comprising: an optical fiber sensor (10) configured for sensing existence of the objects within a sensing scope; a support frame (20) configured for carrying the optical fiber sensor (10); a guide rail (60) configured for defining a moving direction of the support frame (20); a motor (40) and driving mechanism (30) configured for driving the optical fiber sensor to move along the guide rail; and a controller (50) connected with the optical fiber sensor (10) and the motor (40), wherein the controller (50) is at least configured for obtaining the numbers for the layers having objects thereon according to a moving distance of the support frame (20), in the case that the existence of the objects is sensed by the optical fiber sensor (10). In the case of a smaller spacing between the layers in the container (02), the apparatus (01) can accurately obtaining the number for the layer in which an object locates, so that a robot arm can take out the object placed at this layer directly. The object is a display panel.
Abstract:
A side illuminated multi point multi parameter optical fiber sensor that requires no sensitive coating is provided. This sensor comprises an optical fiber having at least one removed cladding section as the sensitive region, at least one probing light source that side illuminates the fiber, a power supply, a detector, a signal processor and a display. The sensitive optical fiber is optically affected by the presence of a measurand medium that can fluoresce, phosphoresce, absorb and/or scatter the probing light. This probing light is guided by the fiber core towards a detector which measures the light intensity and this light intensity is correlated with a measurand.
Abstract:
A method of determining a parameter of a wafer is disclosed. Light is propagated through a waveguide disposed in the wafer. A first measurement of optical power is obtained at a first optical tap coupled to the waveguide and a second measurement of optical power is obtained at a second optical tap coupled to the waveguide using a photodetector placed at a selected location with respect to the wafer. A difference in optical power is determined between the first optical tap and the second optical tap from the first measurement and the second measurement. The parameter of the wafer is determined from the determined difference in optical power.
Abstract:
Apparatus, systems, and methods may operate to transmit energy to a nanofiber sampling coil and/or a nanofiber reference coil. Further activity may include receiving the energy as modified by evanescent interaction with a sampled material located proximate to the sampling coil and/or as modified by propagation through the reference coil, and comparing the energy modified by evanescent interaction with the energy modified by propagation through the reference coil to determine a spectroscopic property of the sampled material. Additional apparatus, systems, and methods, including the use of nanofibers and fluorescence induced by evanescent radiation to conduct spectroscopic analysis, are disclosed.
Abstract:
Apparatus and a method for monitoring various conditions of a vehicle structure including an optical sensor comprising an optical fiber bearing a photonic crystal mounted to one end, an interrogation system including an optical signal generator interfacing with one or more of the optical sensors located remotely from the interrogation module, and a method of monitoring the vehicle structural health using the interrogation system.