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94 条记录 (耗时 0.019 秒)

    MEMBRANE SWITCH CIRCUIT TESTING SYSTEM
    11.
    发明申请
    MEMBRANE SWITCH CIRCUIT TESTING SYSTEM 有权
    膜开关电路测试系统

    公开(公告)号：US20150331048A1

    公开(公告)日：2015-11-19

    申请号：US14475168

    申请日：2014-09-02

    申请人： Primax Electronics Ltd.

    发明人： PEI-MING CHANG

    IPC分类号： G01R31/327

    CPC分类号： G01R31/327 ,  G01R31/282 ,  G01R31/31924 ,  G01R31/3277 ,  G01R33/3628 ,  H01H13/88

    摘要： A membrane switch circuit testing system includes a testing module and a connection element. After the connection element is connected with a membrane switch circuit and the testing module, the testing module assigns an identification code to a key intersection of the membrane switch circuit. When the key intersection is depressed, an equivalent circuit is defined by the depressed key intersection and a corresponding fixed resistor of the testing module. Moreover, the testing module acquires an intersection resistance value of the depressed key intersection from the equivalent circuit. Consequently, the testing module judges whether the depressed key intersection is qualified according to the intersection resistance value.

    摘要翻译： 薄膜开关电路测试系统包括测试模块和连接元件。 连接元件与薄膜开关电路和测试模块连接后，测试模块将一个识别码分配给薄膜开关电路的一个关键点。 当按键交叉点被按下的键交叉点和相应的测试模块的固定电阻器定义为等效电路。 此外，测试模块从等效电路获取按压的键交叉点的交叉电阻值。 因此，测试模块根据交点电阻值判断按下的键交叉点是否合格。

    IONIZER FOR ADDING NEGATIVE IONS TO AIR, FOR EXAMPLE TO AIR INSIDE A MOTOR VEHICLE, AND METHOD OF OPERATING SAME
    12.
    发明申请
    IONIZER FOR ADDING NEGATIVE IONS TO AIR, FOR EXAMPLE TO AIR INSIDE A MOTOR VEHICLE, AND METHOD OF OPERATING SAME 有权
    用于将负离子添加到空气中的离子，例如用于电动机内的空气，以及操作其的方法

    公开(公告)号：US20150214698A1

    公开(公告)日：2015-07-30

    申请号：US14592925

    申请日：2015-01-09

    申请人： Ralf MOENKEMOELLER

    发明人： Ralf MOENKEMOELLER

    IPC分类号： H01T23/00 ,  G01R31/28 ,  G01R19/00

    CPC分类号： H01T23/00 ,  G01R19/0092 ,  G01R31/282 ,  H01T19/04

    摘要： An ionizer for charging air in a motor vehicle with negative ions. The ionizer has an emitter with a pair of spaced electrodes, a high-voltage power supply, means connecting the power supply to the electrodes to apply a voltage differential across them and thereby ionize gas molecules adjacent the electrodes, and a sensor between the power supply and the electrodes for measuring current passing between the electrodes.

    摘要翻译： 一种电离器，用于对负离子的机动车辆中的空气进行充气。 电离器具有一对具有一对间隔开的电极的发射极，一个高压电源，用于将电源连接到电极上，以在它们之间施加电压差，从而使邻近电极的气体分子电离，并且电源 以及用于测量电极之间的电流的电极。

    Potential Arc Fault Detection and Suppression
    14.
    发明申请
    Potential Arc Fault Detection and Suppression 有权
    电弧故障检测与抑制

    公开(公告)号：US20150043110A1

    公开(公告)日：2015-02-12

    申请号：US14512417

    申请日：2014-10-11

    申请人： Paul Wilkinson Dent

    发明人： Paul Wilkinson Dent

    IPC分类号： H02H7/26 ,  G01R31/02 ,  G01R31/28

    CPC分类号： H02H7/268 ,  G01R15/207 ,  G01R31/024 ,  G01R31/282 ,  G01R31/42 ,  H02H1/0015 ,  H02H7/205 ,  H02S50/10 ,  Y02B10/14 ,  Y04S10/20

    摘要： A wiring fault detector adapted specifically to address the requirement for arc fault protection specified in National Electrical Code (2011) article 690.11 comprises running at least one additional wire in parallel with the power conductors to be protected, thereby allowing evaluation at the location of a fault detector of an electrical parameter indicative of conductor integrity along its whole length.In one implementation, the additional conductor allows the voltage drop across the power conductor to be measured and verified to be small and/or noise-free. In another implementation, the additional conductor is a redundant power conductor connected in parallel with the main power conductor, allowing verification that the current flow in both the main and the additional power conductors is partitioned in an expected ratio indicative of wiring integrity.

    摘要翻译： 专门用于解决国家电气规范（2011）第690.11条规定的电弧故障保护要求的接线故障检测器包括与要保护的电源导体并联运行至少一根附加电线，从而允许在故障位置进行评估 检测器沿其整个长度指示导体完整性的电参数。 在一个实施方案中，附加导体允许测量和验证电力导体两端的电压降是小的和/或无噪声的。 在另一实施方案中，附加导体是与主电源导体并联连接的冗余电力导体，允许验证主电源线和附加电源线中的电流流以预期的比率分配，表示布线完整性。

    METHOD AND SYSTEM FOR TESTING OSCILLATOR CIRCUIT
    15.
    发明申请
    METHOD AND SYSTEM FOR TESTING OSCILLATOR CIRCUIT 审中-公开
    用于测试振荡器电路的方法和系统

    公开(公告)号：US20140125419A1

    公开(公告)日：2014-05-08

    申请号：US14155356

    申请日：2014-01-15

    申请人： Jun Zhang ,  Xiuqiang Xu

    发明人： Jun Zhang ,  Xiuqiang Xu

    IPC分类号： G01R31/28

    CPC分类号： G01R31/282 ,  G01R31/2824

    摘要： An oscillator circuit generates a voltage signal. The magnitude of the voltage signal is measured and compared with predetermined upper and lower voltage signals by an internal test circuit. If the magnitude of the voltage signal is between the predetermined upper and lower voltage signals, then a pass test status signal is generated. If the magnitude of the voltage signal is not between the predetermined upper and lower voltage signals then a fail test status signal is generated.

    摘要翻译： 振荡电路产生电压信号。 通过内部测试电路测量电压信号的大小并与预定的上下电压信号进行比较。 如果电压信号的大小在预定的上下电压信号之间，则产生通过测试状态信号。 如果电压信号的幅度不在预定的上限和下限电压信号之间，则产生故障测试状态信号。

    CIRCUIT AND METHOD FOR DETECTING A FAULT ATTACK
    16.
    发明申请
    CIRCUIT AND METHOD FOR DETECTING A FAULT ATTACK 有权
    用于检测故障攻击的电路和方法

    公开(公告)号：US20110267094A1

    公开(公告)日：2011-11-03

    申请号：US13095432

    申请日：2011-04-27

    申请人： Francesco La Rosa

    发明人： Francesco La Rosa

    IPC分类号： G01R31/40 ,  H01L25/00

    CPC分类号： G01R31/282 ,  G01R31/40 ,  G06F21/552 ,  G06F21/554 ,  G06F21/75 ,  G06F21/77 ,  G11C5/06 ,  G11C11/412 ,  G11C11/417

    摘要： A device for detecting a fault attack, including: a circuit for detecting an interruption of a power supply; a circuit for comparing the duration of said interruption with a first threshold; and a counter of the number of successive interruptions of the power supply having a duration which does not exceed the first threshold.

    摘要翻译： 一种用于检测故障攻击的装置，包括：用于检测电源中断的电路; 用于将所述中断的持续时间与第一阈值进行比较的电路; 以及具有不超过第一阈值的持续时间的电源的连续中断次数的计数器。

    Digital testing techniques for very high frequency phase-locked loops
    17.
    发明授权
    Digital testing techniques for very high frequency phase-locked loops 失效
    用于非常高频锁相环的数字测试技术

    公开(公告)号：US5295079A

    公开(公告)日：1994-03-15

    申请号：US731963

    申请日：1991-07-18

    申请人： Hee Wong ,  Tsun-Kit Chin

    发明人： Hee Wong ,  Tsun-Kit Chin

    IPC分类号： G01R31/28 ,  H03L7/06 ,  H03L7/08 ,  H03L7/099 ,  G01R23/02

    CPC分类号： H03L7/0991 ,  G01R31/282

    摘要： A digital testing system providing for cost efficient comprehensive testing of very high frequency phase-locked loop performance parameters. The system tests PLL performance parameters both at integrated circuit level and communication board level. Cost efficiency of the testing system allows for volume testing by manufacturers.

    摘要翻译： 数字测试系统，提供高频锁相环性能参数的成本效益综合测试。 该系统在集成电路级和通信板级测试PLL性能参数。 测试系统的成本效率允许制造商进行批量测试。

    METHOD OF INSPECTING TEMPERATURE CONTROLLING SYSTEM
    18.
    发明公开
    METHOD OF INSPECTING TEMPERATURE CONTROLLING SYSTEM 审中-公开

    公开(公告)号：US20240003962A1

    公开(公告)日：2024-01-04

    申请号：US18142027

    申请日：2023-05-02

    申请人： SEMES CO., LTD.

    发明人： Chungwoo LEE ,  Yunsik JU

    IPC分类号： G01R31/28 ,  G05B23/02

    CPC分类号： G01R31/282 ,  G05B23/0221

    摘要： A method of inspecting a temperature controlling system is provided. The method includes generating a measurement matrix based on current measurement values of the temperature controlling system, calculating a transformation matrix having the same dimensions as the measurement matrix based on the measurement matrix, calculating an auxiliary matrix having the same dimensions as the measurement matrix based on the transformation matrix, and calculating a defect matrix representing defective diodes among the plurality of diodes, based on a difference operation between the auxiliary matrix and the transformation matrix.

    SAMPLING CLOCK TESTING CIRCUIT AND SAMPLING CLOCK TESTING METHOD
    20.
    发明申请
    SAMPLING CLOCK TESTING CIRCUIT AND SAMPLING CLOCK TESTING METHOD 审中-公开

    公开(公告)号：US20180203060A1

    公开(公告)日：2018-07-19

    申请号：US15857633

    申请日：2017-12-29

    申请人： Realtek Semiconductor Corporation

    发明人： Tsung-Yeh HE ,  Hsu-Jung TUNG

    IPC分类号： G01R31/28 ,  G01R25/00

    CPC分类号： G01R31/282 ,  G01R25/005 ,  G06F1/04 ,  G09G5/008

    摘要： A sampling clock testing circuit includes a clock circuit, a processing circuit and a phase determining circuit. The clock circuit generates a clock signal and switches phases of the clock signal according to a horizontal synchronous signal. The processing circuit samples a data signal according to the clock signal with the phases to generate pixel data groups each of which is corresponding to one phase. The phase determining circuit generates calculated values according to the pixel data groups, in which each phase is corresponding to one calculated value. The phase determining circuit selects a specific calculated value from the calculated values according to a predetermined condition, and determines a specific phase corresponding to the specific calculated value. The processing circuit samples a subsequent data signal according to the clock signal switched to the specific phase to generate subsequent pixel data.