Abstract:
A method for the acquisition (AU) of a spectrally resolved, two-dimensional image by means of Fourier transform (=FT) spectroscopy or Fourier transform infrared (=FTIR) spectroscopy, is characterized in that, during multiple passes (D1-D4) of an optical path difference (OG) between two partial rays (14a, 14b) over an identical range (IB), different subsets of detector elements (22) of an array detector (5) are read out and the signals of the read-out detector elements (22) of the multiple passes (D1-D4) are Fourier transformed and combined to form the spectrally resolved image. A method is thereby provided for the acquisition of two-dimensional, spectrally resolved images, in which the influence of vibrations on the measurement is reduced, and which is less affected by the movement of objects to the resolved spectrally.
Abstract:
According to one aspect, the invention relates to a device (20) for three-dimensional imaging by full-field interferential microscopy of a volumic and scattering sample (1) comprising an emission source (201) for emitting an incident wave with low temporal coherence, an imaging interferometer (200) of variable magnification, allowing for the acquisition of at least one first and one second interferometric images resulting from the interference of a reference wave obtained by reflection of the incident wave on a reference mirror (205) and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of the sample, the at least two interferometric images having a phase difference obtained by varying the relative path difference between the object and reference arms of the interferometer, a processing unit (206) for processing said interferometric images making it possible to obtain a tomographic image of said slice of the sample, means for axially displacing the interferometer relative to the sample allowing for the acquisition of tomographic images for slices at different depths of the sample and means for varying the magnification of the imaging interferometer allowing for the acquisition of interferometric images of a slice of the sample for different magnification values.
Abstract:
Every depth of the measurement object measures energy structural information, refractive index, transmittance, reflectance other than property information of (as for the resolution several microns), e.g., space information at the same time. A spectrum measurement device receives a reference wave propagating in a reference path and a measurement wave propagating in a measurement path having a start point same as a start point of the reference path, and derives a spectrum of the measurement wave. The space information of the measuring object, energy structural information, refractive index, transmittance, a reflective index using spectrum measurement device are derived.
Abstract:
The invention relates to a field-compensated interferometer (1) including an optical assembly (2) for directing incident light beams (4) having a field angle θ relative to an optical axis of the interferometer (1), into arms (5, 6) of the interferometer, and a beam splitter (12), the arms (5, 6) including at least one mechanically movable optical device (15, 16) for generating a variable optical path difference between beams generated by the separation of each incident beam (4) using said beam splitter (12), said interferometer (1) being characterized in that it includes at least one field compensation optical element (E) arranged in one or the other of the image focal planes of the optical assembly (2), said image focal planes being combined relative to the beam splitter (12), said element (E) including at least one surface (9) that is curved so as to generate a path difference between the incident beams having a non-zero field angle and the incident beams having a zero field angle, the generated path difference making it possible to compensate for the self-apodization resulting from the field angle.
Abstract:
A fundamental limit to the sensitivity of optical interferometry is thermal noise that drives fluctuations in the positions of the surfaces of the interferometer's mirrors, and thereby in the phase of the intracavity field. A scheme for substantially reducing this thermally driven phase noise is provided in which the strain-induced phase shift from a mirror's optical coating cancels that due to the concomitant motion of the substrate's surface. As such, although the position of the physical surface may fluctuate, the optical phase upon reflection can be largely insensitive to this motion.
Abstract:
A sensor and method for remotely determining a presence of a particular substance based on spectral data of the particular substance is disclosed. The sensor includes a sampling module configured to detect radiation from a particular substance using an interferometer, wherein the sampling module includes a control module that is configured to guide and measure spacing of samples taken by the sampling module; a focal plane module configured to detect and convert an interference pattern produced by the interferometer into a series of digital samples; a reference spectra modification module configured to modify reference spectra by modifying according to the measured spacing of samples and an instrument line shape of the sampling module; an estimation module configured to receive the converted series of digital samples and transform the non-uniformly spaced digital samples into frequency space using band centers determined from reference spectra as modified by the instrument line shape of the sampling module; a comparison module configured to compare the transformed digital samples against a database of known chemical signatures; and a determination module configured to determine the presence of the particular substance based on the results of the comparison.
Abstract:
A scanning optical interferometer (40) having a beamsplitter (42); a first input path (56) for an observation beam (52) and a second input path (78) for a reference beam (76) wherein both paths (56; 78) are directed towards the same beamsplitter (42) characterised in that the interferometer is configured with the first input path (56) and the second input path (78) intersecting at a location (L) before the beamsplitter (42) and in that the interferometer further comprises a dichroic filter (80) located at the intersection (L) of the two paths (56; 78) and acting to collocate both paths (56;78) in a direction towards the beamsplitter (42).
Abstract:
A method utilizes an optical image processing system. The method includes providing a measured magnitude of the Fourier transform of a complex transmission function of an object or optical image. The method further includes providing an estimated phase term of the Fourier transform of the complex transmission function. The method further includes multiplying the measured magnitude and the estimated phase term to generate an estimated Fourier transform of the complex transmission function. The method further includes calculating an inverse Fourier transform of the estimated Fourier transform, wherein the inverse Fourier transform is a spatial function. The method further includes calculating an estimated complex transmission function by applying at least one constraint to the inverse Fourier transform.
Abstract:
The invention relates to a wavelength spectroscopy device comprising, on a substrate a filter cell CF constituted by two mirrors separated by a spacer membrane, the filter cell being made up of a plurality of interference filters. Furthermore, the device also comprises an emission cell CE comprising a plurality of emission sources, each of said sources being associated with one of said interference filters.
Abstract:
Methods and designs for providing reduced sensitivity to mirror tilt in Fourier transform spectrometers are disclosed. According to an embodiment for two-directional tilt compensation, the FT spectrometer can include a beam splitter positioned to receive an incoming beam from a light source and split the incoming beam into a first sub-beam and a second sub-beam, a corner-cube retroreflector positioned to receive the first sub-beam from the beam splitter, a dual reflective mirror positioned to receive the first sub-beam from the corner-cube retroreflector at one surface and the second sub-beam at the other surface. An optical path delay can be created using a set of mirrors, tilting the beam splitter and/or a glass cube.